Xrd 7000

After heat treatment, one specimen from each group was selected to carry out internal characterization and density measurement using X-ray computed tomography (CT) with a Nikon XT H225 (Nikon company, Tokyo, Japan). Before the tensile test, the surface morphology and interface component Energy Dispersive Spectrometer (EDS) detection between AlSi7Mg and diamond were acquired by the Phenom ProX scanning electron microscope (Phenom-Word BV company, Eindhoven, The Netherlands) under 30 kV. Furthermore, to study the phases of specimens, X-ray diffraction (XRD) was performed on an XRD-7000s (Shimadzu company, Kyoto, Japan) with a Cu tube at 40 kV and 30 mA.
A uni-axial tensile test was carried out using the ProLine-Z100 electronic universal testing machine using ZWICK ROELL equipment (ZwickRoell company, Ulm, Germany) at room temperature. According to the ASTM E8 standard, three specimens of each group were tested, and their stress–strain curves were plotted based on the data from the tensile test. In addition, the mechanical properties including elastic modulus, tensile strength, and elongation were calculated from these stress–strain curves.

An X-ray diffractometer (XRD-7000S, Shimadzu, Japan) with Cu K_α radiation at 40 kV and 15 mA was used to analyze the crystalline structures of GO and metal@graphene. The scanning rate was 8°/min and the scanning range of 2θ was 5~65° with a step size of 0.02°. Surface morphology of the GO and metal@graphene was observed using a scanning electron microscope (SEM, TESCAN VEGA3 XMU, TESCAN, Brno, Czech Republic) and chemical element analysis was performed using an energy dispersive X-ray spectrometer (EDS, TESCAN, Brno, Czech Republic). Detailed morphological characteristics of the GO and metal@graphene composites were obtained using a transmission electron microscope (TEM, JEM-3010, JEOL, Akishima-shi, Japan). Characterization of samples using Raman spectroscopy (Via Reflex, Renishaw, London, Uk) were performed using a laser beam with a wavelength of 532 nm and a SWIFT detector over a range of 500–3500 cm⁻¹ and all the spectra were taken at room temperature (20 °C). Fourier transform infrared (FT-IR) spectra of the GO and metal@graphene were obtained using a TENSOR 27 spectrophotometer (Bruker, Karlsruhe, Germany) with wavelengths ranging from 500 to 4000 cm⁻¹ at room temperature. Microscale surface morphologies of metal@graphene powders were obtained using an atomic force microscope (AFM, FastScan, Bruker, Karlsruhe, Germany) in a tapping mode.

CxEXL22 was used to measure activity with final concentrations of 100 mM buffer, 5 mg substrate(cotton, filter paper and Avicel), 5 μg CxEXL22 in a 5-mL reaction at pH 6 for 48 h at 30 °C with 160 rpm. Control experiments without CxEXL22 or using H₂O were also performed under the same conditions as mentioned above. For microscopic observations, the samples were washed three times by ultrasonic and then dried to completely remove all residual solvent. Then the substrates were visualized by SEM (JSM-7800F and JSM-6460LV, JEOL, Japan). The changes in chemical bonds and functional groups were detected by FTIR (Spectrum two, PerkinElmer, China) and changes in cellulose crystallinity and structure were determined by XRD (XRD-7000S, Shimadzu, Japan) as described previously (Lan et al. 2016 (link)).

After the sintering, the samples were grinded, polished and rinsed with acetone in ultrasonic bath for 15 min. The density of composites was measured by Archimedes’ method using the CP 124S balance machine (Sartorius, Gottingen, Germany). The X-ray computed tomography (CT) was performed using micro-CT scanner TOLMI-150-10 (Tomsk Polytechnic University, Tomsk, Russia) to analyze the macrostructure and defects of the sintered composites. Microstructure and semi-quantitative chemical composition were analyzed by scanning electron microscopy (SEM) using LYRA3 (Tescan, Brno, Czech Republic) and HITACHI^TM TM3000 microscopes (Hitachi, Tokyo, Japan) equipped with energy dispersive X-ray (EDX) attachment (Oxford instruments, Abingdon, England). The crystalline structure of the composites was investigated by X-ray diffraction (XRD) analysis using XRD-7000S (Shimadzu, Kyoto, Japan). The scanning parameters: Cu-K_α radiation (λ = 0.154 nm), 2θ scan range 10–90°, accelerating voltage 40 kV, current 30 mA, scan speed 10 °/min, sampling step 0.0143°.

All analytical specimens were sectioned by wire-electrode cutting, with a dimension of 10 mm × 10 mm × 15 mm. All specimens, after sanding and polishing, were etched in a solution of aqua regia, HCl and HNO₃ in a volume ratio of 3:1. The height, width and depth of the layer were measured using OLYMPUS BX51 optical metallographic microscope. The microstructures of the cladding layer and substrate were examined by means of optical microscope (OM, OLYMPUS BX51, OLYMPUS, Japan) and scanning electron microscope (SEM, JSM-7800F Prime, JEOL, Osaka, Japan) with Energy-Dispersive Spectrometer (EDS, JSM-7800F Prime, JEOL, Osaka, Japan) attached. The phase components were determined by X-ray diffraction (XRD-7000S, Shimadzu, Kanagawa, Japan). Cu-Kα radiation at 40 kV and 200 mA was used as the X-ray source. The specimens were scanned in an angular 2 θ ranging from 20° to 80°. The step size was 0.2° and the collection time was 10 s [28 (link)].