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Model s 3500

Manufactured by Microtrac
Sourced in United States

The Microtrac Model S 3500 is a laser diffraction particle size analyzer that measures the size distribution of particles in a sample. It utilizes the principles of laser diffraction to determine the particle size distribution, providing information about the size, shape, and concentration of particles in a sample.

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2 protocols using model s 3500

1

Comprehensive Material Characterization of Raw and Processed Samples

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Raw material and filtered solution were analyzed using energy dispersive X-ray fluorescence spectrometry (Model 700 HS, Shimadzu, Tokyo, Japan).
Particle size was determined by laser grain size measurements (Microtrac Model S 3500, Largo, FL, USA).
X-ray diffraction analysis was carried in raw material and in mortar at 28 days using power an X-Pert system (Philips, Almelo, The Netherland), with CuKα = 1.54 Å, step range from 4 to 70°, with a step size 0.022 seg, operated at 40 kV and 40 mA.
The SEM analysis was performed with a Philips microscope (model XL30, Philips, Almelo, The Netherland). Samples are covered with Au.
Thermogravimetric analysis (TGA/DSC) was carried out using STD Q600 (TA Instruments, New Castle, DE, USA), TA instruments, 50 mg of pulverized samples (<75 µm), temperature ranged from ambience to 1000 °C with a heating rate of 5 °C/min under ultrapure N2 atmosphere to prevent carbonatation.
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2

Photocatalyst Characterization Protocol

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The materials that exhibited the higher and lower photocatalytic efficiency were selected for characterization further. The morphologies of materials were observed by scanning electron microscopy (SEM, JEOL JSM-6380). Additionally, transmission electron microscopy (TEM) using a JEOL JEM 1200 EX-II. The particles size were determined by using a laser diffraction particle size analyzer (Microtrac Model S3500). Chemical composition of the samples was measured by means of energy dispersive X-ray spectroscopy (EDS). Micromeritis TriStar II porosity analyzer measured the specific surface area (BET) and the pore size distribution of the materials. The composition of products was examined by means of X-ray diffraction (XRD) in a diffractometer Bruker D4 with X-ray source of Cu Kα (λ = 1.5406 A). Thermogravimetric meas-urement (TGA) were determined with a thermobalance model TG209 F1 Iris. Fourier transform infrared (FTIR) spectra were obtained using a Nicolet Nexeus spectrometer. UV-visible diffuse reflectance absorbance (DRS) was determined with a Perkin Elmer Precisely Lambda 35 UV/ Vis spectrophotometer.
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