Jsm 7600 f instrument

Scanning electron microscopy (SEM) and SEM-energy dispersive X-ray spectroscopy (EDX) were carried out on a JEOL, JSM-7600 F instrument. Transmission electron microscopy (TEM) was carried out on a JEOL, 2000FX, 200 kV electron microscope. Magnetic susceptibilities were measured on a superconducting quantum interference device (SQUID) magnetometer, Quantum Design, MPMSXL-5. IV properties were measured using a electrochemical analyzer, BAS, Model ALS/DY2323 BI-POTENTIOSTAT. The temperature dependence of the electrical resistivity was measured by means of a Keithley, 2182 A Digital Nanovoltmeter. X-ray photo-electron spectroscopy was carried out a Thermo Scientific, ThetaProbe Angle-Resolved X-ray Photoelectron Spectrometer System. Thermogravimetric analysis (TGA) was carried out on a SEIKO, EXSTAR TG/DTA 6300 thermogravimetric analyzer. Micro Raman spectroscopy was performed on a Jasco, NRS-3100 spectrometer, with a 532 nm excitation source. Fourier transform infrared spectroscopy was performed on a PerkinElmer, Spectrum Two spectrometer. Powder X-ray diffraction (PXRD) patterns were obtained on a Rigaku, MiniFlex II X-ray diffractometer.

A UV-Visible analysis was performed on lambda 35, Perkin Elmer, Waltham, MA, USA. A Fourier transform infrared analysis were performed on a 1000 FTIR instrument, Perkin-Elmer Waltham, MA, USA. The X-ray powder diffraction analysis of the as-prepared silver nanoparticles was performed on D2-Phaser, Bruker, Germany. Transmission electron microscopy (TEM) analysis was performed using JEM-1101, Jeol, Japan. Scanning electron microscopy (SEM) and an energy-dispersive X-ray analysis was performed using JSM 7600F instrument, JEOL, Tokyo, Japan.

The initial characterization was carried out by UV-vis spectroscopic study using a UV 1650 PC-Shimazu B UV-visible spectrophotometer (Shimazu, Osaka, Japan). The XRD analysis of the prepared CuNPs@Gelatin was carried out by Philip X’pert PXRD (Cu Kα radiation; PANalytical, Almedo, The Netherlands). The prepared CuNPs@Gelatin was also subjected to zeta potential measurements using a dynamic laser light scattering method in a Malvern zeta instrument 3000 (Malvern Instrument, UK). FTIR spectra of the samples were obtained at ambient temperature using the KBr disk method. A disk containing 1 mg of sample was recorded within the wavenumber range of 200 to 4000 cm⁻¹ using a series 100 Perkin Elmer (USA) FT-IR 1650 spectrophotometer. The components of the samples were measured by the energy dispersive x-ray spectroscopy (EDX). The morphology and size of the prepared CuNPs@Gelatin were examined using FESEM and TEM. The FESEM with EDX analysis was performed with a JEOL JSM-7600F instrument. The transmission electron microscopy (TEM) observation was carried out using TEM, Philips CM-12, and the particle size distribution was measured using UTHSCSA Image Tool version 3.0. Also, the histograms were created using IBM-SPSS software, and the graph fitting was created using Microsoft Excel program.