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D max 2000 pc x ray diffractometer

Manufactured by Rigaku
Sourced in Japan

The D/MAX 2000 PC is a compact and versatile X-ray diffractometer designed for phase identification and quantification. It utilizes a high-power X-ray source to generate diffraction patterns, which are then analyzed to determine the crystalline structure of materials. The instrument is suitable for a wide range of applications, including materials science, geology, and pharmaceutical research.

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3 protocols using d max 2000 pc x ray diffractometer

1

X-Ray Diffraction Analysis of Crystalline Samples

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X-ray diffraction (XRD) analysis was performed by Rigaku D/MAX 2000 PC X-ray diffractometer (Rigaku, Japan) using CuK radiation at 30 mA and 40 kV. A scanning range from 10 to 80 degrees with a speed of 0.04 degrees per s was used to identify the crystalline phases of the samples. We selected a scanning range from 32.5 to 33.5 degrees at a scanning speed of 0.005 degrees per s for expanded (300) XRD assay.
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2

Characterization of IrO2 and Ir Nanotubes

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The morphologies and structures of IrO2 and Ir metal nanotubes were characterized by field-emission scanning electron microscopy (FE-SEM, JEOL JSM-6700F, Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM; JEOL JEM-2100F, Tokyo, Japan), and high-resolution X-ray diffraction (XRD; Rigaku D/Max-2000/PC X-ray diffractometer using Cu Kα radiation, Tokyo, Japan). A thermal analysis of as-spun nanofibers was performed by thermogravimetric analysis and differential scanning calorimetry (TGA-DSC, Q600, TA Instruments, New Castle, DE, United States) to observe the combustion process of PVP. For this measurement, as-spun nanofibers were heated in air from room temperature to 700 °C, at a rate of 5 °C min−1.
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3

Structural Characterization of Halogenated Organic Acids

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The single‐crystal X‐ray diffraction data of Cl‐OA, Br‐OA, mono‐I‐OA and orth‐I‐OA were collected at 298 K on the Rigaku Oxford diffractometer (Cu Kα, λ = 1.54184 Å). The structures were determined and refined by the direct methods with the full‐matrix least‐squares method based on F2 in the SHELXTL program package. All the non‐H atoms were anisotropically refined using all reflections with I(I). The asymmetric unit and packing images were drawn by the DIAMOND. Variable‐temperature PXRD measurements were performed on a Rigaku D/MAX 2000 PC X‐ray diffractometer in the 2θ range of 5 to 50° with a step size of 0.02°. The infrared spectra were obtained on a Fourier Transform Infrared spectrometer (EQUINOX 55, Bruker, Germany). The samples were prepared by grinding the dried powder of mono‐ and orth‐I‐OA with KBr together, and then compressed into thin pellets. The 1H nuclear magnetic resonance spectroscopy measurement was performed on the Bruker AVANCE NEO 300 MHz NMR spectrometer with 2 mg of the samples dissolved in 0.75 mL deuterated chloroform solvent.
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