Optical microscope
The Keyence optical microscope is a device that uses light to magnify and observe small objects. It provides a clear and detailed view of the sample under examination, allowing for detailed inspection and analysis. The core function of the optical microscope is to enhance the visibility of microscopic features, enabling users to study and analyze the structure and characteristics of various materials and samples.
Lab products found in correlation
11 protocols using optical microscope
Intracortical Microelectrode Array Characterization
Intracortical Microelectrode Array Verification
Cardiac Histology Analysis of Mouse Hearts
Failure Mode Analysis of Fiber Posts
Histological and Immunohistochemical Analysis of Gastrocnemius Muscles
Micro-XRF Imaging and Analysis
XRF experiments were performed at the microprobe end station of the
P06 Hard X-ray Micro/Nano-Probe beamline of the PETRA III storage
ring of the DESY facility (Hamburg, Germany),31 (link) using an excitation photon energy of 12 and 19.5 keV selected by
means of a Si(111) double-crystal monochromator. A Kirkpatrick–Baez
mirror optic was used to focus the beam to a spot size of about 0.8
× 0.8 μm2 (h × v). A Keyence optical microscope equipped with a perforated
mirror allowed for positioning of the sample. Fluorescent X-rays were
detected using the Maia detector array.32 (link) Two-dimensional images were obtained by raster scanning the samples
in 200–500 nm steps (horizontal and vertical) in the microfocused
beam, while registering a full XRF spectrum for every pixel with 3–50
ms acquisition time. Stitching of the recorded maps was performed
using inhouse developed software, Datamuncher.33 (link) XRF spectral fitting was performed using the PyMCA software
package.34 (link)
Immunohistochemical Analysis of Femoral Muscle
Osteogenic Differentiation of hBMSCs
Histological Analysis of Ischemic Muscle
Multimodal X-ray Microscopy of Paint Samples
By means of a Vortex EM Si drift detector, on-the-fly scanning and acquisition of XRF data with millisecond dwell times per scan pixel was possible. A hybrid photon-counting imaging detector, the EIGER X 4M (Dectris Ltd., Baden, Switzerland), was positioned behind the sample for transmission XRPD measurements, allowing for the simultaneous acquisition of X-ray fluorescence (SR µ-XRF) and diffraction (SR µ-XRPD) data. Calibration of the diffraction setup was performed by means of LaB6 as a reference sample. Every sample was observed before and during the measurements by means of an optical microscope (Keyence, Itasca, IL, USA) equipped with a perforated mirror to allow the possibility to observe the sample under the same angle of the incident X-ray beam while keeping the entire setup still.
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