Powder X-ray diffraction (PXRD) was used to investigate nature of the synthesized hydrogels. Samples were investigated using X-ray diffractometer (x-Pert, PAN analytical, The Netherlands). The angle of diffraction was varied from 10 to 50°.
X pert
Manufactured by Malvern Panalytical
Sourced in Netherlands, United Kingdom, United States
The X'Pert is a versatile X-ray diffractometer designed for a wide range of materials analysis applications. It provides accurate and reliable data on the structural and compositional properties of various materials. The core function of the X'Pert is to perform X-ray diffraction analysis.
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Lab products found in correlation
Nicolet is50, by Thermo Fisher Scientific (3 mentions)
Tecnai f20, by Thermo Fisher Scientific (2 mentions)
Jsm 7600f, by JEOL (2 mentions)
Uv 2550, by Shimadzu (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Microplate reader, by Thermo Fisher Scientific (2 mentions)
Jsm 6701f, by JEOL (1 mentions)
Ftir spectrometer, by PerkinElmer (1 mentions)
Quanta 450 feg, by Thermo Fisher Scientific (1 mentions)
Dsc 250, by TA Instruments (1 mentions)
Esp 300e spectrometer, by Bruker (1 mentions)
Su8100, by Thermo Fisher Scientific (1 mentions)
Asap 2020 system, by Micrometrics (1 mentions)
Apex 2 diffractometer, by Bruker (1 mentions)
Shelxtl software package, by Bruker (1 mentions)
Xl30 sirion scanning electron microscope, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f20 x twin, by Thermo Fisher Scientific (1 mentions)
Nicolet is50 ftir spectrometer, by Thermo Fisher Scientific (1 mentions)
Tga q500, by TA Instruments (1 mentions)
Jsm 6340f, by JEOL (1 mentions)
42 protocols using x pert
1
Hydrogel Characterization via PXRD
2
Nanoscale Microstructural Characterization
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The structural properties were measured by XRD (X’pert, Pan analytical, Amelo, The Netherlands). The microstructural and the thickness of the thin films were measured using filed-emission scanning electron microscopy (FE-SEM; JEOL, JSM-6701F, Tokyo, Japan). In-situ microstructural imaging was conducted by conventional SEM (Zeiss, Gemini Supra 55 VP-SEM, Oberkochen, Germany) equipped with a home-built heating stage. Nano-AES experiments were carried out using an Oxford/Omicron Nano-Auger system furnished with an ultra-high vacuum chamber (base pressure ~ 10–10 Torr), a field emission source, and a multi-channel hemisphere energy detector, as well as a heating specimen holder. The electron beam which can be focused to ~10 nm diameter enabled probing chemical composition in the nanoscale. In-situ analyses were conducted during the ramping up of the temperature from room temperature to 130 °C (~20–50 °C/min) and maintaining at the temperature for 1 h, under vacuum (<10−6 Torr).
3
Powder X-Ray Diffraction Analysis of Hydrogels
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PXRD was used to investigate the AM and CS, as well as the composition of the dried hydrogel sheet. An X-ray diffractometer (x-Pert, manufactured by PAN analytical in The Netherlands) was utilised to analyse the samples. The angle of diffraction ranged from 10 to 40° over its entire range [38 ,39 (link),57 (link),58 (link)].
4
Characterizing Hydrogel Crystallinity by PXRD
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Powder X-ray diffraction (PXRD) was used to investigate nature of the synthesized hydrogels which could be either amorphous or crystalline. Samples were investigated using X-ray diffractometer (X-Pert, PAN analytical, Almelo, Netherlands). The angle of diffraction was varied from 10° to 50° (Algharib et al., 2020 (link)).
5
Characterization of SGO Doped CA Membranes
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FTIR spectra for GO and SGO composite membranes were taken using a Perkin Elmer FTIR spectrometer (Waltham, MA, USA). The morphological features (i.e., top surface and membrane microstructures) of the prepared membranes were characterized using SEM (FEI, Quanta FEG 450, Thermo Scientific, Waltham, MA, USA). The crystalline structure of prepared SGO doped CA membranes was characterized through X-ray diffraction (PANalytical X’pert, Malvern Panalytical, Malvern, UK) technique, respectively.
Thermal properties of SGO doped composite membranes were determined using differential scanning calorimetry (DSC-250, TA instruments, New Castle, DE, USA) at a 10 °C/min heating rate under nitrogen flow of 30 mL/min. Ten milligram samples were sealed in an aluminum pan and scanned over a range of 25 °C to 500 °C [28 (link)].
Thermal properties of SGO doped composite membranes were determined using differential scanning calorimetry (DSC-250, TA instruments, New Castle, DE, USA) at a 10 °C/min heating rate under nitrogen flow of 30 mL/min. Ten milligram samples were sealed in an aluminum pan and scanned over a range of 25 °C to 500 °C [28 (link)].
6
X-ray Diffraction Analysis of Crystallites
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An X-ray diffractometer X’Pert (Malvern Panalytical Ltd., Malvern, UK) with Cu K radiation (λ = 1.54060 nm) was used to collect the X-ray diffraction (XRD) pattern. The software HighScore Plus 3.0.5 was used to process the diffraction pattern. The size and microstrains of the crystallites were refined and determined using the Rietveld method.
7
XRD Characterization of KYNA and Nanoparticles
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The XRD spectra of KYNA, blank NS and KYNA loaded NS were recorded using Malvern Panalytical X'Pert diffractometer using Cu Kα1 as a source of radiation. Data was collected over an angular range from 5 to 45 ᵒ2θ at a step size of 0.017 ᵒ2θ and a time per step of 100.33 s.
8
X-ray Diffraction Analysis of Freeze-Dried Samples
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X-ray diffraction of all freeze-dried samples was carried out using an X-ray diffractometer (X'Pert, Pana-lytical) operating at 40 kV and 40 mA. All samples were equipped with Cu-Kα radiation (λ = 1.54 Å) in the 2θ range of 5°-50° (2θ) with a step size of 0.05° and a scan rate of 1° s -1 (Farrokhi et al., 2018) (link).
The coherent lengths (Domain) of the H-bonding and intersheet directions were calculated with the following equation (Inouye et al., 1993) (link):
where δ obs is the integral width of the observed reflection, b is the integral width of the direct beam, N is the number of lattice points, d is the spacing, and Nd is the coherent length.
The coherent lengths (Domain) of the H-bonding and intersheet directions were calculated with the following equation (Inouye et al., 1993) (link):
where δ obs is the integral width of the observed reflection, b is the integral width of the direct beam, N is the number of lattice points, d is the spacing, and Nd is the coherent length.
9
X-ray Diffraction Characterization Protocol
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XRD patterns were obtained using a Panalytical X’Pert (Cu Kα radiation, Almelo, The Netherlands) diffractometer. Data were collected with a 2D solid state detector (PIXcel) from 20 to 70 2θ with a step size of 0.001 2θ and a wavelength of 1.54187 Å.
10
Crystallite Size Analysis of SPIONs
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The crystallite size was calculated based on the X-ray diffraction (XRD) pattern by HighScore Plus software. The crystal structure of the SPIONs and SPIONs-OA was observed by XRD by using a PANalytical X’Pert.
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