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Nova nanosem 230 fesem

Manufactured by Thermo Fisher Scientific
Sourced in Australia

The Nova NanoSEM 230 is a field emission scanning electron microscope (FESEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-brightness Schottky field emission gun and advanced electron optics for exceptional resolution, low-voltage imaging, and high contrast. The Nova NanoSEM 230 is capable of achieving a resolution down to 0.8 nm at 15 kV.

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3 protocols using nova nanosem 230 fesem

1

Visualization of Functionalized Nanoparticles

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Morphologic features and particle size of CNP, GA-CNP, and FITC-labeled GA-CNP were observed under field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM). All liquid samples were diluted prior to analysis using deionized distilled water. Approximately 20 µL of the samples was diluted into 500 µL deionized distilled water and sonicated for 1–2 minutes. An aluminum stub was then dropwise coated with the sample and dried at 55°C for 3 days. Preceding the analysis, samples were coated with gold and visualized using a FEI Nova Nanosem 230 FESEM (Kensington, Sydney, Australia). The magnification and voltage used were 100,000× and 5.00 kV, respectively. For TEM analysis, the samples were diluted into deionized distilled water. Few drops of the samples were diluted into 500 µL distilled water. A drop of the diluted samples was then coated onto a copper grid and was air dried at room temperature. The samples were then analyzed using a TECNAI G2 F20 (Pleasanton, CA, USA) transmission electron microscope utilizing voltages from 20 to 200 kV and standard magnification from 22× to 930 k×. Images were acquired using an SC1000 ORIUS CCD (Pleasanton, CA, USA) camera.
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2

Surface Morphology Analysis of EFBB

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The surface morphology analysis of all the three EFBB samples was conducted using the Field Emission Scanning Electron Microscopy (Fei Nova Nanosem 230 FESEM, Netherland) attached to an Energy Dispersive X-ray Spectroscopy (EDX) (Oxford Instrument X-MAX, UK). The EDX was used to determine the elements on the surface of the EFBB samples.
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3

High-Resolution Electron Microscopy Protocol

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Nova NanoSEM 230 FESEM (FEI, Sydney, NSW, Australia) is used to view the specified area of the samples via 1 nm resolution at 15 kV. Secondary electron (SE) imaging can be undertaken in field-free and immersion mode (TLD) for comprehensive low-to-high resolution imaging (100,000× magnification). The FESEM service has been accredited by the Quality System of MS ISO/IEC 17,025 Certification.
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