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Helios g4 dualbeam microscope

Manufactured by Thermo Fisher Scientific
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The Helios G4 DualBeam microscope is a versatile imaging and analysis tool that combines a high-resolution scanning electron microscope (SEM) with a focused ion beam (FIB) system. This instrument allows for detailed observation and characterization of samples at the nanoscale level.

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Helios G4 (14 citations) Helios G4 DualBeam (2 citations) Helios G4 UC DualBeam microscope (1 citations)

2 protocols using helios g4 dualbeam microscope

1

Microscopic Characterization of LbL Films

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Optical microscope images of the as-deposited and degraded LbL films on silicon substrates were collected using an Olympus DXS500 microscope (Olympus Deutschland GmbH, Hamburg, Germany) with 10× and 50× magnification lenses. Scanning electron microscopy (SEM) images were collected using a Helios G4 DualBeam microscope (Thermo Fisher Scientific Inc., Waltham, MA, USA) at 1 kV to observe the morphology of the as-deposited and degraded LbL films on silicon substrates without needing any metal sputter-coating.
Brito J., Moon J., Hlushko R., Aliakseyeu A., Andrianov A.K, & Sukhishvili S.A. (2024). Engineering Degradation Rate of Polyphosphazene-Based Layer-by-Layer Polymer Coatings. Journal of Functional Biomaterials, 15(2), 26.
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2

hBN Metasurface Fabrication and Defect Generation

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hBN metasurfaces are fabricated from exfoliated bulk crystals following the method described in detail in ref. 6 (link). The generation of VB- defects is obtained by irradiating the hBN BIC metasurfaces in a Thermo Fisher Scientific Helios G4 Dual Beam microscope using a 30 kV nitrogen ion beam. The entire region was uniformly irradiated with a fluence of 1.0 ×1014 ions/cm2.
Sortino L., Gale A., Kühner L., Li C., Biechteler J., Wendisch F.J., Kianinia M., Ren H., Toth M., Maier S.A., Aharonovich I, & Tittl A. (2024). Optically addressable spin defects coupled to bound states in the continuum metasurfaces. Nature Communications, 15, 2008.
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