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35 protocols using v 670 spectrometer

1

Multi-Technique Characterization of Materials

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Powder X-ray powder diffraction (PXRD) patterns were obtained by employing a PANalytical Empyrean X-ray platform with a capillary platform and copper radiation (Cu Kα = 1.541 78 Å). Measurements were carried out in triplicate in the 2-theta range 2–70° by employing a step size of 0.02° per step with an integration time of 1 s. The attenuated total reflectance-Fourier transform infrared spectroscopy (ATR-FTIR) spectra were recorded using a Bruker alpha II FTIR spectrometer in the 4000–400 cm−1 range. The UV-vis absorption spectra of the solid samples were recorded in the reflectance mode by using a Jasco V-670 spectrometer. X-ray photoelectron spectroscopy (XPS) spectra were recorded using a Thermo Scientific™ K-Alpha X-ray Photoelectron Spectrometer. Al Kα X-ray radiation was employed as the X-ray source. For all the elements, more than 100 spectra were recorded by employing a step of 0.1 eV with a focused spot higher than 400 μm. XPS data were analysed with the Thermo Avantage v5.9912 software.
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Comprehensive Spectroscopic Characterization

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1H NMR (500 MHz) and 13C NMR (126 MHz) spectra were recorded using a Bruker AVANCE III HD spectrometer. Chemical shifts were reported at the delta scale in p.p.m. relative to CHCl3 (δ=7.260 p.p.m.), CH2Cl2 (δ=5.320 p.p.m.), toluene-d8 (δ=7.000 p.p.m.), acetone-d6 (δ=2.05 p.p.m.) and 1,2-dichlorobenzene-d4 (δ=6.930 p.p.m.) for 1H NMR and CDCl3 (δ=77.0 p.p.m.) for 13C NMR. 1H and 13C NMR spectra are provided for all compounds; see Supplementary Figs 1–17. Ultraviolet–visible–near infrared absorption spectra were recorded using a Shimadzu UV-2550 or JASCO V670 spectrometer. Emission spectra were recorded using a JASCO FP-6500 spectrometer and absolute fluorescence quantum yields were measured by the photon-counting method using an integration sphere. Mass spectra were recorded using a Bruker microTOF by electrospray ionization (ESI) methods. Unless otherwise noted, materials obtained from commercial suppliers were used without further purification.
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UV–vis Absorption Spectra Collection

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UV–vis absorption spectra were collected
using a Jasco V670 spectrometer in transmission mode.
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4

Synthesis and Characterization of Triphenylamine Derivatives

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All solvents and chemicals of reagent grade were used without purification except tetra-n-butylammonium phosphate (n-Bu4NPF6), which was recrystallized from methanol. 4-Aminotriphenylamine [59 (link)], 4,4’-dimethoxy-4’’-nitrotriphenylamine [38 (link)], 4,4’-dimethyl-4’’-nitrotriphenylamine [60 (link)], and n-Bu4NBArF4 [61 (link)] were synthesized as described in the literature. A JASCO V-670 spectrometer was used for UV–vis-NIR measurements at room temperature. The 1H NMR spectra were recorded using a JEOL JNM-ECP400 spectrometer with tetramethylsilane (TMS) as internal standard (0 ppm). EIMS measurements were performed using a JEOL JMS-700 MStation spectrometer.
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5

Characterization of HiPco SWCNTs

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The reagents and solvents were purchased from Aldrich, Wako Pure Chemical Industries Ltd., and Tokyo Chemical Industry. Single-walled carbon nanotubes (SWCNT), which were synthesised from a high-pressure carbon monoxide method (HiPco), were purchased from NanoIntegris (d = 0.8–1.2 nm, length = 100–1000 nm).
UV-Vis-NIR spectra were measured with a V-670 spectrometer (Jasco) using quartz cells (pass length = 0.5 mm). UV light was irradiated by a UV-LED (EXECURE H-1VH4-V1, HOYA Candeo Optronics) and Super-high pressure mercury lamp (USHIO, E016 with optical cut filter). Atomic Force Microscope (AFM) images (tapping mode) were recorded using an Innova (Veeco Instruments, Inc.) with a Si probe (RTESP-300, f0 = 300 kHz, Bruker). Sheet resistance was measured with a Loresta-AX resistivity meter (MCP-T370, Mitsubishi Chemical Analytech). Raman spectroscopy was measured by an NRS-1000 spectrometer (Jasco) with a 532 nm laser source (2.5 mW). Elemental analysis was recorded using vario MICRO cube (Elementar).
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6

Photophysical Characterization of Thin Films

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Thin-film samples for photophysical measurements were deposited on quartz substrates via vacuum deposition using an E-200 vacuum evaporation system (ALS Technology). The ultraviolet (UV)–visible absorption and PL spectra were measured using a V-670 spectrometer (Jasco) and an FP-8600 spectrophotometer (Jasco), respectively. The absolute PL quantum yields (ΦPL) were determined using an ILF-835 integrating sphere system (Jasco). Transient PL decay measurements were performed using a C11367 Quantaurus-Tau fluorescence lifetime spectrometer (Hamamatsu Photonics) with a 280-nm LED excitation source under a nitrogen atmosphere.
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7

Optical Spectroscopy of Quantum Dots

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The UV–vis
measurements were conducted with a V670 spectrometer from Jasco, equipped
with a photomultiplier tube (PMT) and a Peltier-cooled PbS detector
in transmission mode. The transmission spectra were corrected for
a dark-count spectrum and referenced to a baseline spectrum of the
employed solvent.
The PL spectra were recorded with a Fluorolog
iHR 320 Horiba Jobin Yvon spectrometer from Horiba Scientific fitted
with a PMT detector. The PL emission was determined by finding the
emission wavelength λemission with a maximum PL intensity.
Time-resolved PL measurements were performed with a FluoTime 300
spectrometer from PicoQuant equipped with a TimeHarp 260 PICO counting
TCSPC unit and a 355 nm pulsed PicoQuant laser. Samples were prepared
by spin-coating or drop-casting of solutions containing QDs (∼0.1
mg/mL) and organic dyes (concentrations indicated in figure legends).
Donor decay traces were recorded at the PL peak center by using an
emission monochromator.
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8

UV-Vis Spectral Analysis of Compounds 1-4

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Ultraviolet–visible spectra were collected for compounds
14 using a JASCO V-670 spectrometer in the
solution in absorption mode within the wavelength range
200–500 nm (Supplementary Figs 18–21).
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9

Spectroscopic Characterization of Compounds

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1H NMR (500 MHz) and 13C NMR (126 MHz) spectra of the compounds were recorded on a Bruker AVANCE III HD spectrometer. Chemical shifts were reported as the delta scale in p.p.m. relative to CDCl3 (δ=7.26 p.p.m.) for 1H NMR and CDCl3 (δ=77.16 p.p.m.) for 13C NMR. 1H and 13C NMR spectra are provided for compounds; see Supplementary Figs 1–10. Ultraviolet/Vis/near-infrared spectroscopy (NIR) absorption spectra were recorded on a Shimadzu UV-2550 or JASCO V670 spectrometer. Mass spectra were recorded on a Bruker microTOF using electrospray ionization (ESI)-time-of-flight method for acetonitrile solutions. Unless otherwise noted, materials obtained from commercial suppliers were used without further purification.
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10

Comprehensive Characterization of GO-based Materials

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UV−Vis absorption spectra were measured using JASCO V-670 spectrometer. The XRD measurements were performed on a 2D Phaser equipment (Bruker, Madrid, Spain), with Cu-Kα radiation working at 30 kV and 10 mA, in order to check the crystalline structure of the GO-based materials. Thermogravimetric analysis (TGA) was performed on a TGA Q50 thermogravimetric analyzer (TA Instruments, Cerdanyola del Valles, Spain). Samples (5−10 mg) were weighed in titanium crucibles and heated under a nitrogen atmosphere from 50 to 800 °C at a heating rate of 10 °C min−1. Surface morphologies were obtained by SEM (JSM 6300 JEOL, Tokyo, Japan) equipped with energy-dispersive X-ray spectrometer (EDS, Oxford Instruments, Bristol, UK) for elemental composition measurements. TEM images were acquired using JEM-1010 (JEOL DEBEN AMT, Tokyo, Japan). The presence of functional groups was assessed by means of FTIR. FTIR spectra were acquired on a FT/IR-6200 (Jasco, Madrid, Spain) spectrometer in the spectral window of 4000–400 cm−1 in ATR mode. The structure and composition of GO-based materials were studied by X-ray photoelectron spectroscopy (XPS) with a VG-Microtech Multilab 3000 (Thermo Fisher Scientific Inc., Waltham, MA, USA) photoelectron spectrometer. Potential zeta was recorded using a dynamic laser scattering analyzer (Zetasizer, 2000 HAS, Malvern, Worcestershire, UK).
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