Morphological analysis was made on a high-resolution scanning electron microscope FEI Quanta3D FEG (Thermo Fisher Scientific, GmbH, Dreieich, Germany).
Fei quanta 3d feg
Manufactured by Thermo Fisher Scientific
Sourced in United States
The FEI Quanta 3D FEG is a high-performance scanning electron microscope (SEM) that combines field emission gun (FEG) technology with a focused ion beam (FIB) for advanced materials analysis and sample preparation. It provides high-resolution imaging and precise milling capabilities for a wide range of applications.
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Lab products found in correlation
6 protocols using fei quanta 3d feg
1
Scanning Electron Microscopy Analysis
2
Corrosion Analysis of Implanted Bone Screws
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To investigate the extent and uniformity of the corrosive process and the chemical composition of the solid corrosion products, sections of the bones with implanted screws were observed using a scanning electron microscope FEI Quanta 3D FEG (ThermoFisher Scientific, Waltham, MA, USA) equipped with an energy dispersive spectrometer EDAX Apollo 40 (Ametek, Berwyn, PA, USA) (SEM-EDS).
3
Scanning Electron Microscopy of Implant Surfaces
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A scanning electron microscope FEI Quanta 3D FEG (Thermo Scientific, Waltham, MA, USA) was employed to examine the implant surface structure before and after laser irradiation and to evaluate an impact of laser irradiation on the surface morphology of the implant. The implants were deposited onto aluminium specimen mounts with self-adhesive carbon conducting discs and coated with an Au/Pd alloy by using Polaron SC7640 sputter coater (Quorum Technologies, Lewes, UK). The microscopic images were obtained at a high vacuum (HV) with topographic contrast, i.e., the registration of secondary electrons (SE) escaping the very thin surface layer of the specimen. The micrographs of the surface of the study specimens were registered at a magnification range of 100 to 5000×. This paper presents comparative results for sample SEM images registered at magnifications of 500 and 5000×.
4
Scanning Electron Microscopy of Prepared Samples
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The morphology of the prepared samples was analyzed using an FEI Quanta™ 3D FEG (Thermo Fisher Scientific, Waltham, MA, USA). The samples were mounted on an aluminum stub with double-sided carbon tape, followed by coating with gold at a layer of 6 nm.
5
Implant-Bone Interface Analysis
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The implant–bone interface was observed using a scanning electron microscope FEI Quanta 3D FEG (ThermoFisher Scientific, Waltham, MA, USA) equipped with an EDAX Apollo 40 energy dispersive spectrometer (Ametek, Berwyn, PA, USA) (SEM–EDS). The obtained data were used to evaluate the excess and uniformity of the corrosion attack. The chemical composition of the solid corrosion data were also estimated using the acquired data.
6
Microscopic Visualization and SEM Imaging of Films
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The surface macroscopic appearance of the prepared films was visualised using a phase-contrast microscope (Olympus IX51, USA) equipped with a digital colour camera (Olympus XC50, USA). The cross-sectional scanning electron microscope (SEM) imaging of the film was performed using a FEI Quanta 3D FEG (Thermo Fisher Scientific, Waltham, MA, USA) at an accelerating voltage of 10 kV.
A double-sided adhesive was used to fix the cryo-fractured film's pieces onto cylindrical stubs. The samples were then coated with a layer of gold using a Q150T Quorum (Quorum Technology Ltd., Lewes, UK).
A double-sided adhesive was used to fix the cryo-fractured film's pieces onto cylindrical stubs. The samples were then coated with a layer of gold using a Q150T Quorum (Quorum Technology Ltd., Lewes, UK).
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