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Miniflex 2

Manufactured by JEOL
Sourced in Japan

The Miniflex-II is a compact X-ray diffractometer designed for versatile phase identification and quantification. It features a high-intensity X-ray source and a compact goniometer for efficient data collection. The Miniflex-II is capable of analyzing a wide range of materials, including powders, thin films, and small samples.

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3 protocols using miniflex 2

1

Comprehensive Characterization of Composite Membranes

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An FTIR-ATR spectrometer (Thermo Scientific, Winsford, UK), XRD (Rigaku, miniflex-II, Tokyo, Japan), SEM (JEOL, JSM-6510 LV, Tokyo, Japan), potentiostat/galvanostat (PGSTAT 302 N autolab, Herisau, Switzerland), TGA/DTA recorder (DTG60H, Shimadzu, Tokyo, Japan), pH meter, magnetic stirrer, digital electronic balance, and electric air pump were used for processing and characterization of the prepared composite membrane.
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2

Comprehensive Characterization of Customizable MXene Inks

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The rheological properties of the customizable inks were analyzed using a rheometer (Anton Paar, MCR 302). The surface morphologies and structures of the printed electrodes and devices were studied by optical microscopy (ZEISS) and scanning electron microscopy (SEM; ZEISS 1550VP FESEM). The SEM was equipped with an energy-dispersive x-ray spectroscopy analyzer (Oxford X-Max SDD) to determine the element composition of as-printed MXene and MX-PB. The microstructures and material properties were further characterized using x-ray diffraction (Rigaku, Miniflex II), TEM (JEOL, 2100F), and Raman spectroscopy (WITec, CRM200). The lateral size and thickness of the MXene nanosheets were characterized using atomic force microscopy (Asylum Research Cypher S). Contact angle measurements of the various printed MXene were acquired using a goniometer (ramé-hart).
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3

Characterization of Zn(Pb) Morphology and Composition

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A high‐resolution SEM image of Zn(Pb) was obtained using a JEOL‐6700F. Morphological structure and elemental distribution were characterized by TEM(JEOL JEM‐2010) at the accelerating voltage of 200 kV. XRD patterns were recorded on a MiniFlex II diffractometer using a Cu Kα (λ = 1.54 Å) radiation source at the scan rate of 0.5° min–1. The chemical valence and elemental surveying were analyzed by XPS (VG ESCALAB 250) with an Al K X‐ray source at 1487 eV. The chamber pressure was kept below 3 × 10–10 mbar during analysis and a specific correction was done by employing the C1s binding energy of 284.8 eV. ICP measurements were performed on an optical emission spectrometer (Horiba, Ultima 2) to detect sample atomic ratios. The in situ FTIR spectra in the wavenumber region 1200–2800 cm–1 were collected by a Fourier transform infrared spectrometer (Thermo scientific, Nicolet 6700 FTIR) with a ZnSe IR transparent window allowing the beam to pass through a thin electrolyte layer and to be reflected with an incidence angle of 65.
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