The collective surface morphology of the prepared TiO2 NPs was investigated and visualized using a scanning electron microscope (Quanta FEG250-FEI-USA). The surface morphology of the TiO2 NPs was examined via a magnification software suite with SEM. The scanning electron microscope setup was fitted with an Energy-Dispersive X-ray (EDAX Genesis APEX 2i with the ApolloX SDD spectrometer) to analyze the elements present in the sample.
Apollox sdd spectrometer
Manufactured by Ametek
Sourced in United States
The ApolloX SDD spectrometer is a compact, high-performance X-ray detector designed for a variety of analytical applications. It features a silicon drift detector (SDD) technology that provides excellent energy resolution and count rate capability.
Automatically generated - may contain errors
Lab products found in correlation
Fei quanta 250 feg, by Thermo Fisher Scientific (2 mentions)
Agilent 1290 series liquid chromatograph, by Agilent Technologies (2 mentions)
Quanta 250 feg scanning electron microscope, by Thermo Fisher Scientific (1 mentions)
Nicolet is50 ftir spectrometer, by Thermo Fisher Scientific (1 mentions)
Tga dsc 1 analyzer, by Mettler Toledo (1 mentions)
4 protocols using apollox sdd spectrometer
1
Scanning Electron Microscopy of TiO2 NPs
2
Structural and Microstructural Analysis of SrTiO3
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In order to determine the structural properties of the obtained materials, a Phillips X’Pert Pro diffractometer (XRD) (Almelo, The Netherlands) with CuKα (1.540 Å) was used. The measurements were carried out in the 10–120° range under 40 kV and 40 mA, at room temperature in air. Unit cell parameters were determined by Rietveld refinements in FullProf Suite software (3.0, June 2015) [39 (link)]. As an initial point of the analysis, unit cell parameters of the SrTiO3 structure (space group no. 221, Pm-3m) were used.
The microstructure of the sintered pellets surfaces/cross-sections was examined on an FEI Quanta FEG 250 Scanning Electron Microscope (SEM) (Waltham, MA, USA). The SEM images were collected using an Everhart–Thornley Detector (ETD) detector for secondary electrons in a high vacuum at 20 kV acceleration voltage. The analysis of materials composition by Energy Dispersive X-Ray Spectroscopy (EDS) was performed using the EDAX ApolloX SDD spectrometer (Mahwah, NJ, USA). The density and porosity of the pellets were determined using the Archimedes method with kerosene as a liquid medium.
The microstructure of the sintered pellets surfaces/cross-sections was examined on an FEI Quanta FEG 250 Scanning Electron Microscope (SEM) (Waltham, MA, USA). The SEM images were collected using an Everhart–Thornley Detector (ETD) detector for secondary electrons in a high vacuum at 20 kV acceleration voltage. The analysis of materials composition by Energy Dispersive X-Ray Spectroscopy (EDS) was performed using the EDAX ApolloX SDD spectrometer (Mahwah, NJ, USA). The density and porosity of the pellets were determined using the Archimedes method with kerosene as a liquid medium.
3
Multi-modal Materials Characterization
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Next generation sequencing was performed on Illumina platform. A scanning electron microscope (SEM) with a secondary electron detector operated in high vacuum mode at an accelerating voltage of 10–20 kV (FEI Quanta FEG 250, Thermo Fisher Scientific, Waltham, MA, USA) was used to examine the morphology of the samples. The elements were identified by energy dispersive spectroscopy (EDS) with ApolloX SDD spectrometer (Ametek, Berwin, PA, USA) at an accelerating voltage of 20 kV. A Nicolet iS50 FTIR spectrometer controlled by the OMNIC v9.2 software package (Thermo Fisher Scientific, Waltham, MA, USA) equipped with Specac Quest Total Reflection Diamond (ATR) accessory and a single reflection diamond was used to record infrared transmission spectra. Chromatographic analysis was performed using Agilent liquid chromatograph series 1290 (Agilent Technology, Waldbronn, Germany) consisting of binary pump G4220A, autosampler G4226A, thermostated column compartment G1316C, diode-array detector G1315C, and triple quadrupole mass spectrometer G6460 with AJS electrospray ionization source. The chromatographic system was controlled with Agilent MassHunter software B 06.01.
4
Multitechnique Characterization of Materials
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A scanning electron microscope (SEM) with a secondary electron detector operated in high vacuum mode at an accelerating voltage of 10–20 kV (FEI Quanta FEG 250, Thermo Fisher Scientific, Waltham, MA, USA) was used to examine the morphology of the samples. The elements were identified by energy dispersive spectroscopy (EDS) using an ApolloX SDD spectrometer (Ametek, Berwin, PA, USA) at an accelerating voltage of 20 kV. Chromatographic analysis was performed using an Agilent Liquid Chromatograph Series 1290 (Agilent Technology, Waldbronn, Germany) containing a high speed binary pump (G7120A), autosampler (G7167B), thermostated column compartment (G7116B), diode-array detector (G1315C), and triple quadrupole mass spectrometer with AJS electrospray ionization source (G6470B). The Agilent MassHunter software (B 06.01) controlled the chromatographic system.
Thermogravimetric analysis (TGA) in two different atmospheres was applied to monitor the thermal degradation process, which is related to mass loss as a function of rising temperature. Thermogravimetric measurements (TGA/DSC1 analyzer, Mettler Toledo, Greifensee, Switzerland) were taken at a linear heating rate of 10 °C min−1 over the temperature range from ambient temperature to 1100 °C, in an air or N2 flow.
Thermogravimetric analysis (TGA) in two different atmospheres was applied to monitor the thermal degradation process, which is related to mass loss as a function of rising temperature. Thermogravimetric measurements (TGA/DSC1 analyzer, Mettler Toledo, Greifensee, Switzerland) were taken at a linear heating rate of 10 °C min−1 over the temperature range from ambient temperature to 1100 °C, in an air or N2 flow.
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