XPS spectra were acquired using a Thermo Scientific K-Alpha X-ray photoelectron spectrometer (Thermo Electron Corp., East Grinstead, UK), equipped with an Al Ka X-ray source (1486.6 eV). A take-off angle of 90° was used during data acquisition, and a charge neutralization gun used to compensate for surface charging. The CasaXPs software (Casa, http://www.casaxps.com , UK) was used to analyze the XPS spectra. All spectra were corrected to hydrocarbon C1s peak at 285 eV as reference. Wide scans spectra were recorded at a pass energy of 150 and 1 eV/step, while narrow scans spectra were recorded at a pass energy of 50 and 0.1 eV/step.
K alpha x ray photoelectron spectrometer
Manufactured by Thermo Fisher Scientific
Sourced in United States, United Kingdom, Germany
The K-Alpha X-ray photoelectron spectrometer is a laboratory instrument used for surface analysis. It employs X-ray photoelectron spectroscopy (XPS) to provide information about the chemical composition and electronic structure of a sample's surface.
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Lab products found in correlation
D8 advance x ray diffractometer, by Bruker (2 mentions)
Fls920, by Edinburgh Instruments (2 mentions)
Nicolet nexus 670, by Thermo Fisher Scientific (2 mentions)
S 4800 sem, by Hitachi (2 mentions)
D2 phaser diffractometer, by Bruker (2 mentions)
Spectrum one ftir spectrometer, by PerkinElmer (2 mentions)
Avantage data system software, by Thermo Fisher Scientific (2 mentions)
S 4800, by Hitachi (2 mentions)
Uv 3600 ultraviolet visible spectrophotometer, by Shimadzu (2 mentions)
Mira lms, by TESCAN (2 mentions)
Amt hamamatsu digital camera, by Hamamatsu Photonics (2 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (2 mentions)
Dxr raman microscope, by Thermo Fisher Scientific (2 mentions)
S 4800 field emission scanning electron microscope, by Hitachi (2 mentions)
Uv vis nir 3600 spectrometer, by Shimadzu (1 mentions)
Empyrean x ray platform, by Malvern Panalytical (1 mentions)
V 670 spectrometer, by Jasco (1 mentions)
Alpha 2 ft ir spectrometer, by Bruker (1 mentions)
Avantage data system, by Thermo Fisher Scientific (1 mentions)
Fluotime 300, by PicoQuant (1 mentions)
93 protocols using k alpha x ray photoelectron spectrometer
1
XPS Characterization of Surface Composition
2
Characterization of Perovskite Solar Cells
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X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were conducted for the perovskite samples using the D8 Advance X-ray diffractometer (Bruker, Billerica, MA, USA) and the K-Alpha X-ray photoelectron spectrometer (Thermo Electron, Waltham, MA, USA), respectively.
Current density–voltage (J–V) curves of the PSCs were obtained using the 2400 Series J–V Source Meter (Keithley Instrument, Solon, OH, USA) under an irradiation intensity of 100 mW cm2 (AM1.5). We used a solar simulator (XES-301S, SAN-EI ELECTRIC, Osaka, Japan) for simulating sunlight irradiation.
The space charge limited current (SCLC) of a hole-only device (glass/ITO/PTAA/Perovskite/PTAA/Ag) was obtained using the Keithley 2400 Source Meter under dark conditions. Electrochemical impedance spectroscopy (EIS) of the PSCs was performed with an electrochemical work station (CH instruments, Austin, TX, USA) under dark conditions. Steady-state photoluminescence (PL) spectroscopy was conducted using FLS920 (Edinburgh Instruments, Livingston, UK) at wavelengths between 720 nm and 800 nm with the excitation wavelength of 514 nm. Ultraviolet–visible absorption spectroscopy was performed with a UV–vis-NIR 3600 spectrometer (Shimadzu, Kyoto, Japan). The morphology of the devices was measured by the scanning electron microscope (SEM, JOEL, Tokyo, Japan) and atomic force microscope (AFM, Veeco, Plainview, NY, USA).
Current density–voltage (J–V) curves of the PSCs were obtained using the 2400 Series J–V Source Meter (Keithley Instrument, Solon, OH, USA) under an irradiation intensity of 100 mW cm2 (AM1.5). We used a solar simulator (XES-301S, SAN-EI ELECTRIC, Osaka, Japan) for simulating sunlight irradiation.
The space charge limited current (SCLC) of a hole-only device (glass/ITO/PTAA/Perovskite/PTAA/Ag) was obtained using the Keithley 2400 Source Meter under dark conditions. Electrochemical impedance spectroscopy (EIS) of the PSCs was performed with an electrochemical work station (CH instruments, Austin, TX, USA) under dark conditions. Steady-state photoluminescence (PL) spectroscopy was conducted using FLS920 (Edinburgh Instruments, Livingston, UK) at wavelengths between 720 nm and 800 nm with the excitation wavelength of 514 nm. Ultraviolet–visible absorption spectroscopy was performed with a UV–vis-NIR 3600 spectrometer (Shimadzu, Kyoto, Japan). The morphology of the devices was measured by the scanning electron microscope (SEM, JOEL, Tokyo, Japan) and atomic force microscope (AFM, Veeco, Plainview, NY, USA).
3
Surface Characterization of Coatings via XPS
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XPS was performed to detect the surface chemical compositions of the coating using a K-Alpha X-ray photoelectron spectrometer (Thermo Electron, Waltham, MA, USA).
4
Multi-Technique Characterization of Materials
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Powder X-ray powder diffraction (PXRD) patterns were obtained by employing a PANalytical Empyrean X-ray platform with a capillary platform and copper radiation (Cu Kα = 1.541 78 Å). Measurements were carried out in triplicate in the 2-theta range 2–70° by employing a step size of 0.02° per step with an integration time of 1 s. The attenuated total reflectance-Fourier transform infrared spectroscopy (ATR-FTIR) spectra were recorded using a Bruker alpha II FTIR spectrometer in the 4000–400 cm−1 range. The UV-vis absorption spectra of the solid samples were recorded in the reflectance mode by using a Jasco V-670 spectrometer. X-ray photoelectron spectroscopy (XPS) spectra were recorded using a Thermo Scientific™ K-Alpha X-ray Photoelectron Spectrometer. Al Kα X-ray radiation was employed as the X-ray source. For all the elements, more than 100 spectra were recorded by employing a step of 0.1 eV with a focused spot higher than 400 μm. XPS data were analysed with the Thermo Avantage v5.9912 software.
5
Comprehensive Materials Characterization Protocol
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X-ray diffraction (XRD) patterns were characterized by X’ Pert PRO with a Cu Kα radiation source (λ=1.5405˚A). Fourier-transform infrared spectroscopy (FT-IR) spectra were recorded with Thermo Nicolet NEXUS 670 in the range of 400-4000 cm−1. The Brunauer–Emmett–Teller (BET) surface area was measured on a TriStar Ⅱ 3200. Field-emission scanning electron microscopy (SEM) was performed by Hitachi S4800 SEM. X-ray photoelectron spectroscopy (XPS) measurements were performed on Thermo Scientific K-Alpha X-ray photoelectron spectrometer. The X-ray absorption structure (XAS) was collected at the 1W1B beamlines of the Beijing Synchrotron Radiation Facility (BSRF), China.
6
Optical Characterization of Cross-Sectioned Materials
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The discharge gap and topology were controlled optically using an Olympus BX51M instrument (Ryf AG, Grenchen, Switzerland).
The cross-sections were prepared using Opal 410, Jade 700, and Saphir 300 sample equipment (ATM, Haan, the Netherlands) and standard techniques. An epoxy resin with quartz sand was used as a filler.
Elemental analyses of the machined surfaces were conducted using Thermo Scientific’s K-ALPHA X-ray photoelectron spectrometer (Thermo Fisher Scientific Inc., Bremen, Germany) equipped with an Avantage Data System (version 5.0, Thermo Fisher Scientific Inc., Bremen, Germany).
The cross-sections were prepared using Opal 410, Jade 700, and Saphir 300 sample equipment (ATM, Haan, the Netherlands) and standard techniques. An epoxy resin with quartz sand was used as a filler.
Elemental analyses of the machined surfaces were conducted using Thermo Scientific’s K-ALPHA X-ray photoelectron spectrometer (Thermo Fisher Scientific Inc., Bremen, Germany) equipped with an Avantage Data System (version 5.0, Thermo Fisher Scientific Inc., Bremen, Germany).
7
Comprehensive Characterization of Materials
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Transmission electron microscopy (TEM) was performed on JEOL JEM-2010 high resolution transmission electron microscope operated at 200 kV. X-ray photoelectron spectroscopy (XPS) was performed on an Thermo Fisher Scientific K-Alpha X-ray photoelectron spectrometer. FTIR spectrum was collected at room temperature (on a Jasco FTIR-4100 spectrometer) from sample prepared as pellets with KBr. The UV–Vis absorption spectrum was recorded with V-750 UV–Vis spectrophotometer (Jasco). Steady-state and time-resolved PL measurements were performed based on a spectrophotometers (Fluotime 300, PicoQuant). A pulsed Xenon lamp was used as an excitation source and the PL emission excited at ~400 nm is collected by a PMT detector with the calibration according to the wavelength-response function of our detector. The instrument response function for our whole time-resolved PL measurement system is ~400 ns. Absolute PL-QY measurement was performed based on the aforementioned spectrometer incorporated with an integrating sphere. The excitation and emission spectra were measured for both reference and experimental samples by the calibrated detectors. In this case, the ratio between total amounts of photons emitted and absorbed can be determined, thus the PL-QY can be deduced.
8
Comprehensive Characterization of BG-AgNPs
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SpectraMax iD3 microplate reader (Molecular Devices, San Jose, CA, USA) was used to measure the UV-Vis absorbance spectra of BG-AgNPs. By using Spectrum one FT–IR Spectrometer (Perkin Elmer Instruments, Waltham, MA, USA), the FT-IR measurements for the respective BG extracts and BG-AgNPs were recorded between 4000 and 400 cm−1 using KBr as a reference. D2 phaser diffractometer (Bruker, Germany) with Cu Kα radiation with λ = 1.54 Å was utilized to analyze the powder X-ray diffraction pattern (P-XRD) of as-prepared AgNPs. K-Alpha X-ray photoelectron spectrometer (Thermo Scientific, Waltham, MA, USA) using a high-resolution monochromatic Al Kα line as excitation source was used in this study. Zeta Sizer Nano ZS (Malvern Instruments Ltd., Worcestershire, UK) was used for measuring the Zeta potential for the obtained BG-AgNPs (n = 3).
9
Comprehensive Characterization of 3D Mag-MoO3–PDA@Au NS
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The synthesized samples were characterized using a variety of techniques, from electron microscopy to spectroscopy. Scanning electron microscopy (SEM) combined with an energy dispersive X-ray analysis (EDX) were obtained using Zeiss Sigma 500 system (Oxford Instrument). Transmission electron microscopy (TEM) characterization was performed on an America FEI G2 Tecnai operating at 20 kV. X-ray photoelectron spectroscopy (XPS) was obtained using Thermo Fisher Scientific K-Alpha X-ray photoelectron spectrometer with an excitation source of Al Kα = 1486.6 eV. The binding energies were corrected by referencing the C 1s line to 284.80 eV. Powder X-ray diffraction (XRD) patterns were acquired using a Bruker D8 Advance diffractometer with Cu Kα radiation. UV-Vis absorption spectra were acquired with the use of a PerkinElmer-570 spectrophotometer. The magnetic properties of the 3D mag-MoO3–PDA@Au NS was measured from −10 kOe to +10 kOe using a superconducting quantum interference device (SQUID magnetometer), Quantum Design, Inc., San Diego, CA, USA.
10
Characterization of Metal-Organic Frameworks
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All reagents
and solvents used
in the experiments were commercially available and used without further
purification (Innochem, China). The FT-IR absorption spectra for Cd-CP,
Hg@Cd-CP and Pb@Cd-CP were collected from KBr pellets using a Thermo
Scientific FTIR-Nicolet iS10 spectrometer in the range of 4000–400
cm–1 (Thermo Scientific, U.S.A.). Powder X-ray diffraction
(PXRD) was performed in the 2θ range of 5–50° on
a Rigaku X-ray diffractometer with Cu Kα radiation (λ
= 1.5418 Å) (Rigaku, Japan). Elemental analyses were carried
out on a PerkinElmer 2400C elemental analyzer (Elementar, Germany).
TGA data were acquired using a Mettler-Toledo simultaneous thermal
analyzer from room temperature to 800 °C under an N2 atmosphere at a heating rate of 10 °C min–1 (Netzsch, Germany). XPS was performed using a K-Alpha X-ray photoelectron
spectrometer (Thermo Scientific, USA). The morphology and energy-dispersive
spectroscopy (EDS) data of Cd-CP, Hg@Cd-CP, and Pb@Cd-CP were obtained
using a Nova NanoSEM 450 field-emission scanning electron microscope
(SEM) at 10 Kv (Thermo Scientific, U.S.A.). The concentration of metal
ions was determined with an iCAP6300 ICP-AES (Thermo Scientific, U.S.A.).
and solvents used
in the experiments were commercially available and used without further
purification (Innochem, China). The FT-IR absorption spectra for Cd-CP,
Hg@Cd-CP and Pb@Cd-CP were collected from KBr pellets using a Thermo
Scientific FTIR-Nicolet iS10 spectrometer in the range of 4000–400
cm–1 (Thermo Scientific, U.S.A.). Powder X-ray diffraction
(PXRD) was performed in the 2θ range of 5–50° on
a Rigaku X-ray diffractometer with Cu Kα radiation (λ
= 1.5418 Å) (Rigaku, Japan). Elemental analyses were carried
out on a PerkinElmer 2400C elemental analyzer (Elementar, Germany).
TGA data were acquired using a Mettler-Toledo simultaneous thermal
analyzer from room temperature to 800 °C under an N2 atmosphere at a heating rate of 10 °C min–1 (Netzsch, Germany). XPS was performed using a K-Alpha X-ray photoelectron
spectrometer (Thermo Scientific, USA). The morphology and energy-dispersive
spectroscopy (EDS) data of Cd-CP, Hg@Cd-CP, and Pb@Cd-CP were obtained
using a Nova NanoSEM 450 field-emission scanning electron microscope
(SEM) at 10 Kv (Thermo Scientific, U.S.A.). The concentration of metal
ions was determined with an iCAP6300 ICP-AES (Thermo Scientific, U.S.A.).
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