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19 protocols using fastscan bio

1

SEM and AFM Characterization of Hydrogels

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For scanning electron microscopy (SEM) measurement, an aliquot of the hydrogel was dropped on a silicon wafer and dried in a vacuum at room temperature. Before image acquisition with an S-4800 (HITACHI, Japan, 10 kV voltage) instrument, the sample on a silicon wafer was sputtered with platinum to increase conductivity.
For AFM characterization, hydrogels were deposited on freshly cleaned mica sheets and dried in a vacuum at room temperature. The images were obtained by scanning the mica surface in air under ambient conditions (FASTSCANBIO, Bruker) and analyzed using the Nano-Scope Analysis software (version 1.5, Bruker).
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2

Sulfated Cellulose Microfibrils from Seed Shell

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The seed shell was cut into strips with a width of 5 mm. The strips were initially delignified using an aqueous solution of 2 wt% NaClO2 buffered with acetic acid at pH 4.6 for 6 h at 100°C. The treated samples were rinsed in ethanol–water (the volume ratio was 1:1) solutions to remove the remaining chemicals. Finally, the samples were freeze-dried at −56°C for 8 h using a freeze dryer (LGJ-12S). The resulting white powder was then exfoliated into crystalline cellulose microfibril through two steps: slight acid treatment and sonication-assisted exfoliation. To sulfate the cellulose fibers, dried soft as-treated seed shell powder (100 mg) was added into 64 wt% H2SO4 solution (40 mL) at 45°C with vigorous stirring for 1 h. The suspension was then diluted with cold ultrapure water (400 mL) to stop the hydrolysis reaction and allowed to settle overnight. Then the cloudy sediment was collected to purify using centrifugation with a speed of 10,000 rpm for 10 min. The supernatant was decanted, and the resulting thick white slurry was washed three times with water. To characterize the size and morphology of cellulose crystal, the as-treated cellulose dispersion was spin coated on silicon wafer at a speed of 1,000 rpm for 200 s. FASTSCANBIO (Bruker) was used with a resolution of 512 × 512 pixels with tapping mode at 3.0 Hz in the usual manner.
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3

Amperometric Biosensor Characterization

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The imaging of the developed GCE/MWCNTs amperometric transducer surface was carried out by the scanning electron microscope, Vega3 SB from TESCAN Brno, s.r.o. (Brno, Czech Republic). Furthermore, energy dispersive spectroscopy (EDS) was utilized for elemental mapping of the transducer surface. The imaging was carried out by applying a potential of 15 kV at 18.4 mm working distance. Atomic force microscopy (AFM) for the electrode surface characterization of the developed GCE/MWCNTs-RuO2/GOx/Nafion® was carried out at dimension FastScan Bio from Bruker (Billerica, MA, USA) operating with Gwydion 2.52 for data visualization [66 (link)]. An Autolab electrochemical analyser model "PGSTAT-101" running by Nova 2.1 software from Metrohm Autolab (Utrecht, The Netherlands) was used to execute the amperometric experiments in a batch configuration. The conventional three-electrode system was used. A platinum wire as the counter electrode, Ag/AgCl 3 M KCl as the reference electrode and GOx biosensor as the working electrode were served. All the measurements were carried out in one-compartment voltammetric cells (10–20 mL) at conditioned room temperature (23 ± 1 °C). The pH measurements were performed using a pH meter Model Sentix 81 from WTW (Weilheim, Germany) with a combined electrode (glass electrode-Ag/AgCl (3 M KCl) reference electrode) with an accuracy of pH ± 0.05.
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4

Platinum-Carbon Nanostructures via FEBID

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In these experiments, FEBID was performed on a FIB Nova 200 dual beam microscope (FEI, The Netherlands) using a standard FEI gas injection system for delivering MeCpPtMe3. The precursor was heated to 45 °C for at least 2 h and the gas valve was opened at least 3 min prior to the deposition. Nine 5 × 5 µm2 Pt–C pads were deposited at a primary energy of 5 keV and a beam current of 1600 pA in a serpentine patterning sequence. A point pitch of 26 nm and a dwell time of 250 µs were used to ensure a flat-top deposit shape [49 (link)]. Nine different deposition heights, ranging from 14 to 73 nm were achieved by a variation of loops (1–9 loops), resulting in a variation of the total exposure times (TET) per pixel. The deposits were created on a 1 × 1 cm² silicon wafer (3 nm surface oxide) and spaced 5 µm apart from one another. The height and roughness characterization was done with via AFM (FastScan Bio, Bruker AXS, USA) in tapping mode and postprocessed with Gwyddion 2.44 software.
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5

Nanoparticle Substrate Characterization

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The nanoparticles were fixed on the silica substrate using our previously reported method52 . Then, the substrate was immersed in buffer at pH 7.4 and scanned via AFM (FastScan Bio, Bruker, Germany) using a silicon probe (Bruker, Germany) at a rate of 1 Hz (256 samples per line) at 37 °C. Then, the probe was lifted, and the medium was discarded and replaced with buffer at pH 6.8 without moving the substrate. After incubation for 10 min, the substrate was scanned repeatedly by AFM under the same conditions. For the detection of ligand corona around nanoparticles, more than 10 nanoparticles were carefully examined for each group. Height-map images were handled for 3D reconstruction, and the height profiles were processed by NanoScope Analysis software (Bruker, Germany).
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6

Surface Analysis of Samples via AFM

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The surface structure of the samples was investigated
using a Bruker FastScan Bio atomic force microscope (AFM) in scan
assist mode. Samples were deposited onto magnetic holders covered
by carbon tape and air-dried overnight prior to investigation.
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7

Si Wafer Microfabrication Protocol

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A 3-inch single side polishing Si wafer with a thickness of 1000 μm (RuiCai, Suzhou, China), negative photo-resist SU-8 2150 (Kayaku, MA, USA), Propylene Glycol Methyl Ether Acetate (PGMEA, RuiCai, Suzhou, China), acetone (AR, ≥99.5%, SINOPHARM, Beijing, China), and ethanol (AR, ≥95%, SINOPHARM, Beijing, China) purchased from sinopharm are used in the following experiments, positive photoresist AZ4330 (AZ® P4000 Series, Merck, Kumamoto-shi, Japan).
Magnetron sputtering equipment (MSP-400, Jinsheng, Beijing, China) and surface preparation equipment (RIE-500, Jinsheng, Beijing, China) are used in the fabricating samples.
A microscope (Imager.A2m Zeiss, Oberkochen, German), step instrument (dektak XT, Bruker Brooke dektak, Billerica, MA, USA), scanning electron microscope (ULTRA55, Zeiss, Oberkochen, German), bonding tester (PTR-1101, RHESCA, Tokyo, Japan), and AFM (Dimension Icon & FastScan Bio, Bruker, Billerica, MA, USA) are applied for characterizing the samples.
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8

Comprehensive Characterization of Nanomaterials

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Dynamic light scattering (DLS) and ζ-potential determinations were performed on a ZetaSizer Nano ZS (Malvern Instruments). The morphology and size of the simples were investigated by transmission electron microscopy (TEM) on a JEM-1011 microscope (JEOL, Japan) and atomic force microscope (AFM) images were collected by FASTSCANBIO (Bruker) in a tapping mode. UV-vis absorption spectra were measured in UV-vis spectrometer (UV-2900, Shimadzu, Japan) equipped with a 1-mm quartz cell. Confocal images were collected on confocal laser scanning microscope (CLSM, Leica TCS SP) using a 60× oil-immersion objective.
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9

AFM Imaging of DNA Nanostructures

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After being diluted to 1 nM (scaffold concentration) in 1 × TE/Mg2+ buffer, 40 μL of each sample was deposited onto freshly cleaved mica (SPI Supplies, catalog # 01873-CA). The solution was removed after 30 s, the mica surface was washed three times with 40 μL TE buffer containing 10 mM MgCl2 and 100 mM NaCl, and 80 μL of 1 × TE/Mg2+ buffer was then added before imaging. Imaging was done in fluid using FastScan-D probes (Bruker) and tapping mode on a FastScan Bio (Bruker), typically at a scan rate of 5 Hz with 1024 lines per image. The amplitude setpoint was usually between 30 and 50 mV, with drive amplitude at 180 to 240 mV and drive frequency at 110 Hz. The integral and proportional gains were set to 1 and 2, respectively. Samples that were not imaged immediately after the fluorescence kinetics experiments were kept at −20 °C and thawed before AFM imaging.
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10

AFM and Optical Imaging of Nanomaterials

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AFM measurements were performed in Tapping Mode by using a FastScan Bio (Bruker, Europe) and a FastScan A (Bruker, Europe) probe with tip radius approximately equal to 5 nm. AFM images were acquired on different micrometric scales, up to 5 × 5 μ m2 of area. The analysis was performed by Gwyddion v. 2.52. Optical images were acquired by using the optical microscope included in Bruker SENTERRA spectrometer: Olympus BX51 reflected light microscope (Bruker, Europe) provided with video camera Infinity 1 and objective lens with 0.75 numerical aperture and 50× magnification. Postprocessing of acquired images consisted of color curves modification. Raw images are reported in Supporting Information file (see Figures S2 and S3).
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