Cells were fixed in 2.5% glutaraldehyde at pH 7.2 for 24 h, and later in 1% OsO4 in a 0.1 M cacodylate buffer for 1 h. Then, the samples were spun to obtain pellets. The pellets were fixed in 1% uranyl acetate for 30 min, then dehydrated in a series of graded ethanol steps, and finally embedded in epoxy resin. Thin sections were performed and stained with toluidine blue. Ultrathin sections were obtained from representative areas and were double stained with lead citrate and uranyl acetate and viewed under a JEOL JEM-1011 microscope (JEOL USA Inc, Peabody, MA, USA).
Jem 1011 microscope
Manufactured by JEOL
Sourced in Japan, United States
The JEM-1011 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed for high-resolution imaging of samples at the nanoscale level. The JEM-1011 utilizes an electron beam to illuminate and magnify specimens, allowing users to observe fine details and structures not visible with optical microscopes. The core function of the JEM-1011 is to provide a reliable and efficient tool for researchers and scientists to conduct advanced microscopic analysis in various fields of study.
Automatically generated - may contain errors
Lab products found in correlation
Quemesa camera 11 mpx, by Olympus (6 mentions)
Jem 2200fs microscope, by JEOL (5 mentions)
Uranyl acetate, by Ted Pella (5 mentions)
Quantax 400 system, by Bruker (4 mentions)
Glow discharged carbon coated copper grid, by Electron Microscopy Sciences (4 mentions)
Es1000w erlangshen ccd camera, by Ametek (3 mentions)
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Jem 1011, by JEOL (2 mentions)
Quemesa ccd camera, by Olympus (2 mentions)
Cary 300 uv vis spectrophotometer, by Agilent Technologies (2 mentions)
Nano zs90, by Malvern Panalytical (2 mentions)
Jem 2200f, by JEOL (2 mentions)
Ccd 11 mp camera, by Olympus (2 mentions)
Malvern zetasizer, by Malvern Panalytical (1 mentions)
Tristar 2 3020, by Micromeritics (1 mentions)
S 4800, by JEOL (1 mentions)
Jsm 6610lv, by JEOL (1 mentions)
D max 2500 pc, by Rigaku (1 mentions)
Invia raman spectrometer, by Renishaw (1 mentions)
Jem 2100, by JEOL (1 mentions)
106 protocols using jem 1011 microscope
1
Electron Microscopy Sample Preparation
2
TEM Analysis of M. leprae Infection
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For TEM analysis, ISE6 cells were seeded on plastic cover slips (Thermanox®; TMX Coverslips) placed into a 24-well plate at a density of 5 × 105 cells/well. After 24 h, ISE6 cells were infected with freshly isolated M. leprae suspension (5 × 107M. leprae/well). Media was removed at 21, 35, and 49 dpi and cover slips were washed with PBS. Fixative solution (3% Glutaraldehyde in 0.1 M CAC buffer, pH 7.4) was added to each well for 30 min at room temperature. Cover slips were then washed three times with 0.1 M CAC buffer with sucrose, pH 7.4 and post fixed with 1% Osmium tetroxide in 0.1 M CAC buffer at room temperature for 1 h. Araldite-Epon 812 (EP) was prepared with 60 g of Aradite (60 g of Polybed 812, 123 g DDSA). Samples were dehydrated with graded series of EtOH (30, 50, 70, 80, 90, and 100%) and embedded gradually with different ratios of EP to EtOH (1:3, 2:2, 3:1, EP only and EP + DMP-30). Sections were then stained with 4% uranyl acetate for 2 min and lead citrate for 1 min. Coverslips and all chemicals were purchased from Electron Microscopy Sciences (Hatfield, PA, United States). Images were captured using TEM: JEOL JEM-1011 microscope (JEOL, Inc., MA).
3
Transmission Electron Microscopy of NLC
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Elosulfase alfa NLC formulation samples were observed using the JEOL JEM 1011 transmission tlectron ticroscope (TEM; JEOL Inc., Peabody, MA, USA). Two different contrast methods were used to visualize the ultrastructure of the NLC. In the first method, the samples were stained with phosphotungstic acid (2% p/v) and placed in carbon-coated copper grids. In the second method, the NLC as fixed with glutaraldehyde (2.5%) in 0.2 M phosphate buffer overnight. Then, the samples were post-fixed with 1% osmium tetroxide in 0.05 M cacodylate buffer for 1 h and finally embedded in Spurr’s epoxy resin (21). Sections were cut 0.5 microns thick and stained with methylene blue. To observe the inner structure of the NLC, ultrathin sections of 80 Å from the samples of interest were cut and placed to make a 200 hole copper grid, which was stained using the double-contrast method of the ultrathin sections with uranyl acetate and lead citrate. Observations were carried out using a JEOL JEM-1011 microscope (JEOL Ltd., Tokyo, Japan) [34 (link)].
4
Preparation of CTX-MEL Nanocomplexes
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For the preparation of the ion-pairing nanocomplexes, CTX and MEL were formulated with a 1:2 ratio. This ratio between the two components was selected based on our preliminary laboratory investigation as well as on a recently published work [22 (link)]. CTX and MEL were dissolved separately in deionized water. Equal volumes of CTX (1 mM) and MEL (0.5 mM) were mixed and vortexed for 60 sec. Particle size and zeta potential were determined by using a Malvern Zetasizer (Malvern Instruments Ltd. Malvern, UK). The prepared CTX–MEL nanocomplexes were investigated through transmission electron microscopy (TEM) by using the JEOL-JEM-1011 microscope (JEOL-Tokyo, Japan).
5
Characterization of Porous Carbons
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The morphology of the obtained porous carbons was characterized by scanning electron microscopy (SEM, JEOL JSM-6610LV and JEOL S-4800) operated at an acceleration voltage of 10 kV. Transmission electron microscopy (TEM) images were obtained using a JEOL JEM-1011 microscope operating at 200 kV. High-resolution TEM (HRTEM) was performed using a JEM-2100 F microscope operating at an accelerating voltage of 200 kV. The crystallographic information of porous carbons was investigated by powder X-ray diffraction (XRD, Rigaku D/Max 2500PC). Raman spectra were collected on a Renishaw inVia Raman spectrometer. X-ray photoelectron spectroscopy (XPS) was performed on a 1063 photoelectron spectrometer (Thermo Fisher Scientific, England) with Al-Kα X-ray radiation as the X-ray source for excitation. The textural properties were characterized by N2 sorption measurements at 77.3 K (Micromeritics TriStar II 3020). The specific surface area was obtained by Brunauer-Emmett-Teller (BET) method. The pore size distribution (PSD) was calculated by the nonlocal density functional theory (NLDFT) method. The total pore volume (Vtotal) was estimated from the adsorbed amount at a relative pressure p/p° of 0.99. Micropore volume (Vmic) was calculated using the t-plot method.
6
Characterizing Particle Suspension using TEM
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TEM images were acquired with a
JEOL JEM 1011 microscope (JEOL)
at an accelerating voltage of 100 kV. The particle suspension (2 μL)
was placed on a carbon-coated copper grid (Smethurst High-Light Ltd.)
and dried at room temperature.
JEOL JEM 1011 microscope (JEOL)
at an accelerating voltage of 100 kV. The particle suspension (2 μL)
was placed on a carbon-coated copper grid (Smethurst High-Light Ltd.)
and dried at room temperature.
7
Synthesis and Characterization of Colloidal Gold Nanoparticles
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Colloidal gold nanoparticles were prepared according to the citrate / tannic acid reduction method adapted from [18] (link) and described previously [19] .
Transmission Electron Microscopy images of the gold colloids were obtained using a JEOL JEM 1011 microscope operating at an accelerating voltage of 100 kV. Cryo-Transmission Electron Microscopy images were recorded at low temperature (93 K) on ultrascan 2 K CCD camera (Gatan, USA), using a LaB6 JEOL JEM 2100 (JEOL, Japan) cryo microscope operating at 200 kV with a low dose system (Minimum Dose System, MDS). Statistical distribution was established by counting a minimum of 363 particles for TEM and of 15 particles for cryoTEM images. Dynamic Light Scattering (DLS) and zeta potential (ELS) measurements were performed using Litesizer™ 500 apparatus (Anton Paar) equipped with a 658 nm laser operating at 40 mW. The backscattered light collection angle was set at 90°. The zetapotential cuvette has a Ω-shaped capillary tube. The same solutions were used for DLS and ELS measurements. Each sample was analyzed in triplicate and each measurement was an average of three 30 s runs.
Transmission Electron Microscopy images of the gold colloids were obtained using a JEOL JEM 1011 microscope operating at an accelerating voltage of 100 kV. Cryo-Transmission Electron Microscopy images were recorded at low temperature (93 K) on ultrascan 2 K CCD camera (Gatan, USA), using a LaB6 JEOL JEM 2100 (JEOL, Japan) cryo microscope operating at 200 kV with a low dose system (Minimum Dose System, MDS). Statistical distribution was established by counting a minimum of 363 particles for TEM and of 15 particles for cryoTEM images. Dynamic Light Scattering (DLS) and zeta potential (ELS) measurements were performed using Litesizer™ 500 apparatus (Anton Paar) equipped with a 658 nm laser operating at 40 mW. The backscattered light collection angle was set at 90°. The zetapotential cuvette has a Ω-shaped capillary tube. The same solutions were used for DLS and ELS measurements. Each sample was analyzed in triplicate and each measurement was an average of three 30 s runs.
8
Structural and Compositional Analysis of Nanocrystals
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Bright-field
(BF)TEM images and selected area electron diffraction (SAED) patterns
were acquired on samples prepared by drop-casting a concentrated solution
of NCs on carbon-coated 200 mesh copper grids using a JEOL JEM-1011
microscope (W filament) operated at 100 kV accelerating voltage. High-resolution
(HR)TEM, high-angle annular dark-field (HAADF), and energy dispersive
X-ray spectroscopy (EDS) analyses were performed on a JEOL JEM-2200FS
microscope equipped with a Schottky emitter at 200 kV, a CEOS image
corrector allowing for an information limit of 0.8 Å, and an
in-column energy filter (Ω-type). The chemical compositions
of the NCs were determined by EDS using a JEOL JED-2300 Si(Li) detector.
The NC suspensions were deposited onto ultrathin carbon coated Au
grids, and the measurements were carried out using a holder with a
beryllium cup for background reduction in the spectra.
(BF)TEM images and selected area electron diffraction (SAED) patterns
were acquired on samples prepared by drop-casting a concentrated solution
of NCs on carbon-coated 200 mesh copper grids using a JEOL JEM-1011
microscope (W filament) operated at 100 kV accelerating voltage. High-resolution
(HR)TEM, high-angle annular dark-field (HAADF), and energy dispersive
X-ray spectroscopy (EDS) analyses were performed on a JEOL JEM-2200FS
microscope equipped with a Schottky emitter at 200 kV, a CEOS image
corrector allowing for an information limit of 0.8 Å, and an
in-column energy filter (Ω-type). The chemical compositions
of the NCs were determined by EDS using a JEOL JED-2300 Si(Li) detector.
The NC suspensions were deposited onto ultrathin carbon coated Au
grids, and the measurements were carried out using a holder with a
beryllium cup for background reduction in the spectra.
9
Nanoparticle Characterization via TEM
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NC dispersions
were drop-cast on carbon-coated 200 mesh copper grids. We acquired
bright field TEM images on a JEOL JEM-1011 microscope (W filament)
operating at an accelerating voltage of 100 kV.
were drop-cast on carbon-coated 200 mesh copper grids. We acquired
bright field TEM images on a JEOL JEM-1011 microscope (W filament)
operating at an accelerating voltage of 100 kV.
10
Comprehensive Characterization of Nanomaterials
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Dynamic light scattering (DLS) and ζ-potential determinations were performed on a ZetaSizer Nano ZS (Malvern Instruments). The morphology and size of the simples were investigated by transmission electron microscopy (TEM) on a JEM-1011 microscope (JEOL, Japan) and atomic force microscope (AFM) images were collected by FASTSCANBIO (Bruker) in a tapping mode. UV-vis absorption spectra were measured in UV-vis spectrometer (UV-2900, Shimadzu, Japan) equipped with a 1-mm quartz cell. Confocal images were collected on confocal laser scanning microscope (CLSM, Leica TCS SP) using a 60× oil-immersion objective.
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