Jsm 6710f
The JSM-6710F is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of various samples. It features a cold field emission gun (CFE) that provides a stable and high-brightness electron beam for fine-scale observation and characterization of materials.
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13 protocols using jsm 6710f
Characterization of Ti-Nb-Zr Thin Films
Characterization and Photocatalytic Evaluation of Nanocomposites
Surface Topography and Composition Analysis
Catalyst Characterization and Electrochemical Analysis
Comprehensive Structural Characterization
Characterization of Resistive Water Level Sensor
water level sensor, X-ray
photoelectron spectroscopy (XPS, Thermo UK, K-alpha) was performed
to analyze the elemental composition of the AgNWs/PEDOT:PSS-g-PEGME hybrid film before and after IR laser irradiation.
The transmittance and surface morphology were measured using an ultraviolet–visible–near-infrared
(UV–vis–NIR) spectrophotometer (Agilent, Cary 5000)
and SEM (JEOL JSM-6710F), respectively. The thickness of the AgNWs/PEDOT:PSS-g-PEGME hybrid film was measured using atomic force microscopy.
Electrical characterization of the resistive water level sensor was
performed using a Keithley 4200-Semiconductor Characterization System.
Comprehensive Characterization of CuO Nanoparticles
Cryo-SEM Hydrogel Microstructure Analysis
electron microscopy was used to characterize the microstructure. Hydrogels
were cut at room temperature in 6 mm width and 2.5 mm high strips
and then sandwiched between two copper plates in the sample holder.
Cryogenic glue was applied at the bottom of the sample holder to fix
the sample. The sample holder was then immersed for a couple of minutes
in liquid nitrogen under vacuum (flash-freezing) and then was quickly
placed inside the preparation chamber of the microscope (under vacuum,
at −150 °C). The upper part of the sample which exceeds
the sample holder’s height was removed by cutting horizontally
with a surgical blade to minimize observation artifacts. Indeed, sample
exceeding the height of the sample holder will undergo slightly lower
freezing speed due to the absence of full contact with a conductive
surface that could induce the formation of ice crystals, thus disrupting
the original structure. The surface of the sample was then etched
for 10 min at −95 °C before being coated by a 10 nm layer
of gold. Observations were performed on a JEOL JSM-6710F high resolution
scanning electron microscope equipped with a Gatan ALTO2500 cryo-unit
at an acceleration voltage of 3 kV.
Optimized Green Synthesis of ZnO-CuO Nanocomposites
Characterization of Sol-Gel-Coated AAO Membranes
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