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13 protocols using jsm 6710f

1

Characterization of Ti-Nb-Zr Thin Films

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The compositions of the Ti-Nb-Zr thin films were analyzed by energy dispersive spectroscopy (EDS, Jeol, JSM-6710F, Tokyo, Japan) at an accelerating voltage of 15 kV. The cross sections and surface features of the electrodes were characterized using field emission scanning electron microscopy (FE-SEM, Jeol, JSM-6710F) at 5 kV and 15 kV. The phase structures of the thin films were confirmed by X-ray diffractometry (XRD, Rigaku, Miniflex, Tokyo, Japan). XRD measurements were performed using Cu Kα radiation (λ = 1.5406 Å). Scans were performed over a 2θ range of 30–85° at a speed of 0.03°/s. Phase identification was made by comparing the obtained diffraction patterns with the JCPDS (Joint Committee on Powder Diffraction Standards) references. The mechanical properties of the Ti-Nb-Zr thin film specimens were investigated by nanoindentation tests (Fischerscope, HM2000, Windsor, CA, USA) at room temperature, using a Berkovich diamond indenter to a penetration depth of 325 nm.
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2

Characterization and Photocatalytic Evaluation of Nanocomposites

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Synthesized nanocomposites were characterized using both a transmission electron microscope (TEM, JEOL JSM-6710F, Pleasanton, CA, USA) and X-ray diffraction (XRD) with CuKα radiation (λ = 1.54 Å). Characteristic plasmon resonance of Ag, AgNW/TiO2, and AgNW/TiO2/GO nanocomposite samples was studied by a Univkon-XL UV–VIS-NIR scanning spectrophotometer (OR, USA) within 200–1100 nm. Fourier transformed infrared (FTIR) analysis was carried out using a Perkin–Elmer Spectrum (Princeton, NJ, USA) 100 series for 200 scans at a resolution of 4 cm−1. The photocatalytic characteristics of synthesized nanocomposite samples were evaluated in Rhodamine B (RhB)-containing wastewater. RhB is a well-known contaminant in the textile, plastic, and dye industries. Releasing RhB-containing wastewater into nature is associated with severe long-term adverse effects on the environment.
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3

Surface Topography and Composition Analysis

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Scanning electron microscopy (SEM) was carried out to obtain information about surface topography and composition of the sample using a scanning electron microscope (SEM) (JSM-6710F) supplied by JEOL Company Limited, Japan. The FA/EHMA/HN WPNCs were extracted with the dimensions of 5 mm x 5 mm x 5 mm. The specimens were fixed with Karnovsky’s fixative, which was followed by a graded alcohol dehydration series. After the alcohol dehydration process, the specimen was coated with a thin layer of gold and then undergo microscopic viewing. The micrographs were taken at a magnification of 500.
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4

Catalyst Characterization and Electrochemical Analysis

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The chemical compositions of the catalysts were characterized using SAED (SAED, TEM mode, JEOL 3010, 300 kV, 112 μA) and Raman spectroscopy (Modular System, Horiba Jobin Yvon). A He–Ne laser was used as the excitation source and the acquisition time was 10 seconds for each spectrum. A dry objective (Olympus MPlan N, 50×, numerical aperture = 0.75) and a water immersion objective (Olympus LUMFL, 60×, numerical aperture = 1.10) were, respectively, employed for ex situ and operando Raman spectroscopy. The morphologies of the catalysts were characterized by SEM (JEOL JSM-6710F, 5 kV). Their electrochemical-active surface areas were determined by their double layer capacitances in N2-saturated 0.1 M KClO4 (99.9%, Sigma Aldrich). A three-electrode setup was used with a Pt wire counter and a Ag/AgCl reference electrode (Saturated KCl, Pine). Cyclic voltammetry were performed in a non-faradaic region from −0.05 V to 0.05 V vs. RHE. The scan rates were 50, 100, 150, 200, 250, 300, 350, and 400 mV s−1.
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5

Comprehensive Structural Characterization

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Crystal structural characteristics were evaluated on a powder X-ray diffraction system (XRD, TD-3000, Tongda Co. Ltd., Dandong, Cu Kα, λ = 1.5418 Å). Morphologies of the selected products were observed using a field-emission scanning electron microscope (SEM, JEOL JSM-6710F, 10 kV). Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) (TEM, FEI Tecnai G2 S-Twin, 200 kV) were performed for analyzing the structures for the products. X-ray photoelectron spectroscopy (XPS, VG ESCALAB MKII, Al Kα) was used to analyze surface elemental properties of the as-prepared products.
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6

Characterization of Resistive Water Level Sensor

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To characterize and measure the resistive
water level sensor, X-ray
photoelectron spectroscopy (XPS, Thermo UK, K-alpha) was performed
to analyze the elemental composition of the AgNWs/PEDOT:PSS-g-PEGME hybrid film before and after IR laser irradiation.
The transmittance and surface morphology were measured using an ultraviolet–visible–near-infrared
(UV–vis–NIR) spectrophotometer (Agilent, Cary 5000)
and SEM (JEOL JSM-6710F), respectively. The thickness of the AgNWs/PEDOT:PSS-g-PEGME hybrid film was measured using atomic force microscopy.
Electrical characterization of the resistive water level sensor was
performed using a Keithley 4200-Semiconductor Characterization System.
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7

Comprehensive Characterization of CuO Nanoparticles

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Structural and morphological characterization of as-synthesized CuO NPs were analyzed by various analytical techniques. The absorption spectra were recorded by an UV−visible Spectrophotometer (Thermo Scientific GENESYS 10S). The recombination of electron-hole pairs of the synthesized samples was investigated using photoluminance spectroscopy (Perkin Elmer LS 55 Fluorescence Spectrometer, Waltham, MA, USA) with excitation wavelength at 350 nm in the range 350–600 nm. FTIR studies were carried out at room temperature in the range of 400−4000 cm−1 with resolution of 4 cm−1 by using KBr pellets in a Perkin Elmer RX1 spectrophotometer. The X-ray powder diffraction patterns were taken in reflection mode with Cu Kα (λ = 1.5406 Å) radiation in the 2θ range from 10° to 80° by using a Shimadzu XRD 6000 (Kyoto, Japan) X-ray diffractometer by continuous scanning which was operated at 40 kV/30 mA and 0.02 min−1. The X-ray photoelectron spectra was obtained using Perkin Elmer PHI5600 (ULVAC-PHI, Inc, Waltham, MA, USA). A FESEM [JEOL JSM-6710F, Kyoto, Japan combined with energy dispersive X-ray analyzer (X-max, 150 Oxford Instruments)] and HRTEM (JEOL JEM-3010) were used for morphological, microstructural and elemental compositional analysis of synthesized CuO NPs.
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8

Cryo-SEM Hydrogel Microstructure Analysis

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Cryo-scanning
electron microscopy was used to characterize the microstructure. Hydrogels
were cut at room temperature in 6 mm width and 2.5 mm high strips
and then sandwiched between two copper plates in the sample holder.
Cryogenic glue was applied at the bottom of the sample holder to fix
the sample. The sample holder was then immersed for a couple of minutes
in liquid nitrogen under vacuum (flash-freezing) and then was quickly
placed inside the preparation chamber of the microscope (under vacuum,
at −150 °C). The upper part of the sample which exceeds
the sample holder’s height was removed by cutting horizontally
with a surgical blade to minimize observation artifacts. Indeed, sample
exceeding the height of the sample holder will undergo slightly lower
freezing speed due to the absence of full contact with a conductive
surface that could induce the formation of ice crystals, thus disrupting
the original structure. The surface of the sample was then etched
for 10 min at −95 °C before being coated by a 10 nm layer
of gold. Observations were performed on a JEOL JSM-6710F high resolution
scanning electron microscope equipped with a Gatan ALTO2500 cryo-unit
at an acceleration voltage of 3 kV.
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9

Optimized Green Synthesis of ZnO-CuO Nanocomposites

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The selection of optimized parameters in green synthesizing ZnO-CuO NCs was based on their structural, morphological and optical properties. The absorption spectra were recorded by a UV-Visible (UV-Vis) spectrophotometer (Thermo Scientific GENESYS 10S, Waltham, MA, USA). The recombination of electron-hole pairs (e/h+) of the synthesized samples was investigated using photo luminance (PL) spectroscopy (Perkin Elmer LS 55 Fluorescence Spectrometer, Waltham, MA, USA) with an excitation wavelength of 350 nm in the range of 350 to 600 nm. The Fourier Transform Infrared (FTIR) spectroscopy study was carried out at room temperature in the range of 4000 to 400 cm−1 with a resolution of 4 cm−1 by using KBr pellets in a Perkin Elmer RX1 spectrophotometer. X-ray powder diffraction (XRD) patterns were taken in the reflection mode with Cu Kα (λ = 1.5406 Å) radiation in the 2θ range of 10° to 80° by using a Shimadzu XRD 6000 X-ray diffractometer with continuous scanning which was operated at 40 kV/30 mA and 0.02 min−1. The morphological, microstructural and elemental compositional of all synthesized samples was determined using a Field Emission Scanning Electron Microscope (FE-SEM) (JEOL JSM-6710F, Tokyo, Japan) with Energy Dispersive X-ray (EDX) analyzer (X-max, 150 Oxford Instruments, Abingdon-on-Thames, UK).
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10

Characterization of Sol-Gel-Coated AAO Membranes

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The morphology of the prepared sol-gel-coated AAO membrane was investigated by SEM (JSM-6710F, JEOL, Tokyo, Japan). After post-gelation, the samples were dried overnight in a vacuum chamber to eliminate water from the sol-gel matrix and thereafter transferred to the carbon tape on the SEM specimen stub. Subsequently, the prepared samples were coated with platinum to reduce the charging effects during SEM analysis. The structure of sol-gel nanocolumn defined by the AAO membrane was also observed by TEM (H-7650, Hitachi, Japan) after dissolving the AAO template using a 1 M NaOH solution for 3 h at 30 °C. The white precipitate upon completing the AAO dissolution reaction in the sample tube was collected by mild centrifugation with a washing step using filtered distilled water. Finally, the acquired sol-gel nanocolumn was dispersed by mild pipetting and drop-casted onto a carbon 200 mesh copper grid (Ted Pella, Redding, CA, USA). The prepared samples were dried overnight in a vacuum desiccator and observed by TEM under optimized conditions.
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