The morphologies of each adsorbent were measured by scanning electron microscopy SU1510 (SEM, Hitachi High-Technologies Co., Tokyo, Japan). The specific surface area and pore volumes were analyzed using a specific surface analyzer NOVA4200e (Quantachrome Instruments Japan G.K., Kanagawa, Japan). The surface functional groups were analyzed by the Fourier-transform infrared (FT-IR) spectroscopy system 460Plus (JASCO Co., Tokyo, Japan). The binding energy and elemental distribution of the adsorbent surface were measured by the X-ray photoelectron spectroscopy system AXIS-NOVA (Shimadzu Co., Ltd., Kyoto, Japan) and electron microanalyzer JXA-8530F (JEOL, Tokyo, Japan), respectively.
Su1510 sem
The SU1510 SEM is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed for high-resolution imaging of a wide range of samples. The SU1510 SEM utilizes a field emission electron source to generate a focused electron beam that scans the surface of the sample, allowing for detailed observation and analysis of the sample's topography and composition.
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12 protocols using su1510 sem
Adsorbent Preparation and Characterization
The morphologies of each adsorbent were measured by scanning electron microscopy SU1510 (SEM, Hitachi High-Technologies Co., Tokyo, Japan). The specific surface area and pore volumes were analyzed using a specific surface analyzer NOVA4200e (Quantachrome Instruments Japan G.K., Kanagawa, Japan). The surface functional groups were analyzed by the Fourier-transform infrared (FT-IR) spectroscopy system 460Plus (JASCO Co., Tokyo, Japan). The binding energy and elemental distribution of the adsorbent surface were measured by the X-ray photoelectron spectroscopy system AXIS-NOVA (Shimadzu Co., Ltd., Kyoto, Japan) and electron microanalyzer JXA-8530F (JEOL, Tokyo, Japan), respectively.
Morphological Characterization of Ginseng Powders
Characterization of Nano-materials via Advanced Microscopy
Comprehensive Characterization of BVONB/RGO Nanocomposite
Lyophilized Hydrogel Morphology Characterization
Characterization of Freeze-Dried Gelatin
Characterization of Complex Coacervate Nanostructures
XRD analyses of the samples were performed using a smart X-ray diffractometer (SmartLab 3KW, Rigaku Corporation, Tokyo, Japan), according to Dong et al. [20 (link)], with slight modifications. The prepared powder was flattened on a glass plate for X-ray diffraction analysis, and the scanning range was 2θ from 5o to 50°, with a step size of 5 °/min/scan rate.
Scanning electron microscopy (SEM) of the samples was conducted using a SU1510 SEM (Hitachi, Tokyo, Japan). The freeze-dried powder was adhered to a double-sided adhesive tape, coated with gold, and observed using a scanning electron microscope at a magnification of 500×.
An FEI Tecnai 12 (FEI Company, Hillsboro, NH, USA) was used for transmission electron microscopy (TEM). A drop of the complex coacervate solution was placed on a 400-mesh copper grid. The grids were then dried overnight at 40 °C, and the morphology of the samples was observed using an electron microscope with a single-tilt sample rack at an accelerating voltage of 100 kV.
Dried Sample SEM Observation
Preparation of Bacterial Samples for SEM
Comprehensive Material Characterization
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