Themis g2 300

The Sb₂O₃ flakes were characterized by OM (Olympus BX51), AFM (Bruker Dimension icon), Raman spectroscopy (WITec Alpha300 Raman and Horiba LabRAM HR800, excitation wavelength of 532 nm), and TEM (FEI Tecnai G2 F30, acceleration voltage of 300 kV). High temperature Raman spectra were collected by ×50 objective lens. Linkam THMS600 and TS1000EV heating stages were used to control the temperature of the sample. The laser power at the top of the stage window is 20−25 mW, correspondingly, the power on the surface of the sample is much smaller. STEM-HAADF images were recorded using Cs-corrected Titan Cubed Themis G2 300 and JEOL JEM-ARM 200 F with acceleration voltage of 200 kV.

The phase analysis of catalysts was performed by D8 Advance X-ray diffractometer using Cu-Kα radiation (λ = 1.5418 Å). JEOL-7100F scanning electron microscope (SEM) and double spherical aberration corrected transmission electron microscope (Titan Cubed Themis G2 300/Titan Cubed Themis G2 30) were adapted to perform the morphology, elemental distribution and three-dimensional visualization of tomographic reconstruction of catalysts. XPS measurements were performed on AXIS SUPRA, Kratos. Mass spectra was collected by GC-MS (Agilent 7890b/5977b).