Nanoscope 4 picoforce multimode afm
The Nanoscope IV PicoForce Multimode AFM is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides accurate measurements of surface topography and material properties with a wide range of imaging modes and accessories.
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3 protocols using nanoscope 4 picoforce multimode afm
Nanosheet Morphology Characterization by AFM
Nanoscale Analysis of Graphene Oxide Morphology
Nanoscale Imaging of Allosteric Regulation
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