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Nanoscope 4 picoforce multimode afm

Manufactured by Bruker
Sourced in United States

The Nanoscope IV PicoForce Multimode AFM is an atomic force microscope (AFM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides accurate measurements of surface topography and material properties with a wide range of imaging modes and accessories.

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3 protocols using nanoscope 4 picoforce multimode afm

1

Nanosheet Morphology Characterization by AFM

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The morphology and height of the GO and BP nanosheets were determined by AFM analysis using a Nanoscope IV PicoForce Multimode AFM (Bruker, Santa Barbara, CA) in an ambient environment.60 (link)
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2

Nanoscale Analysis of Graphene Oxide Morphology

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The morphology and layer height were analyzed by nanoscale AFM measurements. The graphene oxide sample (~1 μg mL−1) was deposited on a freshly cleaved mica surface, incubated for a couple of minutes, and then gently dried under a nitrogen stream. AFM images were obtained in tapping mode using a Nanoscope IV PicoForce Multimode AFM (Bruker, Santa Barbara, CA) equipped with an E-scanner and a rectangular-shaped silicon cantilever with a 42 N/m spring constant and a resonant frequency of ~300 kHz in an ambient environment.53 (link), 54 (link)
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3

Nanoscale Imaging of Allosteric Regulation

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Nanoscale AFM imaging was employed to investigate the dynamic forms polymers due to allosteric regulation of hACC2 by citrate. The Δ148aa-hACC2 was incubated with or without 15 mM citrate for 20 min at 37 °C. The resultant mixtures were placed on the freshly cleaved mica surface and incubated for several hours in a moisture chamber. After washing with water and drying under nitrogen, the samples were subjected to tapping mode AFM imaging on the Nanoscope IV PicoForce Multimode AFM, equipped with an E-scanner and a rectangular-shaped silicon cantilever (Bruker, Madison, WI, USA) with a 42-N/m spring constant and a resonant frequency of ~300 kHz at ambient environment (Park et al. 2008b (link); Park and Terzic 2010 (link)). Images (512 × 512 pixels/image) were collected from each sample with maximum image size of 5 × 5 μm and analyzed using the Nanoscope Version 6.13 software (Bruker).
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