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9 protocols using xl30 sirion sem

1

Comprehensive Characterization of Lithium Plating/Stripping

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AFM was performed using Park XE-70 system with ACTA tips. SEM images of LiF, h-BN, and LiF/h-BN on various substrates were captured in an FEI XL30 Sirion SEM. A Woollam M-2000 Spectroscopic Ellipsometer was used for measuring and fitting optical properties and thicknesses of ALD LiF films on Si substrates. TEM characterization was performed at 80 kV using an FEI Titan. After Li plating/stripping cycling, samples were rinsed in 1,3-dioxolane to remove residual electrolyte and salt for SEM imaging. The morphology of plated Li was observed with an FIB (Nova 600i Dual Beam, FEI). The cycled electrodes were cross-sectioned with a Ga+ ion beam and observed with the SEM (JSM-6700F, JEOL). XPS was performed on PHI 5000 VersaProbe using an Al Kα (λ = 0.83 nm and hυ = 1486.7 eV) x-ray source operated at 2 kV and 20 mA.
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2

Comprehensive Material Characterization

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The SEM images were taken by a FEI XL30 Sirion SEM (5 kV). The LabRAM HR Evolution microscope (HORIBA Scientific) was used for Raman spectroscopy with 532 or 633 nm excitation and a 1,800 grooves mm−1 grating. High resolution transmission electron microscope (HRTEM) images were taken on a FEI Titan 80-300 environmental (scanning) electron microscope (E(S)TEM). Laser-induced graphene was scraped off and sonicated in ethanol before being transferred onto a copper TEM grid. The EDS/EELS elemental mappings were acquired using a Gatan Quefina dual-EELS spectrometer with an energy dispersion of 0.1 eV per channel. To minimize possible electron beam irradiation effects, all the EELS and EDS spectra demonstrated in this project were acquired from areas without pre-beam irradiation. XPS was performed on a PHI Versa Probe Scanning X-ray Photoelectron Spectroscopy Microprobe.
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3

Comprehensive Microscopy Characterization

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SEM images were captured in a FEI XL30 Sirion SEM. TEM characterization was performed at 300 kV using a FEI Titan TEM. The morphology of plated Li was observed with a FIB (Nova 600i Dual Beam, FEI). The cycled electrodes were cross-sectioned with a Ga+ ion beam and observed with the SEM (JSM-6700F, JEOL). X-ray photoelectron spectroscopy (XPS) was performed on PHI 5000 VersaProbe, using an Al Kα (λ = 0.83 nm, hυ = 1486.7 eV) x-ray source operated at 2 kV and 20 mA.
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4

Microscopic Characterization of Catalyst Samples

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The SEM images were taken using an FEI XL30 Sirion SEM with an acceleration voltage of 5 kV. The HR-TEM images and EDS mapping were taken by a FEI Titan 80-300 environmental (scanning) TEM operated at 300 keV. The HAADF-STEM images were taken on a TEAM 0.5 Microscopy operated at 300 kV. The samples were prepared by dropping catalyst powder dispersed in ethanol onto carbon-coated copper (or gold) TEM grids (Ted Pella) using micropipettes and were dried under ambient conditions. For imaging, copper TEM grids were used. For EDS, gold TEM grids were used.
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5

Material Characterization Techniques

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The morphology and microstructure
of the samples was investigated by an FEI XL30 Sirion SEM operated
at an accelerating voltage of 5 kV. UV–visible absorption spectra
were collected with an Agilent Cary 6000i UV–visible–NIR
spectrometer with baseline correction. XRD was performed on a PANalyticalX’Pert
with Ni-filtered Cu Kα radiation. The specific surface area
was tested by nitrogen adsorption–desorption measurement at
77 K (Micromeritics, ASAP 2020). Binder viscosity was measured by
TA Instruments ARES-G2 rotational rheometer.
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6

Characterization of Electroplated Zinc Substrates

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SEM images were taken using a FEI XL30 Sirion SEM (accelerating voltage 5 kV). XRD patterns were recorded on a PANalytical X 'Pert Diffractometer operated at 45 kV and 40 mA at the wavelength of Cu Kα radiation (λ=0.15406, nm). After the plating of Zn, substrates are detached from the insulator and outer package by ethanol, thoroughly washed by deionized water (18 M Ω) and immediately dried by blowing air. Dried substrate was glued to slide glass for XRD measurements.
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7

Optical and Electron Microscopy Imaging

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The optical microscope images were taken with an Olympus optical microscope. The SEM images were taken by a FEI XL30 Sirion SEM (5 kV) and a FEI Nova NanoSEM 450 (5 kV).
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8

Electrode Characterization in Battery

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SEM study of the electrode was conducted using an FEI XL30 Sirion SEM. XRD of the crystalline PI film was performed using an XRD (X’Pert Pro, PANalytical) with Cu Kα radiation. The FTIR spectrum was obtained by a Bruker Vertex 70 FTIR spectrometer. To study the morphology of the cycled electrode, the coin cells were dissembled, and the electrode after cycling was rinsed in pure 1,3-dioxolane (DOL) to remove the Li salts and impurities.
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9

Cellular Migration into Composite Scaffolds

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To investigate whether
cells can migrate from the cell sheet into the scaffold, the HUVEC-UM/OM/β-TCP
complex was fixed with 4% paraformaldehyde after 3, 7, and 14 days
of culture and stained with DAPI (5 μg/mL) for 1 min. The fluorescent
staining was imaged by fluorescent microscopy (Zeiss). Scanning electronic
microscope (SEM) was also used to observe the migration of cells from
the peripheral cell sheet into the center of the scaffold. At the
designated time points, the graft was fixed by 2.5% glutaraldehyde
and sequentially dehydrated in aqueous solutions of increasing ethanol
concentrations. A FEI XL30 Sirion SEM was used to observe cells on
the scaffolds after the composite scaffolds were coated.
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