Xl30 sirion sem
The XL30 Sirion Scanning Electron Microscope (SEM) is a high-performance imaging system designed for a wide range of applications. It provides high-resolution, high-magnification imaging capabilities.
Lab products found in correlation
9 protocols using xl30 sirion sem
Comprehensive Characterization of Lithium Plating/Stripping
Comprehensive Material Characterization
Comprehensive Microscopy Characterization
Microscopic Characterization of Catalyst Samples
Material Characterization Techniques
of the samples was investigated by an FEI XL30 Sirion SEM operated
at an accelerating voltage of 5 kV. UV–visible absorption spectra
were collected with an Agilent Cary 6000i UV–visible–NIR
spectrometer with baseline correction. XRD was performed on a PANalyticalX’Pert
with Ni-filtered Cu Kα radiation. The specific surface area
was tested by nitrogen adsorption–desorption measurement at
77 K (Micromeritics, ASAP 2020). Binder viscosity was measured by
TA Instruments ARES-G2 rotational rheometer.
Characterization of Electroplated Zinc Substrates
Optical and Electron Microscopy Imaging
Electrode Characterization in Battery
Cellular Migration into Composite Scaffolds
cells can migrate from the cell sheet into the scaffold, the HUVEC-UM/OM/β-TCP
complex was fixed with 4% paraformaldehyde after 3, 7, and 14 days
of culture and stained with DAPI (5 μg/mL) for 1 min. The fluorescent
staining was imaged by fluorescent microscopy (Zeiss). Scanning electronic
microscope (SEM) was also used to observe the migration of cells from
the peripheral cell sheet into the center of the scaffold. At the
designated time points, the graft was fixed by 2.5% glutaraldehyde
and sequentially dehydrated in aqueous solutions of increasing ethanol
concentrations. A FEI XL30 Sirion SEM was used to observe cells on
the scaffolds after the composite scaffolds were coated.
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