The QCM chip surfaces were analyzed by atomic force microscopy (AFM). The AFM images were acquired with a Slover PRO (NT-MDT, Russia) atomic force microscopy under ambient pressure. The semicontact mode was used with a frequency of 0.5 μm/s to scan an area of 50 × 50 μm2. The AFM probe was a golden silicon probe (NSG11, NT-MDT, Russia) with the length, width, thickness, resonant frequency, and force constant as 100 mm, 35 μm, 2.0 μm, 255 kHz, and 11.5 N/m2, respectively.
Nsg11
Manufactured by NT-MDT
The NSG11 is a highly sensitive scanning probe microscope designed for nanoscale imaging and analysis. It features a closed-loop scanner and advanced vibration isolation system to provide high-resolution topographical and analytical data. The NSG11 is capable of operating in a variety of scanning probe microscopy modes, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and scanning near-field optical microscopy (SNOM).
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Lab products found in correlation
4 protocols using nsg11
1
Atomic Force Microscopy Analysis of QCM Chips
2
Nanoscale Imaging of Protein Fibrillization
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This method was employed in accordance with that described above [31 (link), 56 (link)]. Specimen were imaged with a Nanowirzard-II BioAFM (JPK Instruments AG, Berlin, Germany, www.jpk.com ) operating in dynamic mode and using non-contact Si cantilevers (NSG11, NT-MDT–Moscow, Russia, www.ntmdt.com or ARROW-NCR, Nano World-Neuchȃtel, Switzerland, www.nanoworld.com ) with tip radii of <7–10 nm, spring constants of 20–40 N/m, and resonance frequencies of 285–325 kHz. After fibrillization, 5–10μL samples were spread onto a freshly cleaved mica sheet and left to adhere for 10-20min. Samples were then washed with distilled H2O and dried naturally. The images were acquired at line scan rates of 0.5–1 Hz at room temperature (RT). The AFM free oscillation amplitudes ranged from 25nm to 40nm, with characteristic set points ranging from 75% to 90%. AFM data were analyzed with Gwyddion (www.gwyddion.net ).
3
AFM Imaging of Solid Dispersions
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Atomic force microscope (AFM) Solver P47 Pro (NT-MDT, Russia)[25 (link)26 ] was used for studies of the morphology of films of initial substances and solid dispersions. One drop of the solid dispersion ethanol solution (1 mg/ml) was allowed to dry on a highly oriented pyrolytic graphite (HOPG) surface, and AFM images were obtained on the tapping mode. Standard silicon cantilevers NSG-11 (NT-MDT, Russia) were used. HOPG was freshly cleaved before use.
4
Atomic Force Microscopy Surface Analysis
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The AFM test was performed according to previous descriptions [15 (link), 16 (link)] with some modifications (n = 3 for each group). For surface roughness, the images of morphology and values of roughness average (Ra, nm) were observed by SPM-9600 AFM system (Shimadzu, Kyoto, Japan) in the tapping mode with a silicon nitride tip of NSG11 (NT-MDT, Moscow, Russia) under ambient circumstances. Each specimen was scanned at three randomly selected sites covering an area of 10 × 10 μm at 1 Hz scanning rate. Adhesion forces of the enamel surface were measured in the contact mode with a tipless cantilever. Seventy force-distance curves were attained at seven random regions for each slice at a scanning rate of 0.5 Hz, ramp size of 18 μm, and trigger force of 5 nN. A built-in software within the STM9700 system was applied to calculate adhesion forces from the curves.
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