The Brunauer–Emmett–Teller (BET) surface area was measured with BET ratio surface and aperture analyzer (NOVA2000e, Quantachrome, USA). Scanning electron microscopy (SEM) and X-ray energy-dispersive spectroscopy (EDX) analyses were performed using a QUANTA250 scanning electron microscope (FEI, USA) equipped with an X-MAX-50 EDX module (INCA, UK). Crystal phase composition was probed by X-ray diffraction (XRD; D/max-2500 and Smartlab9K, Rigaku, Japan), and surface functional groups were identified by Fourier transform infrared (FTIR) spectroscopy (NICOLET 5700, Thermo Nicolet Corp., USA). The valence states of surface elements were determined by X-ray photoelectron spectroscopy (XPS; ESCALAB 250Xi, Thermo Fisher Scientific, USA), and photoluminescence (PL) spectra were observed at an FLS 980 fluorescence spectrophotometer (Edinburgh Instruments, UK). Photocurrents were measured on a CHI760E electrochemical workstation, and light adsorption ability was probed by UV-vis spectrophotometry (U-4100, Hitachi, Japan). Electron signals generated in illuminated materials were detected by electron spin resonance (ESR; JES FA200, JEOL, Japan).
Smartlab9k
Manufactured by Rigaku
Sourced in Japan
The Smartlab9K is a high-performance X-ray diffractometer (XRD) designed for a wide range of analytical applications. It features a powerful 9 kW X-ray generator, providing enhanced signal-to-noise ratio and improved data quality. The Smartlab9K is capable of performing a variety of XRD measurements, including phase identification, stress analysis, and thin-film characterization.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (4 mentions)
Jes fa200, by JEOL (1 mentions)
Quanta 250 scanning electron microscope, by Thermo Fisher Scientific (1 mentions)
D max 2500, by Rigaku (1 mentions)
U 4100, by Hitachi (1 mentions)
Fls980 fluorescence spectrophotometer, by Edinburgh Instruments (1 mentions)
Jem 2100f tem, by JEOL (1 mentions)
Labram hr800, by Horiba (1 mentions)
2 protocols using smartlab9k
1
Comprehensive Material Characterization
2
Comprehensive Characterization of Carbon Materials
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Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda (BJH) models were applied to extract the specific surface area and pore-size distribution data, respectively. Scanning electron microscopy (SEM) using a Phenom Nano SEM (Phenom Scientific, Tykyo, Japan) at 10 KV and Transmission electron microscopy (TEM) using a JEOL JEM-2100F TEM (JEOL, Tykyo, Japan) at 200 KV were carried out to analyze the morphology of three carbon materials. Contact angle tests were conducted using a contact angle apparatus (Zhijia Equipment, Shenzhen, China). X-ray diffraction (XRD) measurements were performed via Smartlab9K (Rigaku, Tykyo, Japan) with Cu-Kα as the X-ray source. X-ray photoelectron spectroscopy (XPS) data were gathered by Thermo Scientific ESCALAB 250Xi through Al Kα ray at 1486.6 eV (Waltham, MA, USA). Raman spectra were measured by a HORIBA LabRAM HR 800 with an excitation wavelength of 514 nm (HORIBA, Paris, France). The Ion Chromatography (IC) tests were performed using CIC-D120 (Qingdao Shenghan, Co., Ltd., Qingdao, China).
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