Single reflection diamond znse

FT-IR/ATR analyses were conducted using a Spectrum Two-PE instrument endowed with a universal ATR accessory (UATR, Single Reflection Diamond/ZnSe) supplied by PerkinElmer. For each of the relevant samples, FT-IR/ATR spectra were recorded from 400 to 4000 cm⁻¹ with a 4 cm⁻¹ resolution.
XPS analyses were performed using a scanning microprobe, PHI 5000 VersaProbe II, purchased from Physical Electronics (Chanhassen, MN, USA). The instrument was equipped with a micro-focused monochromatized AlKα X-ray radiation source. The samples were examined in HP mode with an X-ray take-off angle of 45° (instrument base pressure ~10⁻⁹ mbar). The size of the scanned area was approximately 1400 μm × 200 μm. Wide scans and high-resolution spectra were recorded in FAT mode for each sample, setting pass-energy values equal to 117.4 eV and 29.35 eV, respectively. To fit the high-resolution spectra, the commercial MultiPak software version 9.9.0.8 was used. Adventitious carbon C1s were set as the reference charge (284.8 eV).

FT-IR/ATR analyses using a Spectrum Two-PE instrument endowed with a universal ATR accessory (UATR, Single Reflection Diamond/ZnSe) supplied by PerkinElmer. For each of the relevant samples, FT-IR/ATR spectra were recorded from 400 to 4000 cm⁻¹ with a 4 cm⁻¹ resolution.
XPS analyses were performed using a scanning microprobe PHI 5000 VersaProbe II purchased from Physical Electronics (Chanhassen, MN). The instrument is equipped with a micro-focused monochromatized AlKα X-ray radiation source. The samples were examined in HP mode with an X-ray take-off angle of 45° (instrument base pressure ~10⁻⁹ mbar). The size of the scanned area was about 1400 × 200 μm. Wide scans and high-resolution spectra were recorded in FAT mode for each sample, setting pass-energy values equal to 117.4 eV and 29.35 eV, respectively. In order to fit the high-resolution spectra, the commercial MultiPak software version 9.9.0.8 was used. Adventitious carbon C1s were set as the reference charge (284.8 eV).

Fourier-Transform Infrared/Attenuated Total Reflection (FTIR/ATR) analyses was performed using a Spectrum Two-PE instrument endowed with a universal ATR accessory (UATR, Single Reflection Diamond/ZnSe) supplied by PerkinElmer Inc. (Waltham, MA, USA). For each of the relevant EOs, FTIR/ATR spectra were recorded from 400 to 4000 cm⁻¹ with a 4 cm⁻¹ resolution, with the liquids being placed directly over the diamond.