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Fe sem jsm7100f

Manufactured by JEOL
Sourced in Taiwan, Province of China

The FE-SEM JSM7100F is a field emission scanning electron microscope (FE-SEM) designed and manufactured by JEOL. It is a high-performance imaging system that utilizes a field emission electron gun to produce a narrow, high-brightness electron beam. The FE-SEM JSM7100F is capable of providing high-resolution images and analytical data for a wide range of samples.

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2 protocols using fe sem jsm7100f

1

Comprehensive Examination of Spider Genitalia

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All specimens were kept in 100% ethanol and examined with an Olympus SZX16 stereomicroscope. Further details were studied under an Olympus BX51 compound microscope. Male and female genitalia were examined and illustrated after dissection. Epigynes were cleaned by Proteinase K solution. Male left palps and female epigynes were imaged with an Olympus BX51 compound microscope in ethanol and in Arabic gum. For SEM, specimens were treated according to Agnarsson (2004) (link). Male palps were cleaned ultrasonically for 1 minute, transferred to 100% ethanol overnight, then air-dried. Palps were glued to round-headed rivets using conductive adhesive, then sputter coated and imaged by a field emission scanning electron microscope (FE-SEM JSM7100F, JEOL, JP). Spider body photos were obtained using a Leica 205C digital microscope. All images were assembled using Helicon Focus image stacking software. All measurements were obtained using a Leica 205C digital microscope and given in millimeters. Eye diameters were taken at the widest point. Leg lengths are given as: total length (femur, patella, tibia, metatarsus, tarsus). All specimens studied are deposited in Centre for Behavioural Ecology and Evolution (CBEE), College of Life Science, Hubei University, Wuhan, China.
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2

Characterizing Burrow Wall Mineralogy

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The mineral composition and clast arrangement of the burrow wall, fill, and host rock was assessed using petrographic thin sections studied with an optical microscope. However, the feather-like structures and wall-lining were difficult to identify under the microscope and were therefore analyzed in thin sections using a thermal field emission scanning electron microscope (JEOL FE-SEM: JSM-7100F) in the EPMA lab at Institute of Earth Sciences, Academia Sinica, Taipei, Taiwan. Chemical identification was carried out using an Energy Dispersive X-ray Spectrometer (EDS: Oxford Instruments X-max80 with INCA-350), equipped on the FE-SEM. Each sample was mounted, polished, and analyzed with FE-SEM and EDS under low vacuum conditions (50 Pa), using an acceleration voltage of 15 kV and beam current of 0.12 nA. The duration of EDS counting time was 15 s for each spot.
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