NT-MDT brand NSG30 and NSG03 conical tipped SiN cantilevers (NT-MDT, Moscow, Russia) and a high spring constant 5 µm diameter in SiO2 spherical tip cantilevers were used. NT-MDT NSG03 has a spring constant generally in the 1–5 N/m range, and an NSG30 cantilever has a spring constant usually in the 22–100 N/m range. These N-type conical cantilevers possess a half-side angle of 18° and a tip apex radius < 10 nm. The 5 µm diameter spherical tip cantilever has a spring constant between 20 and 70 N/m. Tip wear over scanning changes the morphology of the tip apex. The values provided are for unused cantilevers and are quoted from the manufacturer.
Nsg30
Manufactured by NT-MDT
The NSG30 is a scanning probe microscope designed for high-resolution imaging and analysis of sample surfaces. It features a closed-loop scanner with a scan range of up to 80 μm x 80 μm and a vertical range of up to 12 μm. The instrument is capable of operating in various imaging modes, including contact, semi-contact, and non-contact atomic force microscopy (AFM), as well as scanning tunneling microscopy (STM). The NSG30 is compatible with a variety of sample types and can be used for a range of applications in materials science, nanotechnology, and life sciences.
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Lab products found in correlation
3 protocols using nsg30
1
Atomic Force Microscopy Cantilever Selection
2
AFM Imaging and Analysis Protocol
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AFM images were acquired in air at room temperature using either an MFP3-3D (Asylum Research/Oxford Instruments, Goleta, CA, USA) or a SOLVER_Pro NT-MDT machine using either NSG30 (NT-MDT, Apeldoorn, The Netherlands, typical resonance frequency: 320 kHz; spring constant: 40 N/m), NSG03 (NT-MDT, Apeldoorn, The Netherlands), typical resonance frequency: 90 kHz; spring constant: 1.74 N/m), or AC240 (Olympus, Tokyo, Japan), resonance frequency: 70 kHz; spring constant: 2 N/m) cantilevers. All the AFM images were processed using WSxM software [29 (link)]; the contour length analysis was performed via 2D single molecule software [30 (link)] while and Igor Pro was used for the statistical analysis.
3
Atomic Force Microscopy of Sulfated DEAE-Cellulose Films
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AFM specimens
of the sulfated DEAE-cellulose films were prepared as follows: the
sulfated DEAE-cellulose (2 g) was dissolved in distilled water (30
mL) at room temperature. The resulting sulfated DEAE-cellulose solution
was poured into a Petri dish and dried in an oven at a temperature
of 45 °C to a constant weight. The obtained sulfated DEAE-cellulose
films were separated from the Petri dish with tweezers and subjected
to AFM analysis. The AFM study of the sulfated DEAE-cellulose films
was carried out in a semicontact mode using a Solver P47 multimode
scanning probe microscope (NT-MDT, Moscow) equipped with a 14 μm
scanner and an adjustment stage (model SKM). In the semicontact AFM
experiments, rectangular silicon cantilevers (NSG30, NT-MDT, Moscow)
with an average resonance frequency of 320 kHz and a force constant
of 40 N/m were used. The tip curvature radius was 10 nm.
of the sulfated DEAE-cellulose films were prepared as follows: the
sulfated DEAE-cellulose (2 g) was dissolved in distilled water (30
mL) at room temperature. The resulting sulfated DEAE-cellulose solution
was poured into a Petri dish and dried in an oven at a temperature
of 45 °C to a constant weight. The obtained sulfated DEAE-cellulose
films were separated from the Petri dish with tweezers and subjected
to AFM analysis. The AFM study of the sulfated DEAE-cellulose films
was carried out in a semicontact mode using a Solver P47 multimode
scanning probe microscope (NT-MDT, Moscow) equipped with a 14 μm
scanner and an adjustment stage (model SKM). In the semicontact AFM
experiments, rectangular silicon cantilevers (NSG30, NT-MDT, Moscow)
with an average resonance frequency of 320 kHz and a force constant
of 40 N/m were used. The tip curvature radius was 10 nm.
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