Alpha 2 spectrometer
The Alpha II is a compact, benchtop Fourier Transform Infrared (FTIR) spectrometer designed for routine analysis. It features a Michelson interferometer and a high-performance deuterated triglycine sulfate (DTGS) detector. The Alpha II is capable of acquiring infrared spectra in the mid-infrared spectral range.
Lab products found in correlation
36 protocols using alpha 2 spectrometer
FTIR Characterization of Nanoparticles
FTIR Analysis of Keratin Functional Groups
Multimodal Characterization of Materials
Empyrean X-ray powder diffractometer equipped with a Bragg–Brentano
HD mirror and operated at 45 kV and 40 mA using Cu Kα radiation.
The scans were collected in the 2θ range of 15–90°
(step size, 0.033° and time per step, 3.2 s). Raman spectra were
collected with a Thermo Scientific DXR2 Raman spectrometer equipped
with a 532 nm laser using a spot size of 1.8 μm. The spectra
were acquired in the range of 100–3,500 cm–1 with a spectral resolution of 0.964 cm–1. Five
measurements at different locations of the sample with a measurement
time of 100 s were acquired and averaged. FTIR spectroscopy experiments
were performed on self-supporting pellets using a Bruker Alpha II
spectrometer in transmission mode (12 scans, 2 cm–1 resolution) under a N2 atmosphere. TEM measurements were
acquired with a FEI Talos F200X electron microscope operated at 200
kV. BET (Brunauer–Emmett–Teller) surface areas of the
materials were measured from the N2 physisorption isotherms
recorded at 77 K on an Anton Paar Nova 800 apparatus. The samples
were degassed at 300 °C under vacuum (10–3 mbar) for 3
h prior to measurement.
Characterization of AgNPs and KNC
Preparation and Characterization of Organometallic Compounds
Infrared Spectroscopy Characterization of Mosquitoes
Scanning of the mosquito samples was done at the VectorSphere, where the spectrometer is installed. Before scanning, ethanol-preserved samples were placed on paper towels to allow evaporation of the liquid (Fig.
Comprehensive Characterization of Material Samples
by a Bruker Alpha II spectrometer (4000–500 cm–1). A Bruker D8 advanced diffractometer using Cu Kα radiation
was used for phase identification. Samples were mounted on a flat
steel and scanned from 5 to 70°. A JEOL HRTEM-2100 electron microscope
was used to get HRTEM images and selected area electron diffraction
(SAED) patterns. SEM images were obtained by a ZEISS EVO LS 15 electron
microscope. A Perkin Elmer Lambda 25 spectrometer (200–700
nm) was used to record the absorption spectra. Emission spectra were
recorded using a Perkin Elmer LS 45 fluorescence spectrometer.
FTIR Spectroscopic Characterization of Scaffolds
Comprehensive Characterization of MgO Nanoparticles
Optical and Infrared Analysis of AuNRs
The elemental analysis was carried out with SEM Phenom XL ProX, a scanning electron microprobe.
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