were evaluated using the FEI Verios 460L in AIF. The Everhart–Thornley
detector was used in backscatter mode with an accelerating voltage
of 2 kV and a sample current of 13 pA.
The Verios 460L is a scanning electron microscope (SEM) designed by Thermo Fisher Scientific. It is capable of high-resolution imaging and analysis of various materials and samples. The Verios 460L utilizes a field emission electron source to produce a focused electron beam that interacts with the sample, generating signals that can be used to create detailed images and gather information about the sample's surface and composition.
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