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Verios 460l

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Verios 460L is a scanning electron microscope (SEM) designed by Thermo Fisher Scientific. It is capable of high-resolution imaging and analysis of various materials and samples. The Verios 460L utilizes a field emission electron source to produce a focused electron beam that interacts with the sample, generating signals that can be used to create detailed images and gather information about the sample's surface and composition.

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43 protocols using verios 460l

1

Scanning Electron Microscopy Imaging

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All samples
were evaluated using the FEI Verios 460L in AIF. The Everhart–Thornley
detector was used in backscatter mode with an accelerating voltage
of 2 kV and a sample current of 13 pA.
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2

Graphene/h-BN/Si Heterostructure Characterization

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After forming the graphene/h-BN/Si structure, the I-V characteristics were measured using a Keithley 2400 (Cleveland, OH, USA); source meter and a current preamplifier (DL1211). An IV probe station coupled to a Keithley 4200 semiconductor analyzer was used to test the electrical properties of the manufactured devices. To analyze the Raman vibrational modes, a confocal Raman microscope system (WITex Alpha 3000 M, 532 nm source) was used. The TOF SIMS V equipment with a lateral resolution of 300 nm was utilized to identify C, O, B, and Al in multilayered C/BN heterostructures produced on Al2O3 substrates using a Cs+ sputtering gun. A FEI Verios 460 L was used to explore variations in the thin-film topography caused by the laser irradiation. EBSD studies were conducted with an FIB-SEM fitted with a field-emission gun to explore the phase and structure of BN during laser irradiation. Furthermore, the effects of laser irradiation on the thin-film atomic structure were studied at the atomic level using high-angle annular dark-field (HAADF) imaging and nano-diffraction studies on the aberration-corrected NION UltraSTEM (STEM, scanning transmission electron microscope).
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3

Quantification of Thylakoid Stacking

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WT and pyr– (Spinacia RBCS strain) samples were fixed for electron microscopy as previously described (Genkov et al., 2010 (link)), except that Tris-minimal medium was used instead of PIPES for the first fixation step. Material was imaged using a Field Emission scanning electron microscope (FEI Verios 460L) or a Tecnai G2 80–200 kV transmission electron microscope. Using the latter, 20 cells per experimental condition, each with diameters >4.5 µm, were sampled randomly for quantification of thylakoid stacking. Images were indexed, pooled, and presented in random order for blind analysis. For each image, widths of five representative appressed regions were quantified as the width perpendicular to the orientation of lamellae, using the image processing system Fiji (Schindelin et al., 2012 (link)). Statistical analyses of these—and other—results were performed using R version 3.2.4 (The R Foundation, Vienna, Austria).
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4

Fabrication of Nanoparticle-Loaded Microneedle Arrays

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All the MNs in this study were fabricated using the uniform silicone molds from Blueacre Technology, Ltd. Each needle had a 300 μm by 300 μm round base tapering to a height of 800 μm. The needles were arranged in an 11 × 11 array with 600 μm tip-to-tip spacing. To fabricate a nanoparticle-loaded microneedle, the prepared nanoparticle suspension was first deposited by pipet onto the MN mold surface (30 μL/array). Then molds were placed under vacuum (600 mmHg) for 5 min to allow the solution filled the MN cavities. Afterward, the covered molds were centrifuged using a Hettich Universal 32R centrifuge for 10 min at 2000 rpm. Finally, 3 mL of premixed N,N′-methylenebis(acrylamide) (MBA, w/v 2%), photoinitiator (Irgacure 2959, w/v 0.5%), and m-HA solution (w/v: 4%) was added into the prepared micromold reservoir and allowed to dry at 20 °C under vacuum desiccator. m-HA was synthesized following the previous reported method.44 After complete desiccation, the MN patch was carefully detached from the silicone mold and underwent the cross-linking polymerization via UV irradiation (wavelength: 365 nm at an intensity of 9 mW/cm2) for 30 s. The resulting MN-array patches were stored in a sealed six well container for later study. The morphology of the MNs was characterized via a FEI Verios 460L field-emission scanning electron microscope (FESEM).
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5

Characterization of P2 Powder Structures

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XRD was used to determine the structure of the as-synthesized P2 and expanded powders, and the electrodes before and after electrochemical cycling. XRD was performed with standard Bragg-Brentano geometry and Cu-Ka radiation (PANalytical Empyrean). The powder samples were rotated at 7.5 RPM, while the electrodes remained stationary. Scanning electron microscopy (SEM, FEI Verios 460L) was used to determine the morphology of the P2 powders before and after expansion, as well as after electrochemical cycling. The water content of the expanded samples was measured with thermogravimetric analysis (TGA; SII EXSTAR6000 TG/DTA6200), using aluminum pans to hold ~12 mg of powder during heating in air at 5°C /min from 25 to 300°C.
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6

Antennal Ultrastructure Analysis of Insects

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Heads of female and male were kept in 40% ethanol, and the scales of middle and distal portions of antennal segments were removed. The heads were processed ethanol series (50, 60, 70, 80, 85, 90, 95, 99, and 100%) before being critical point dried in a Tousimis Samdri-795 (Rockville, MD, USA). The antennae were removed from the head and mounted on an SEM stub with carbon tape. The specimens were coated with AuPd (either Hammer 6.2 Sputtering System, Anatech Ltd., Springfield, VA, USA, or Cressington 108 sputter coater, Watford, UK) before imaging in JEOL JSM-5900LV (Tokyo, Japan), Hitachi SU3900 SEM (Tokyo, Japan) or a FEI Verios 460L (Hillsboro, Oregon, USA). In this study, we classified the observed sensory hairs according to morphological characteristics but did not analyze the details of the distribution and function of the sensilla.
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7

Characterization of Cu2O Nanocubes

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The morphological studies of synthesised Cu2O nanocubes were carried out with FEI Verios 460 L scanning electron microscope using 10 kV and 0.8 nA. The structural characteristics of the synthesised materials were studied using Bruker D8 Discover microdiffraction system which has general area detector diffraction system and the Cu-Kα radiation source. The oxidation state studies of the prepared samples were studied using Thermo K-Alpha instrument at a pressure better than ~10–8 Torr. The core binding energies of the elements were aligned at 285 eV for adventitious C1s core level energy. Si substrates were marked using focused ion beam milling with a FEI Scios FIB-SEM. Each marked area on the silicon has a size of 286 µm × 286 µm with an etched depth of 1 μm. A beam current 3 nA at 30 KV was used for 516 seconds with tilt 52° to mill each substrate. Fluorescence confocal images were taken using a 6 ps pulsed Fianium SuperChrome laser source, at a repetition rate of 40 MHz, with a centre wavelength of 520 nm and a full width at half maximum (FWHM) of 10 nm. The imaging was performed using a 532 nm dichroic mirror, 532 nm long pass filter, 532 nm short pass filter and a 100 × 0.9 NA objective lens.
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8

Characterizing Titania Microparticles

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The in-flow synthesized titania microparticles were characterized using (i) scanning electron microscopy (FEI Verios 460L) to conduct size measurements post-calcination and study monodispersity and morphology, (ii) X-ray diffraction (Rigaku SmartLab X-Ray Diffractometer) to characterize crystallinity and crystal phase composition as a function of calcination time and temperature, and (iii) Brunauer–Emmett–Teller characterization (Micromeritics ASAP 2020) to evaluate specific surface area for microspheres synthesized using different precursor compositions, calcination temperatures, and calcination times.
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9

Microstructural Characterization of Materials

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Microstructure analysis was carried out by scanning electron microscopy (SEM) (SEM-JEOL 5600, JEOL Ltd., Tokyo, Japan), equipped with an energy-dispersive X-ray spectroscopy (EDS) sensor [38 (link)] for localized chemical composition detection. The metallographic preparation included polishing up to 0.04 µm. The presence of secondary phases was evaluated by X-ray diffraction (XRD) analysis using a RIGAKU-2100H X-ray diffractometer with CuKα [39 (link)]. The diffraction parameters were 40 KV/30 mA and a scanning rate of 2°/min. For high-resolution observation, transmission electron microscopy (TEM) characterization was carried out using an analytical electron microscope (JEOL JEM-2100F, Jeol Ltd., Tokyo, Japan) facility operating at 200 kV. This observation included bright field (BF) analysis, selected area electron diffraction (SAED), and EDS. For microstructural investigation at the center of indentations, electron-transparent cross-section lamella specimens were meticulously prepared with a dual-beam focused ion beam microscope (FEI, Verios-460 L, Hillsboro, OR, USA).
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10

Insulin-Loaded Microneedle Patch Fabrication

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Poly(EDAA0.4-FPBA0.6) (10 mg) and insulin (10 mg) were mixed to prepare F-insulin suspension, which was further allocated to five MN patch molds (20 × 20; base: 300 μm, circle; body: 900 μm, with 600-μm cylindrical body and 300-μm conical tip), and dried under vacuum. Then, PVP [10 weight % (wt %), 100 μl] was placed on the MN molds and incubated under vacuum again to let the solution get into the MN holes, followed by the addition of another 500 μl of PVP (10 wt %) solution. Then, the MN patch molds were placed under vacuum until dry. The MN array patch was observed on a scanning electron microscope (FEI Verios 460L).
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