Fine coat ion sputter jfc 1100

Scanning electron microscopy (SEM) was used to examine the morphology of the electrospun PLA fibers with and without biochanin A. The samples were sprayed by an alloy of gold and palladium (85%/15%) under vacuum in a Fine Coat JEOL JFC-1100 Ion Sputter (JEOL Ltd., Tokyo, Japan). The metalized samples of electrospun PLA fibers were scanned using a JEOL Scanning Electron Microscope JSM-5300 (JEOL Ltd., Tokyo, Japan), under a magnification of 10,000 times, voltage 20 kV, vacuum 1.33 × 10⁻⁵ Pa.

Morphology of MTX-NPs was observed under scanning electron microscope (JSM–6360LV Scanning Microscope; Jeol, Tokyo, Japan). A dispersion of NPs was dried on an aluminum stub overnight under vacuum and gold sputtering coating was carried out using a gold sputter module with high-vacuum evaporator (JFC–1100 fine coat ion sputter; Jeol, Tokyo, Japan). Photomicrographs of coated samples were taken after scanning at an accelerated voltage of 15 kV [30 (link)].

Scanning electron microscopy (JSM-6360 LV, JEOL, Tokyo, Japan) was used to visualize the surface morphology of the samples chosen based on the smallest particle size and high EE%. The lyophilized samples were mounted on carbon tape and sputter coated with a thin gold layer in a high vacuum evaporator using a gold sputter module (JFC-1100 fine coat ion sputter; JEOL, Tokyo, Japan). After that, the coated samples were scanned and photomicrographs were taken at a 30 kV acceleration voltage.

The surface morphology of the selected freeze-dried IMQ NPs and CS-IMQ NPs was examined using a scanning electron microscope (JSM-6360 LV, JEOL, Tokyo, Japan). The freeze-dried samples were fixed onto carbon tape and coated with a thin layer of gold in a high-vacuum evaporator (JFC-1100 fine coat ion sputter; JEOL) under an argon atmosphere to enhance the conductivity of the samples and improve imaging quality. The coated samples were then scanned using the scanning electron microscope at an acceleration voltage of 10 kV, and photomicrographs were captured to visualize the surface characteristics and morphology of the particles.

The morphological features of the particles were examined by both TEM and SEM. The TEM measurements were performed using a JEM-1400 electron microscope (JEOL, Tokyo, Japan) operating at an acceleration voltage of 120 kV. A few drops of the F7 formulation were placed on a 400-mesh carbon-coated copper grid. The samples were air-dried at room temperature prior to measurement.
SEM was used to examine the particle surface characteristics of the Val-loaded mixed micelles formulation F7 (JSM-6360 LV, JEOL, Tokyo, Japan). A few drops from formulation F7 were mounted on carbon tape and sputter-coated with a thin gold layer in a high-vacuum evaporator using a gold sputter module (JFC-1100 fine coat ion sputter; JEOL). For scanning and producing photomicrographs of the coated samples, a 10 KV acceleration voltage was used.