Spotlight 200i sp2 with autoatr system

The crystallinity of the Cu-BTC composite was investigated using X-ray powder diffraction (XRD; X’Pert3 Powder, Malvern PANalytical, Malvern, UK). Using a field emission scanning electron microscope (FESEM; JSM-7610F, JEOL Ltd., Akishima, Japan) equipped with an energy-dispersive X-ray analysis (EDX) system, the morphological characteristics and elemental composition of Cu-BTC were evaluated. In addition, the functionality and qualitative and chemical compositions of the materials were evaluated using Fourier-transform infrared (FTIR) spectroscopy (Spotlight 200i Sp2 with AutoATR System, Perkin Elmer, Waltham, MA, USA) and X-ray photoelectron spectroscopy (XPS; JPS-9030, JEOL Ltd., Minato-ku, Japan).

The CuCrO₂ thin films’ characteristics were characterized by using various analytical characterization techniques. The CuCrO₂ thin films’ crystalline structure was analyzed by using grazing incidence X-ray diffraction (GIXRD D8, Bruker ADVANCE, Billerica, MA, USA), and the range of 2-Theta was from 20° to 80° (the incident angle was 0.5°, Cu Kα λ = 1.5418 Å). The cross-sectional and surface morphology of the film was observed with the help of a field-emission scanning electron microscope (FESEM, FE-SEM/EDX, JEOL, JSM-7610F, and Hitachi Regulus 8100, Tokyo, Japan). The optical properties of the prepared films were measured using an ultraviolet-visible spectrometer (UV-Vis, Shimadzu 2600, Kyoto, Japan) at a wavelength range of 300–800 nm. The vibrational bonds and the functional groups of the prepared materials were studied by using a micro-Raman spectrometer (Micro-Raman Spectrum, ACRON, UniNanoTech Co., Ltd., Yongin, Republic of Korea) and a Fourier-transform infrared spectrometer (FTIR, Spotlight 200i Sp² with Auto ATR System, Perkin Elmer, Inc. Waltham, MA, USA). The resistivity was measured by using a four-point probe (Four-Point Probe, Keithley 2400 SourceMeter^® SMU Instruments, Cleveland, OH, USA), and the carrier concentration was measured by using the hall method (Ecopia HMS-3000 Hall Measurement System, Gyeonggi-do, Republic of Korea).