A pulsed laser ablation device (PLFD-221-1R, Freedom Ltd., Kawasaki, Japan) was used for PLD. X-ray diffractometer (Smartlab, Rigaku Corporation, Tokyo, Japan), laser microscope (LEXT OLS5100, Olympus Corporation, Tokyo, Japan), TOF-SIMS 5-100-AD (ION-TOF GmbH, Germany), FT/IR-6100 (JASCO, Co., Ltd., Tokyo, Japan), atomic force microscope (SPM-9700, Shimadzu Corp., Kyoto, Japan) and scanning electron microscope (JEM-2010F, JEOL, Ltd., Tokyo, Japan) were used for characterization of prepared films.
Lext ols5100
The LEXT OLS5100 is a laser scanning confocal microscope designed for high-resolution surface analysis. It captures detailed 3D images and measurements of a wide range of samples with high accuracy and repeatability.
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7 protocols using lext ols5100
Synthesis and Characterization of MgB2 Thin Films
A pulsed laser ablation device (PLFD-221-1R, Freedom Ltd., Kawasaki, Japan) was used for PLD. X-ray diffractometer (Smartlab, Rigaku Corporation, Tokyo, Japan), laser microscope (LEXT OLS5100, Olympus Corporation, Tokyo, Japan), TOF-SIMS 5-100-AD (ION-TOF GmbH, Germany), FT/IR-6100 (JASCO, Co., Ltd., Tokyo, Japan), atomic force microscope (SPM-9700, Shimadzu Corp., Kyoto, Japan) and scanning electron microscope (JEM-2010F, JEOL, Ltd., Tokyo, Japan) were used for characterization of prepared films.
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