3531 z hi tester

Complex impedance spectroscopy as a powerful technique is not only for determining the electrical properties of materials but also for investigating the interfacial region between the electronically conducting electrodes and the electrolytes. As described in the experimental section, the separating phase was obtained from the solid polymer electrolyte (SPE) films by cutting them into small discs (2 cm diameter) and sandwiching them between two stainless steel electrodes using spring pressure. The impedance of the films was measured using a HIOKI 3531 Z Hi-tester (HIOKI, Nagano, Japan), which was controlled by a computer in the frequency range from 50 Hz to 5000 kHz. Software was used to measure the real (Z_r) and imaginary (Z_i) parts of impedance. To present the impedance spectra of Z_r and Z_i, a Nyquist plot was used, and an analysis of the spectra was performed from the determination of the intercept of the plot with the real impedance axis to gain the bulk resistance. All conductivity values were also calculated using the equation shown below [24 (link),25 (link)].
${\sigma }_{dc}=\left(\frac{1}{R_b}\right)\times \left(\frac{t}{A}\right)$
where t and A are the thickness and surface area of the film, respectively.

The XRD was recorded at room temperature using X-ray diffractometer (Bruker AXS, Billerica, MA, USA) with operating voltage and current of 40 kV and 40 mA, respectively. A beam of monochromatic, X-radiation of wavelength λ = 1.5406 A° was used to scan the samples with the glancing angles in the range of 5° ≤ 2θ ≤ 80° and step size of 0.1°. A Jasco V-570 UV–vis-NIR spectrophotometer (Jasco SLM-468, Tokyo, Japan) in the absorbance mode was used to record the UV–vis spectra of the chitosan-silver nitrate membrane film and their nanocomposites. The electrical properties of the samples were carried out using HIOKI 3531 Z Hi-tester (Nagano, Japan). For electrical impedance spectroscopy (EIS) measurements, the films were cut into small discs with 2 cm in diameter and sandwiched between two stainless steel electrodes. The impedance of the films was measured within the frequency range of 0.05–1000 kHz.

The XRD was performed on the samples using an X-ray diffractometer (Bruker AXS, Billerica, MA, USA) with an operating voltage and current of 40 kV and 40 mA, respectively. The samples were scanned with a beam of monochromatic, X-radiation of wavelength λ = 1.5406 A^° and the glancing angles were in the range of 5° ≤ 2θ ≤ 80° with a step size of 0.1°. The electrical behavior of the electrolyte membranes were examined using a HIOKI 3531 Z Hi-tester within the frequency range of 50–1000 kHz.

The ultraviolet-visible (UV-Vis) absorption spectra of the prepared films were recorded on a UV-vis spectrometer (V-570, Jasco, Japan) with the scanning range from 180 to 1000 nm. To investigate the surface microstructure of the nanocomposite films, optical micrograph (OM) images were taken. The images at adjusted magnification were taken by an optical microscope (MEIJI) through an attached camera-controlled (DINO-LITE) software. Furthermore, the surface morphology of the samples was examined by scanning electron micrograph (SEM) using the FEI Quanta 200 FESEM scanning electron microscope. X-Ray Diffraction XRD patterns were recorded using Empyrean X-ray diffractometer, (PANalytical, Netherland) with operating current and voltage of 40 mA and 40 kV, respectively. The samples were scanned with a beam of monochromatic CuKα X-radiation of wavelength (λ = 1.5406 Ǻ), and the glancing angles X-ray diffraction was in the range of 5° ≤ 2θ ≤ 80° with a step size of 0.1°.
The impedance of the films was measured using HIOKI 3531 Z Hi-tester within a frequency range of 50 Hz to 1000 kHz. The SPE blend films were cut into small discs (2 cm diameter) and sandwiched between two stainless steel electrodes under spring pressure. The measurements were also carried out at different temperatures ranging from 303 K to 363 K.