Spectrum rx1
The Spectrum RX1 is a high-performance Fourier Transform Infrared (FT-IR) spectrometer designed for a variety of analytical applications. It provides accurate and reproducible infrared spectroscopy data for the identification and characterization of organic and inorganic compounds.
Lab products found in correlation
75 protocols using spectrum rx1
FTIR Characterization of Isolongifolene-Chitosan
Comprehensive Materials Characterization Protocol
microscope (SEM, JSM7800F JEOL) and transmission electron microscope
(TEM, HT7700 Hitachi). The crystal structure was analyzed by X-ray
powder diffraction (XRD, advance D8 Bruker) using Cu Kα1 radiation (λ = 1.54056 Å) in the 2θ range
from 5 to 90°. The chemical information of the structure was
characterized using Fourier transform infrared spectroscopy (FTIR,
PerkinElmer Spectrum RX1). Raman test was measured at room temperature
using a Renishaw in Via Raman system equipped with a 514 nm laser
source. Thermal stability of the samples was analyzed using a thermogravimetry
(TGA)/differential scanning calorimetry analyzer (Mettler Toledo)
under air atmosphere with a heating rate of 10 °C min–1. The N2 adsorption–desorption isotherms were measured
at 77 K (SPECTOMETER 1990, American Thermo), and the surface areas
were calculated based on the Brunauer–Emmett–Teller
(BET) method.
Infrared Analysis of Phenolic Compounds
Characterization of M-SCN Crystals
Synthesis and Characterization of Magnetic Chitosan-PVA Nanocomposite
Identifying Biosurfactant Composition via FTIR
All the results of experiments were conducted in three independent replicates and the results presented were the average data.
Characterization of Chitosan Nanoparticle Formulations
Characterization of ZnO Nanoparticles by FTIR
Spectroscopic Characterization of Compounds
Multimodal Characterization of Nanocatalysts
structure and phase purity of the synthesized nanocatalysts were characterized
by X-ray diffraction (XRD) with an X-ray diffractometer Bruker D8
Advance operated at 40 kV and 40 mA using a Cu Kα radiation
source (λ = 1.5418Å). The relative composition of the quaternary
catalyst was calculated using Rietveld analysis of PXRD data. The
morphological features of the catalysts were investigated using a
field emission scanning electron microscope attached with an energy
dispersive X-ray spectrometer (EDS) and elemental mapping (FESEM,
INSPECT F50 FEI), transmission electron microscopy (TEM), and high-resolution
transmission electron microscopy (JEM-2100F HRTEM, JEOL, Japan), and
selected area electron diffraction (SAED). XPS spectra of the Pd/BM-BOCC
composite were obtained by using Thermo Fisher Scientific Inc., U.K.
An X-ray source operated at 150W (12 kV, 12.5 mA) was used as nonmonochromatic
Al Ka radiation (1486.6 eV). The physicochemical and optical characteristics
were studied using an UV–visible spectrophotometer (V-630,
Jasco, Japan) and photoluminescence spectra (RF-5301, Shimadzu, Japan).
Ex situ Fourier transform infrared spectroscopy (FTIR, Perkin Elmer,
Spectrum RX1, Resolution 4 cm–1) was applied to
characterize the catalysts and for the identification of ethanol oxidation
intermediate products.
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