The surface morphology of the 3D Printed samples was studied via Scanning Electron Microscopy (SEM). The samples were suck on a carbon stick pad on 8 mm or 12 mm diameter aluminium stubs and gold coated for 2 min (approx. 20 nm of gold coating) using an Edwards S150B sputter coater. SEM micrographs were collected using an Inspect™ F scanning electron microscope (FEI Company, Hillsboro, OR, USA) operating in secondary electron mode between 3–5 KeV and a spot size of 3.5–4.
Inspect f scanning electron microscope
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Inspect™ F scanning electron microscope is a high-performance instrument designed for advanced materials characterization. It provides high-resolution imaging and analytical capabilities for a wide range of samples. The Inspect™ F is capable of producing detailed, high-quality images of surface topography and microstructural features.
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2 protocols using inspect f scanning electron microscope
1
Scanning Electron Microscopy of 3D Printed Samples
2
SEM Imaging of Microcapsules and Crystals
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Microcapsule and crystal appearance was assessed by imaging using an FEI Inspect-F scanning electron microscope (SEM). Following production, microcapsule samples were suspended in 1 ml of deionised water before further dilution 1 : 10 in deionised water. Three small drops were distributed on carbon tape upon a metal stump and were allowed to dry completely. For acetonitrile dissolution of LbL dexamethasone crystals, 10 μL of acetonitrile was subsequently added to stumps and allowed to evaporate completely (Fig. S1 †). Before imaging, samples were sputter coated with gold using a Quorum SC7620 sputter coater for 30 seconds. Coated samples were imaged using the FEI inspect-F SEM with FEI xT microscope control software, at varying magnifications up to 20 000×.
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