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Uv 2450

Manufactured by Agilent Technologies

The UV-2450 is a versatile ultraviolet-visible (UV-Vis) spectrophotometer designed for a wide range of analytical applications. It features a wavelength range of 190 to 1100 nanometers, allowing for the analysis of a variety of samples. The instrument provides accurate and reliable measurements, making it a valuable tool for researchers and laboratories.

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2 protocols using uv 2450

1

Comprehensive Spectroscopic Characterization

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1H and 13C NMR spectra were recorded on a JEOL ECX NMR spectrometer. FTIR
spectra of neat samples were recorded on a Carry-660 spectrophotometer.
HRMS-electrospray ionization (ESI) spectra were recorded on a Bruker
maXis impact HD instrument. UV–vis and fluorescence spectra
were recorded on a Shimadzu UV-2450 and a Cary Eclipse spectrophotometer,
respectively. Solid-state emission was recorded by preparing a thin
film of compounds on a quartz plate using the drop-cast method. Solvents
and chemicals were purchased from commercial sources and used without
further purification. Spectroscopic grade solvents were used for photophysical
studies. Melting points were recorded using a Stuart melting point
instrument. TGA was performed on a PerkinElmer Pyris 1 and NETZSCH
STA449 F1 Jupiter instrument under a nitrogen atmosphere at a heating
rate of 10 °C per minute. The temperature of degradation (Td) was correlated with a 5% weight loss. SC-XRD
studies were performed on an Agilent Technologies X-ray diffractometer.
3D structure visualization and exploration of crystal packing were
done using Mercury software. The absolute quantum yields (both solid
and solution state) were calculated using an integrating sphere on
a Fluorolog instrument (Horiba Scientific). DCM solutions of compounds
were used to calculate the absolute quantum yield. The lifetime data
were measured on an Agilent lifetime instrument.
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2

Perovskite Photodetector Characterization

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The film morphology was studied by scanning electron microscopy (SEM, Thermo Fisher). The X-ray diffraction (XRD) measurement was performed by employing the Rigaku Smart lab diffractometer. The absorption of the samples was measured using a UV-vis spectrophotometer (Cary UV-2450). Thermogravimetric analysis was performed by TGA (TA Instruments). The current–voltage (IV) and current–time (It) characteristics of the photodetector were measured using the Keithley 2400 system source meter that was attached to a computer through a GPIB 488A interface. For white light illumination, a Sinus-70 solar simulator (WAVELABS Solar Metrology Systems GmbH) was used for measuring the photo-response of the fabricated ITO/SnO2/Bi-perovskite/carbon device. The photocurrent-time characteristic curves were measured under standard AM 1.5 sunlight (100 mW cm−2). Fig. 2 shows a perovskite photodetector cell configuration. All measurements were performed under ambient atmosphere.
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