Lext ols3000
The LEXT OLS3000 is a laser scanning microscope designed for high-resolution, non-contact surface analysis. It utilizes a laser light source and a high-precision scanning mechanism to capture detailed topographic information about sample surfaces.
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6 protocols using lext ols3000
Comparative TEM Sample Preparation Analysis
Surface Topography Analysis of Dental Specimens
Characterizing Porous Matrix Mechanics
The porosity of the matrix leading to the calculation of the hypothetical density of the non-porous matrix was determined using confocal laser scanning microscopy (Lext OLS 3000, Olympus). The value used was the average of 10 measurements. The measurement was performed as the rate analysis of void cross-section sum in fracture area in optical mode [32 (link)].
The tensile test was performed using a universal static material testing machine (ZWICK Z010 ROELL). The strain rate was 30 mm∙min−1. Tensile modulus (E), ultimate strength (σFmax), ultimate strain (εFmax), and specific energy needed for ultimate strength achievement (AFmax) were determined from the measurement. The tensile modulus was determined from the linear part of the tensile curve in the strain range of 0.05–0.25 % [32 (link)]. Each sample series included five tested samples to achieve good reproducibility of results.
Plasma-Induced Surface Topography Analysis
Surface Characterization of Plasma-Treated Samples
The surface microstructures of the specimens were evaluated using a scanning electron microscope (SEM; JSM-7800F Prime, JEOL, Tokyo, Japan) at an accelerating voltage of 5.0 kV and a working distance (WD) of 6.0 mm at 3000×, 10,000×, and 30,000× magnifications (n = 1).
Characterization of DVS-BCB Bonding Layer
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