Jem 2100hr
The JEM-2100HR is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed for high-resolution imaging, electron diffraction, and analytical applications. The JEM-2100HR features a LaB6 electron source and can achieve a point resolution of 0.19 nm.
Lab products found in correlation
35 protocols using jem 2100hr
Characterization of Silica Nanoparticles by TEM and DLS
Morphological Characterization of Samples
Particle Size and Morphology of SKM-1 and Mi-HAP
SKM-1 and Mi HAP samples were suspended at 50,000 ppm in the maintenance medium (Episkin, France), and the particle size distribution of each sample was measured using a laser diffraction particle size distribution analyzer (LA-950, HORIBA Ltd, Japan).
Characterization of Bioconjugated Lanthanide Nanoparticles
Structural Analysis of CdS Quantum Dots
Characterization of DLCL Nanoparticles
Characterization of BT, IS and BTIS
Synthesis and Characterization of ZnO Nanoparticles
Characterization of DE/ZnO Composite
Characterization of Gold Nanoparticles
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