D500 x ray powder diffractometer

Fluorescence spectra were measured using a Shimadzu (Tokyo Japan) Model RF-5000 spectrofluorophotometer with a Model DR-15 controller unit and a 150 W Xenon lamp as a light source. The UV-visible absorption measurements of the samples were carried out on a Shimadzu UV/Vis-160 spectrophotometer. The pH was measured with a Crison (Barcelona, Spain) GLP 21 pHmeter. Transmission electron microscopy (TEM) was performed on a ZEISS EM-900 device (Oberkochen, Germany). X-ray powder diffraction (XRD) patterns were recorded on a Siemens (Berlin, Germany) D500 X-ray powder diffractometer equipped with graphite monochromatized high-intensity Cu-Kα radiation (λ = 154.050 pm). The refraction index of the samples was determined with an Abbé refractometer (refractometer.com/abbe-refractometer). The infrared spectra (IR) of the samples were measured using a FT-IR Perkin-Elmer Model 1700 spectrometer and the KBr pellets technique with 100 mg of KBr and approximately 0.5 mg of the substance that is being studied.

Diffractograms were obtained using a Siemens D500 X-ray powder diffractometer (Karlsruhe, Germany) with Cu Kα radiation (λ = 0.15418 nm). The diffraction was examined in the range of 10° to 80°.

Experiments were performed using a D500 X-ray
powder diffractometer (Siemens, Germany) in reflection mode (θ–2θ
scans) with a Cu-Kα radiation source (λ = 1.54 Å)
and a scintillation counter at an angular resolution slightly better
than 0.1°. The diffractometer was equipped with an evacuated
temperature controlled TTK sample chamber (Paar, Austria). To achieve
sub-ambient temperature ranges, the chamber was connected to a liquid
nitrogen reservoir. The polymer powder, which scattered isotropically,
was deposited on an aluminum plate (fabricated in the lab) and placed
on a brass block. The temperature was varied by resistive heating
through controlling the current. The temperature was measured by a
thermometer at the bottom of the heated brass block. This temperature
was calibrated to the sample temperature by measuring the actual temperature
at the surface of the polymer samples in a control experiment using
an external thermocouple (Mini Dual K/J Thermometer, Uni-T, Munich,
Germany). Data points of the XRD patterns obtained from the polymers
were collected over a range of the scattering angle between the incident
beams and diffracted beam (2θ) from ≈1.8° to 30°
at steps (Δ2θ) of 0.04°, each measured for 10 s.
Changes in position and intensity of peaks of the diffracted X-rays
were measured upon crystallization and melting of the polymers.