Surface topography was investigated on the specimens of each subgroup using a three-dimensional (3-D) confocal laser scanning microscopy (CLSM; LEXT OLS3000, Olympus, Tokyo, Japan) at 50× magnification. The areal texture parameters were obtained using a software (LEXT-OLS, version 6.0.3, Olympus, Tokyo, Japan): Sa, the arithmetic mean height; Sq, the root mean square height; and Sv, the maximum pit height of the scale-limited surface according to ISO 25178 [20 (link)]. Surface measurements were processed with the form and outlier eliminated. Tilt was corrected and a 3-D surface was constructed with the distance to the optical center in the X axis, the tilt angle on the Y axis, and the flatness error on the Z axis. A robust short wavelength pass Gaussian filter (cut-off wavelength: 10 μm) was applied to the data in order to decompose waviness from roughness. For each specimen, three different measurements (effective field of view was 256 × 192 μm) on the either polished sides for controls or sandblasted sides for experimental subgroups were performed. A total of 30 measurements was obtained for each subgroup.
Lext ols
Manufactured by Olympus
Sourced in Japan
The LEXT-OLS is a non-contact 3D surface profiler developed by Olympus. It utilizes laser scanning confocal microscopy technology to provide high-resolution, three-dimensional measurements of surface topography. The LEXT-OLS is designed for a wide range of sample types and applications that require precise surface analysis.
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Lab products found in correlation
2 protocols using lext ols
1
Surface Topography Analysis of Dental Specimens
2
Thermal Treatment Microstructure Analysis
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Initial material as well as samples after different thermal treatment were subjected to microscopic metallographic study. Samples were etched by Kroll and then their microstructure documented by a confocal laser microscope LEXT OLS (Olympus).
For microstructure study of the samples subjected to the A, B, and C thermal treatments, a REM Tescan VEGA 5135 microscope supplemented by a Digital Microscopy Imaging software and X-Ray microanalyserNoran Six/300 (VLSTD detector) were used. For majority of images, surfaces, magnifi cation of 500 was used so that differences in structure could be distinguished.
For microstructure study of the samples subjected to the A, B, and C thermal treatments, a REM Tescan VEGA 5135 microscope supplemented by a Digital Microscopy Imaging software and X-Ray microanalyserNoran Six/300 (VLSTD detector) were used. For majority of images, surfaces, magnifi cation of 500 was used so that differences in structure could be distinguished.
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