Tesp v2
The TESP-V2 is a laboratory equipment product from Bruker. It is a tool used for scientific analysis and measurement purposes. The core function of the TESP-V2 is to perform tasks related to the intended application of the equipment. Further details about the specific capabilities and intended use of the TESP-V2 are not available in this response.
Lab products found in correlation
7 protocols using tesp v2
AFM Characterization of TPAni Nanoparticles
Fabrication of Decane Droplets on Glass
Antibacterial Efficacy of Compound 1 on B. cereus
Atomic Force Microscopy Analysis of Amyloid-Beta Fibrils
Comprehensive Polymer Characterization Protocol
Comprehensive Materials Characterization Protocol
Atomic Force Microscopy (AFM) was performed with a Veeco Multimode AFM connected to a Nanoscope V controller was used to image the substrate. AFM measurements were performed in tapping mode in air using a TESP-V2 (Bruker, K = 42 N m -1 ) cantilever.
Contact angles were measured using a Ramé-Hart contact angle system (Model 290). The average contact angle value was obtained by dispensing 1 µL-droplets of Milli-Q water at five different positions on the film-modified substrates. Cyclic voltammetry (CV) was performed using a Gamry REF600 potentiostat. Gold electrodes were prepared by sputtering on glass substrates employing a thin layer of Ti to improve the adhesion. The electrochemical cell was a three electrodes Teflon cell with 2 ml volume capacity. The Au working electrodes sealed with an o-ring defining an electroactive area of 0.145 cm2. The counter electrode was a Pt wire and a Ag/AgCl (3 M NaCl) electrode was employed as reference.
Bacterial Biofilm Quantification on Plastics
For qualitative assessment of biofilm structure, a random collection of 8 samples was chosen for scanning electron microscopy (SEM) using Inspect S50 (FEI, Hillsboro, OR, USA), as described previously (Zettler et al., 2013) . Some of the samples were also analyzed by atomic force microscope (AFM) to get more resolved insight of the surface, using a Nanoscope V in dynamic mode (Bruker instruments, Madisson, WI, USA) and standard silicon probes (Bruker, TESP-V2) (Binnig and Quate, 1986) .
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