Tecnai f20 x twin

Distribution of silver-casein complexes size was investigated by transmission electron microscopy (FEI Tecnai F20 X-Twin, Hillsboro, OR, USA) and scanning electron microscopy (LEO 1430 VP) coupled with energy dispersive X-ray detector (XFlash 4010, Bruker AXS, Berlin, Germany). The samples for TEM analysis were dropped on the carbon-coated grid and the excess solution was removed, while for SEM analysis the powdered samples were used.

The size of synthesized LCLB56-AgCs size was measured using transmission electron microscopy (TEM, FEI Tecnai F20 X-Twin) and scanning electron microscopy (SEM, LEO 1430VP) in tandem with EDX detector (XFlash 4010, Bruker AXS). A sample solution was applied to a carbon-coated copper grid. Then, the sample was subjected to drying. X-ray analysis diffraction (XRD) was used for determination and characterization of the crystal structure. The LCLB56-AgCs sample was deposited onto the glass slide and then recorded by X-ray diffractometer (X’Pert Pro Analytical Phillips) equipped with Ni filter and Cu Kα (λ = 1.54056 Å) radiation source.

The atomic structure of the samples was observed by a high-resolution transmission electron microscope (HRTEM FEI Tecnai F20 X-Twin, Brno, Czech Republic) at an accelerating voltage of 200 kV. Raman spectra were obtained by a Renishaw InVia Raman analyzer (laser wavelength 532 nm, Renishaw Company, Gloucestershire, UK). X-ray photoelectron spectroscopy (XPS, PHI5000 VersaProbe II Scanning XPS Microprobe, Chigasaki, Japan) measurements were performed using a monochromatic Al Kα x-ray source. Survey spectra were recorded for all samples in the energy range of 0 to 1300 eV with a 0.5 eV step, high-resolution spectra were recorded with a 0.1 eV step.

Native bLTF and Fe-bLTF complex was dispersed in ethanol, placed on a carbon-coated copper grid (Lacey Carbon Support Film 400 mesh; Electron Microscopy Sciences), and dried at room temperature. Subsequently, the samples were subjected to analysis by transmission electron microscope (TEM) (FEI Tecnai F20 X- Twin, Hillsboro, OR, USA) coupled with an EDX detector.

All samples surface morphologies were observed using a Quanta scanning electron microscope with field emission (SEM, Quanta 3D FEG, Huston, TX, USA). Additionally, the morphology and the structure of TiO₂ coatings were observed by conventional micrographs with transmission electron microscopy TEM (TEM; Tecnai F20 X-Twin, FEI Company, Portland, OR, USA). In order to check and to confirm the amorphousness of the systems, Raman spectroscopy ((Spectrometer RamanMicro 200 PerkinElmer (PerkinElmer Inc., Waltham, MA, USA) (λ = 785 nm)) has been used.

The atomic structure of the obtained materials was analyzed using a high-resolution transmission electron microscope (HRTEM FEI Tecnai F20 X-Twin, Brno, Czech Republic) at an accelerating voltage of 200 kV. A scanning electron microscope operating at 30 kV (SEM, 1430 VP, LEO Electron Microscopy Ltd., Oberkochen, Germany) was used to determine the structure of the samples. The elemental composition of the materials was analyzed by means of a combustion elemental analyzer (Vario MACRO CHN, Elementar Analysensysteme GmbH, Langenselbold, Germany). Raman-microscopic spectroscopy analysis was performed using Renishaw InVia (Renishaw Company, Gloucestershire, the United Kingdom), excitation wavelength 532 nm at an ambient temperature. Nitrogen sorption isotherms were determined through nitrogen physisorption at 77 K in a volumetric apparatus ASAP 2010 (Micromeritics, Norcross, GA, USA). The attachment, bonding configuration, and compositional analysis of the material was carried out by X-ray photoelectron spectroscopy measurements (XPS, PHI5000 VersaProbe II Scanning XPS Microprobe, Chigasaki, Japan). A monochromatic Al-Kα X-ray (1486.6 eV) was used as the operating excitation source. Atomic Force Microscopy (AFM) investigations were conducted using a Scanning Probe Microscope (SPM) apparatus produced by Veeco (Digital Instrument, USA), working under ambient conditions.

The investigations were conducted with scanning electron microscope (SEM) capable of imaging in scanning transmission electron microscopy (STEM) mode, model Hitachi S5500 equipped with EDX system. Observations were performed under accelerating voltage of 30.0 kV in transmission and surface mode. Samples were prepared by dispersion in deionized water. Droplets of the solution were deposited onto carbon-coated copper TEM grids (Lacey Carbon Support Film 400 mesh; Electron Microscopy Sciences) and dried on air at room temperature. STEM and SEM observations were performed using secondary electron (SE) detector and STEM detector. X-ray mode in DF (dark field) phase contrast and BF (bright field) contrast were used. Moreover, as-prepared samples of AgLTF45, AgLTF450, and AgLTF1200 were subjected to TEM-SAED. The analysis was performed on FEI Tecnai F20 X-Twin (Hillsboro, OR, USA).