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Ace200 low vacuum sputter coater

Manufactured by Leica
Sourced in Germany

The ACE200 is a low vacuum sputter coater manufactured by Leica. It is designed to deposit thin conductive coatings on samples for use in scanning electron microscopy and other applications requiring conductive specimens.

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4 protocols using ace200 low vacuum sputter coater

1

Visualizing Silk Nanoparticle Morphology

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Scanning electron microscopy
(SEM) was used to visualize the morphology of the nanoparticles. Lyophilized
silk nanoparticles were resuspended in distilled water to a concentration
of 1 mg mL–1. The samples were then pipetted onto
a silicon wafer and lyophilized overnight. The specimens were sputter-coated
with 15 nm of gold using an ACE200 low vacuum sputter coater (Leica
Microsystems, Wetzlar, Germany) and analyzed with an FE-SEM SU6600
(Hitachi High Technologies, Krefeld, Germany) at 5 kV. The SEM images
were processed using ImageJ v1.52n (National Institutes of Health,
Bethesda, MD, U.S.A.).
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2

Silk Microfibre Imaging and Analysis

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B. mori and Tasar silk microfibre suspensions were adjusted to a concentration of 10 mg/mL. A 20 μL suspension of microfibres was pipetted onto a silicon wafer and lyophilised for 24 h at −10 °C and 0.14 mbar. The dried samples were sputter-coated with 15 nm of gold using an ACE200 low-vacuum sputter-coater (Leica Microsystems, Wetzlar, Germany). The fibre samples were imaged using field emission scanning electron microscopy (FE-SEM; SU6600 instrument; Hitachi High Technologies, Krefeld, Germany) with a 5 kV accelerating voltage. The hydrogel samples were imaged with Quanta FEG-ESEM (FEI company, Hillsboro, OR, USA; now part of Thermo Fisher Scientific Inc., Waltham, MA, USA). The images were processed using ImageJ for Windows 1.8.0 (National Institutes of Health, Bethesda, Rockville, MI, USA).
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3

Silk Nanoparticle Morphology Characterization

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The morphology of the prepared silk nanoparticles was assessed by scanning electron microscopy (SEM) using a FE-SEM SU6600 instrument (Hitachi High Technologies, Krefeld, Germany) at 5 kV. Samples were pipetted onto a silicon wafer and lyophilized overnight. The specimens were coated with gold (15 nm thickness) using an ACE200 low vacuum sputter coater (Leica Microsystems, Wetzlar, Germany). The SEM images were processed using ImageJ v1.51j8 (National Institutes of Health, Bethesda, MD).34 (link)
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4

Physicochemical Characterization of Silk Nanoparticles

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Particle size and zeta potential of native and PEGylated silk nanoparticles were determined by dynamic light scattering (DLS, Zetasizer Nano-ZS Malvern Instrument, Worcestershire, UK) in ddH 2 O unless otherwise stated. Refractive indices of 1.33 for ddH 2 O and 1.60 for protein were taken for computation of particle size. The native and PEGylated silk nanoparticles were stored at 25 ºC and zeta potential and size were determined at day 0 and 28. The impact of pH on the zeta potential of native and PEGylated silk nanoparticles was determined by suspending them in 0.01 M phosphate buffer saline (PBS) at pH 4.5 to 8.5 and measuring the resulting zeta potential.
For stability and aggregation studies SNPs and PEG-SNPs particles were added to 0.1 M phosphate buffer and DLS measurements were performed.
Scanning electron microscopy (SEM) was used to visualise particles. Native and PEGylated silk nanoparticles were diluted with distilled water to a concentration of 1 mg/ml. The samples were then pipetted onto a silicon wafer and lyophilized overnight. The specimens were sputtercoated with 20 nm of gold using ACE200 Low Vacuum Sputter Coater (Leica Microsystems, Wetzlar, Germany) and analysed with a FE-SEM SU6600 (Hitachi High Technologies, Krefeld, Germany) at 5 kV and a 40,000-fold magnification.
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