Geigerflex
The Geigerflex is a versatile and reliable X-ray diffractometer system designed for a wide range of applications in materials science and research. It utilizes Geiger-Müller tubes to detect and analyze X-ray diffraction patterns, providing users with detailed information about the crystallographic structure and composition of their samples.
Lab products found in correlation
12 protocols using geigerflex
Characterization of nHA/PEEK Composites
Synthesis and Characterization of Nanostructured Fluorapatite
Comprehensive Particle Characterization Using SEM, XRD, and AFM
X-Ray Diffraction Analysis of Samples
Preparation and Characterization of PTX-Loaded Bi(mPEG-S-S)-TPE Micelles
XRD analysis was used to analyze the crystalline characteristic of PTX in the micelles (Geigerflex, Rigaku Co., Tokyo, Japan). Data were collected from 5° to 50° with a step-scan mode. The dynamic light-scattering method was employed to determine the particle size and zeta potential of PTX-loaded micelles (Zetasizer Nano-ZS90, Malvern Instruments, Malvern, UK). The drug loading (DL) and encapsulation efficiency (EE) were calculated using Equations (2) and (3), respectively.
Comprehensive Characterization of Synthesized Particles
The crystal structure was identified using an X-ray diffractometer (XRD, Rigaku Geigerflex, Tokyo, Japan). The XRD patterns were obtained at 30 kV and 15 mA, within the range of 10–70° at a scanning rate of 1°/min [15 (link)].
The morphology of the synthesized particles was examined using scanning electron microscopy (SEM, Philips XL30, Amsterdam, The Netherlands), with a voltage of 15 kV. Particles were mounted on the sample stage of the SEM and coated with a platinum-sputtered coating [16 (link)].
The particle sizes and zeta potential were detected by dynamic light scattering (DLS, Malvern, Worcestershire, UK) at 25 °C. The zeta potential was determined with electrophoretic mobility at pH 7.4. The sample was dispersed in ddH2O to measure the mean size.
The pore size distribution and specific surface area were analysis by Brunauer, Emmett, and Teller (BET; Micromeritics ASAP2010, Norcross, GA, USA) using nitrogen gas adsorption–desorption isotherms.
Phase Composition Analysis of C₃S and Fe/C₃S Powders
Paclitaxel-Loaded mPEG-CS-Hz-CH Micelles
For characterization, X-ray diffraction analysis was performed (Geigerflex, Rigaku Co., Tokyo, Japan). The DLS technique was used to measure the particle size and zeta potential of the PTX-loaded mPEG-CS-Hz-CH micelles (Malvern Instruments Zetasizer Nano-ZS90, Malvern, UK). The morphology of the PTX-loaded micelles was observed by transmission electron microscopy (TEM, HT7700, Hitachi Ltd., Tokyo, Japan). The drug encapsulation efficiency (EE%) and drug loading (DL%) were determined by an HPLC system at 227 nm, and the following equations were used for calculation [29 (link)].
Structural Characterization of Tendon Chitosan
The density of the tendon chitosan–ZnCl2 complex was measured by flotation with a carbon tetrachloride–m-xylene solution.
X-ray Diffraction Analysis of PTX-Loaded Micelles
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