The morphology was characterized via scanning electron microscope (SEM) and transmission electron microscope (TEM). SEM measurement was performed with a SU8010 microscope (SEM, Hitachi Co., Tokyo, Japan) at an accelerated voltage of 10 kV. TEM was performed on a JEM-2100 microscope (JEOL Ltd., Tokyo, Japan) with an acceleration voltage of 200 kV. X-ray photoelectron spectroscopy (XPS) spectra were obtained on a PHI5300 (USA, Perkin Elmer, Waltham, MA, USA) with Mg Kα being the excitation source. All electrochemical experiments were carried out on an Autolab Electrochemical Station (PGSTAT302N, Metrohm, Herisau, Switzerland). In cyclic voltammetry (CV) and differential pulse voltammetry (DPV) measurements, a simple three-electrode system was adopted. Briefly, 3DG, p-3DG, or VMSF/p-3DG were used as the working electrodes. Platinum wire or platinum sheet was employed as the counter-electrode. For the nonaqueous experiment, a Ag/Ag+ (10 mM Ag+/acetonitrile solution) electrode was used as the reference electrode. For aqueous electrolyte, Ag/AgCl (saturated KCl solution) was employed as the reference electrode. DPV parameters included a step potential of 5 mV, pulse amplitude of 25 mV, pulse time of 0.05 s, and time interval of 0.2 s.
Su8010 microscope
Manufactured by Hitachi
Sourced in Japan
The Hitachi SU8010 is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging. It provides a maximum accelerating voltage of 30 kV and a resolution of up to 0.8 nm. The SU8010 is equipped with various detection systems, including a secondary electron detector, a backscattered electron detector, and an energy-dispersive X-ray (EDX) spectrometer.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (4 mentions)
250xi system, by Thermo Fisher Scientific (2 mentions)
Jem 2100 microscope, by JEOL (1 mentions)
Phi5300, by PerkinElmer (1 mentions)
Pgstat302n, by Metrohm (1 mentions)
D8 advance x ray, by Bruker (1 mentions)
Uv 3600, by Shimadzu (1 mentions)
Icpe 9820, by Shimadzu (1 mentions)
Icp ms, by Agilent Technologies (1 mentions)
Ft ir 4600 spectrometer, by Jasco (1 mentions)
Tristar 3000, by Micrometrics (1 mentions)
Eca 400 spectrometer, by JEOL (1 mentions)
D8 advance x ray diffractometer, by Hitachi (1 mentions)
Quantera 2, by Physical Electronics (1 mentions)
D8 focus advance diffractometer, by Bruker (1 mentions)
Asap 2020, by Micromeritics (1 mentions)
D2 phaser diffractometer, by Bruker (1 mentions)
Jem f200 microscope, by JEOL (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
Jem arm200f microscope, by JEOL (1 mentions)
17 protocols using su8010 microscope
1
Characterization of 3D Graphene Morphology
2
Comprehensive Material Characterization Protocol
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XPS measurements were performed with a Thermo Scientific 250Xi system with monochromatic Al Kα as the excitation source. The XRD patterns were recorded with a Bruker D8 Advance X-ray diffractometer with Cu Kα radiation (λ = 1.5406 Å) operated at 40 kV and 40 mA. The BET tests were performed by an ASAP 2460 with N2 analysis adsorptive at 77.2 K. SEM images were taken using a Hitachi SU-8010 microscope equipped with EDS at 30 kV. TEM images were taken using a Hitachi 7650 microscope operated at 100 kV. UV-DRS spectra was taken with a Shimadzu UV-3600 with a resolution of 0.1 nm. The ICP-MS measurement was performed with a NexION 300X (detection limit 1 μg/L).
3
Morphological Analysis of Agglomerates
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The morphology of the agglomerates was obtained with SEM micrographs. To make the electrical conductivity of the samples meet the requirements for SEM observation, PM samples were previously covered with a gold film. Each of the samples was viewed in secondary electron mode using a Hitachi SU8010 microscope operated at an accelerating voltage of 15 kV with a resolution of 1.0 nm. Particle size analysis was carried out on SEM images using commercial graphic processing software package, Image-Pro Plus 6.0. The corresponding column distribution map was generated in this way.
4
Characterization of Theophylline-Loaded Microspheres
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The FT-IR spectra were recorded on a Jasco FT/IR-4600 spectrometer by diffusing the samples in KBr pellets. 13C cross polarization magic angle spinning (CP/MAS) NMR spectra were obtained using a JEOL ECA-400 spectrometer operated at 100.53 MHz. The amount of theophylline residues in the microspheres was estimated from the nitrogen content of the elemental analysis, recorded on a PERKIN ELMER Series II CHNS/O Analyzer 2400 II. SEM observations were performed using a HITACHI SU-8010 microscope at 1.5 kV after the samples were sputtered with Pt particles. The particle size distribution of the microspheres was measured by dynamic light scattering (DLS) (Otsuka Electronics Co. Ltd., Fiber Optics Particle Analyzer FPAR-1000) in methanol under sonication. N2 adsorption/desorption isotherms were obtained using a Micrometrics Tristar-3000 instrument at liquid-nitrogen temperature, whereby all samples were degassed at 120 °C under a vacuum for 3 h prior to analysis. All experiments concerning the adsorption equilibria were performed using a batch-wise method at 30 °C in a bio-shaker (TAITEC Co., Ltd, Bio Shaker BR-23FH). The metal ion content in the aqueous solutions was measured by inductively coupled plasma spectrophotometry (SHIMADZU, ICPE-9820) and inductively coupled plasma mass spectrometry (ICP-MS) (Agilent, 7700X ICP-MS).
5
Advanced Materials Characterization Techniques
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XPS measurements were performed with a Thermo Scientific 250Xi system with monochromatic Al Kα as the excitation source. XRD patterns were recorded with a Bruker D8 Advance X-ray diffractometer with Cu Kα radiation (λ = 1.5406 Å) operated at 40 kV and 40 mA. SEM images were taken using a Hitachi SU-8010 microscope equipped with EDS at 30 kV. TEM images were taken using a Hitachi 7650 microscope operated at 100 kV.
6
Morphological Analysis of Dehydrated Corn Starch
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To observe the morphological features, the dried starch samples with DH values of 15, 25, and 45 were fixed in glutaraldehyde and a scanning electron microscope (SEM) analysis was performed using an SU8010 microscope (Hitachi, Japan); representative images were obtained. Untreated native corn starch was used as a control. The samples were coated with gold prior to observation and then examined at an accelerating voltage of 5 kV and 2500× magnification [20 (link)].
7
Characterization of Pd Nanoparticles on rGO
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Powder X-ray diffraction (XRD) analyses were performed on a Bruker D8-FOCUS Advance diffractometer with Cu Kα radiation (λ = 1.540598 Å). The average crystal size of the Pd nanoparticles was subsequently calculated using the Scherrer equation (D = 0.9λ/β cos θ, where λ = 1.540598 Å is the wavelength of the X-ray, β is the full-width at half-maximum height and θ is the diffraction angle).48 (link) Surface morphology of the prepared catalyst was characterized by scanning electron microscopy (SEM) on a Hitachi-SU8010 microscope. Transmission electron microscopy (TEM) analysis on the catalysts was carried out on Tecnai G220 microscope. The surface composition of the IE-Pd/rGO catalyst was analyzed using a ULVAC-PHI Quantera II photoelectron spectroscopy (XPS) system with Al Kα radiation (hν = 1486.6 eV). The thermogravimetric (TG) analysis was carried out on a STA449F3 thermogravimetric analyzer under an O2 atmosphere from 30 to 800 °C at a heating rate of 10 °C min−1. Pd loading of the catalysts was calculated from the residual weight ratio at 800 °C of the sample (xPd = wreMPd/MPdO, where wre is the residual weight ratio of the sample, MPd and MPdO are the molecular weight of Pd and PdO, respectively).
8
Powdery Mildew Resistance Testing
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Conidia of powdery mildew (Podosphaera xanthii) were pre-cultured and maintained on living cucumber plants growing in the greenhouse. For the disease resistance test, spores were washed down and re-suspended in a water solution containing 0.01% Tween-20. The solution was then filtered through gauze, and the spore concentration was adjusted to 106 mL−1. Cucumber plants were inoculated with the spore solution by spraying evenly on their surface, and plants sprayed with water containing 0.01% Tween-20 served as the controls. For scanning electron microscopy examination of pathogens, infected leaf tissues were examined with an SU8010 microscope (Hitachi).
9
Characterization of N-doped Carbon Nanoparticles
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A Hitachi SU8010 microscope was used to perform scanning electron microscopy (SEM) imaging of the N-CNPs and N-CNPs-NH3 materials. TEM was carried out on a Tecnai F30 field-emission transmission electron microscope. X-ray diffraction experiments were conducted on a Bruker D8 Advance X-ray diffractometer with a Cu Kα radiation source (λ = 1.5406 Å). An AMICUS/ESCA 3400 electron spectrometer was used to collect the XPS spectra by using Mg Kα (12 kV, 20 mA) radiation. The C 1s line at 284.8 eV was used as the reference. A Micromeritics ASAP 2020 apparatus was used to analyze the Brunauer–Emmett–Teller (BET) specific surface area (SSA) and the Barrett–Joyner–Halenda (BJH) pore structure of the prepared materials at 77.35 K via the N2 adsorption–desorption method. Chemical mapping was conducted with a JEM-ARM 200F microscope operating at 200 kV.
10
Synthesis of Au@SnO2 Core-Shell Nanoparticles
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The suspension of
Au nanoparticles with an average particle diameter of 15 nm was first
prepared using a citrate reduction method according to the previous
report.25 (link) The SnO2 layer on
the Au nanoparticles was then carried out using a chemical precipitation
method.34 (link) 5 mL of Na2Sn2O3 solution (40 mM) was added to 150 mL of Au nanoparticle
suspension. The mixed solution was stirred at 75 °C for 20 min
and then naturally cooled to room temperature. Subsequently, the reaction
solution was centrifuged and washed 3 times with deionized water to
collect the Au@SnO2 core–shell nanoparticles. Scanning
electron microscopy (SEM) images were taken with a Hitachi SU-8010
microscope. Transmission electron microscopy (TEM) images were taken
with a JEOL JEM-F200 microscope. X-ray diffraction (XRD) patterns
were recorded on a Bruker D2 PHASER diffractometer.
Au nanoparticles with an average particle diameter of 15 nm was first
prepared using a citrate reduction method according to the previous
report.25 (link) The SnO2 layer on
the Au nanoparticles was then carried out using a chemical precipitation
method.34 (link) 5 mL of Na2Sn2O3 solution (40 mM) was added to 150 mL of Au nanoparticle
suspension. The mixed solution was stirred at 75 °C for 20 min
and then naturally cooled to room temperature. Subsequently, the reaction
solution was centrifuged and washed 3 times with deionized water to
collect the Au@SnO2 core–shell nanoparticles. Scanning
electron microscopy (SEM) images were taken with a Hitachi SU-8010
microscope. Transmission electron microscopy (TEM) images were taken
with a JEOL JEM-F200 microscope. X-ray diffraction (XRD) patterns
were recorded on a Bruker D2 PHASER diffractometer.
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