Mira3 lmu

X-ray diffractograms (XRDs) were collected in an Empyrean X-ray Diffractor (Panalytical, Malvern, UK), using CuKα radiation at an angle 2θ between 5 and 70°, with a 0.02 step and 30 s of collection time. Fourier-transform infrared spectra (FTIR) were recorded in a spectrophotometer (Cary 630, Agilent Technologies, Santa Clara, CA, USA) from 4000 to 500 cm⁻¹ in absorbance mode, with 32 scans and 4 cm⁻¹ of resolution. To determine the morphology, scanning electron microscopy (SEM) was applied in an FE-SEM (TESCAN, model MIRA 3 LMU, Brno, Czech Republic), with a voltage of 15 kV. Particle size, polydispersity index, and ζ-potential were determined by dynamic light scattering (DLS) in a Zetasizer Nano ZS90 (Malvern Instruments, Malvern, UK) at 25 °C and a pH of 7, adding 1 mL of a diluted solution of 1 mg/mL (10-fold) ZnLHS and thymol–ZnLHS. High-resolution Raman spectroscopy was conducted in a SmartRaman (DXR2, Thermo Fisher Scientific, Waltham, MA, USA), with 780 nm laser excitation, 50 mW, and a slit of 50 µm; the acquisition time was 150 s at 3 cm⁻¹ of resolution. The spectra were recorded between 1100 and 150 cm⁻¹. Thermogravimetric analyses were carried out on a Discovery thermobalance (TGA5000, TA Instruments, New Castle, DE, USA). TG curves were registered by heating sample masses from 50 to 600 °C, using a ramp of 10 °C min⁻¹, under a nitrogen atmosphere.

The analysis of the crystalline structure of the calcined powders was conducted by X-ray diffraction (XRD) using an Empyrean diffractometer (PANalytical, Westborougj, MA, USA) (CuKα1 radiation). On the other hand, the morphology was analyzed using a SEM (TESCAN, MIRA 3 LMU, Brno, Czech Republic). The chemical surface analysis and the oxidation elements states for h-YMnO₃ were performed with XPS (Thermo Scientific K-α, E. Grinstead, UK), with a monochromatic source Al Kα (1486 eV). In a complementary way, transmission electron microscopy (TEM), using a Jeol JEM1010 microscope (Tokyo, Japan), was used.

The constituents of metal hydroxides and Cu-Zn-Sn-O were determined using chemical methods. The sizes of hydroxides and Cu-Zn-Sn-O were measured by Zeta Sizer (Zano-ZS). The surface and cross-section views of prepared CZTO precursor layers and the surface and cross-sectional morphology of the CZTS thin films were conducted by FESEM (TESCAN MIRA3 LMU). The compositions of precursor layers and CZTS thin films were determined by EDX (Oxford X-Max20). Phase information was conducted from the XRD (λ = 1.54 Å, 40 kV acceleration voltage). The further phase differentiation was tested with Raman (LABRAM-HR). Carrier concentration, hall mobility, and resistivity of CZTS thin films were measured by Hall effect measurements (HMS-3000/0.55T). The transmittance spectrum of CZTS thin films was characterized by a UV-Vis spectrophotometer (HITACHI U-4100) in wavelength coverage of 300–900 nm.