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Optima 4300dv spectrometer

Manufactured by PerkinElmer
Sourced in United States

The Optima 4300DV spectrometer is an inductively coupled plasma optical emission spectrometer (ICP-OES) designed for multi-element analysis. It utilizes a dual-view optical system to perform simultaneous axial and radial plasma observations. The instrument is capable of detecting and quantifying a wide range of elements in various sample types.

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6 protocols using optima 4300dv spectrometer

1

Characterization of Heterogeneous Catalysts

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The Brunauer–Emmett–Teller
(BET) surface area40 (link) of the samples was
determined by N2 physisorption at −196 °C using
a BELSOPRP-mini instrument (MicrotracBEL, Osaka, Japan). Prior to
the analysis, the samples were degassed at 200 °C for 2 h.
The crystallinity of the catalyst components was assessed via XRD
using an X′Pert PRO instrument (PANalytical, Malvern, United
Kingdom). The patterns were recorded between 5 and 120° using
Cu Kα radiation (wavelength = 1.54 Å) with a step size
of 0.017°.
Temperature-programmed reduction with H2 (H2-TPR) was performed on an AutoChem II instrument
(Micromeritics,
Norcross, USA) by heating the sample at 10 °C/min from room temperature
to 900 °C while dosing 50 mL/min of 10%H2/Ar. Before
the reduction step, adsorbed species were removed by heating the sample
in 50 mL/min of He from room temperature to 200 °C.
For
all catalyst samples, Ni and Pt metal loadings were determined
by inductively coupled plasma optical emission spectroscopy (ICP-OES)
using an OPTIMA 4300 DV spectrometer (PerkinElmer, Waltham, USA).
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2

Comprehensive Characterization of Nanomaterials

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The crystal phases of the products were characterized by X-ray powder diffraction using a Bruker D8 Discover X-ray diffractometer equipped with a Cu Kα radiation source. Scanning electron microscopy images were collected using a JEOL-7100F microscope. EDS mapping was recorded using an Oxford EDS IE250 system. TEM, HRTEM and SAED were performed using a JEOL JEM-2100F STEM/EDS microscope at an accelerating voltage of 200 kV. ICP results were measured by a PerkinElmer Optima 4300DV spectrometer. TG/DTG was performed using a Netzsch STA 449F3 simultaneous thermal analyzer at a heating rate of 2 °C min−1 in Ar. FT-IR transmittance spectra were measured using a 60-SXB IR spectrometer with paraffin oil as the dispersant. XPS was recorded with a VG Multilab 2000.
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3

Quantitative Analysis of Food Components

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The contents of moisture, ash, fat, protein, phosphorus, and heavy‐metal ions including, Pb, As, Hg, Cd, and Cr, were detected according to Jin Zhang and Pham Viet Nam's methods (Nam et al., 2019 (link); Zhang et al., 2016 (link), 2017 (link)). The inductively coupled plasma‐optical emission spectrometry (ICP‐OES) analysis was performed using a PerkinElmer Optima 4300 DV spectrometer.
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4

Copper Transfer from Paints to Water

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In order to assess copper transfer from experimental paints to water, five 50 L tanks containing: tank 1: pond water, tank 2: pond water + untreated netting, tank 3: pond water + C1 netting, tank 4: pond water + C2 netting and tank 5: pond water + C3 netting were kept and agitated regularly for the same period of time that the experiment lasted. Afterwards, copper content in the water was determined. Water samples were acidified with HNO3 (Merck Suprapur, Darmstadt, Germany) to reach a final sample medium HNO3 1% (v/v). Copper determination was performed with inductively coupled plasma optical emission spectrometry (ICP-OES) in a PerkinElmer (USA)–Optima 4300DV spectrometer. For the analysis on tissues, a pool of samples from nine animals at the beginning of the trial (to obtain initial values) and twenty-seven animals, (3 animals per cage, 9 animals per condition) at the end of the experiment were taken. Fish were sacrificed with 200 mg·L−1 MS222, dissected, and the liver, gills, and a portion of dorsolateral muscle were removed and stored at −80 °C. For the analyses, 0.2–0.6 g of each sample was digested in a microwave oven (Milestone, Ultrawave, Italy) in concentrated HNO3 (Merck, Germany). Copper determination was performed using an ICP-MS spectrometer (Agilent 7500ce, Agilent Technologies, Santa Clara, CA, USA).
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5

Inductively Quantifying Zinc Nanoparticles

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In order to ascertain the concentration that would be available to the cells, the amount of dissolved Zn2+ ions was measured by inductively coupled plasma-optical emission spectroscopy (ICP-OES). For this purpose, Np dilutions were prepared in 96 well U plates to obtain combinations of 60 µg/mL ZnO Nps with 50 and 800 µg/mL of Al2O3, CeO2, TiO2 and Y2O3 Nps.
As in the previous experiment, a density of 6 × 104 Jurkat cells per well was seeded and, after 24 h of incubation, the Nps were added; the cells were incubated for a further 24 h. ZnO Nps in culture medium and medium free of Nps were also tested. The plate content was subsequently collected in Eppendorf tubes, which were centrifuged at 13,200 rpm, 5 min, 4 °C and the supernatant was collected in clean tubes. The amount of Zn2+ present in the supernatant was determined in two independent experiments in duplicate by ICP-OES at CACTI (University of Vigo, Spain) using a Perkin-Elmer Optima 4300 DV Spectrometer (Waltham, MA, USA) with indium as internal standard.
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6

Nanomaterial Characterization Protocol

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The morphologies were characterized by scanning electron microscope (SEM, JOEL 7100F) and transmission electron microscope (TEM, Titan G2 60-300). The synchrotron-based X-ray diffraction was carried out at Beamline 13-BM-C of the Advanced Photon Source (APS), Argonne National Laboratory, and the wavelength was 0.434 Å. In situ synchrotron high-energy XRD during the first sodiation process was carried out at 11-ID-C beamline of the APS, while the wavelength was 0.11725 Å. A custom-designed coin cell with a MACCOR cycler was discharged from OCV to 0.8 V at a specific current of 0.1 A g−1. The XRD patterns were collected every 10 min using a PerkinElmer 2D X-ray detector, during cell operating. The nitrogen absorption/desorption measurements were taken on a Tristar-II 3020 instrument at 77 K. The atomic force microscopic (AFM) measurement was characterized by using Bruker MultiMode 8 Atomic Force Microscope. Inductively coupled plasma (ICP) test was performed on the PerkinElmer Optima 4300DV spectrometer.
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