D2 phaser diffractometer

The morphology of transmission electronic microscope (TEM) image was collected on a Hitachi H-800 spectroscope (Japan) operating at 10 kV. Fourier Transform infrared spectroscopy (FT-IR) profiles were recorded on a Bruker Vertex 70 (German) from 400 to 4000 cm⁻¹ at a resolution of 2 cm⁻¹, equipped with a temperature- controlled attenuated total reflectance (ATR) device with a ZnSe crystal (Pike Technology). X-ray photoelectron spectroscopy (XPS) was performed on a ThermoFisher Scientific ESCALAB 250XI (USA) using monochromated Al Kalph source (150 W, 500 μm). The pass energy was 50 eV for survey, and 30 eV for high resolution scans. All binding energies were reference to the C1s peak at 284.4 eV. X-ray diffraction (XRD) patterns were recorded on a Bruker D2-phaser diffractometer (German) at 40 mA and 40 kV using Cu Kα radiation (λ = 1.54, 6.88°/min from 5 to 90°). Raman spectra were recorded on a Renishaw inVia Micro-Raman Spectroscopy System (England) equipped with charge-coupled device detector at 633 nm. Specific surface areas and pore size distributions were determined by Brunauer Emmett-Teller (BET) method on Micromeritics ASAP 2460 apparatus (USA) from nitrogen sorption isotherms collected at 77 K. The samples were degassed at 250 °C for 12 h prior to measurement.

The morphology of the fabricated Ru-based microelectrode was investigated using a scanning electron microscope JSM-7001F (SEM, JEOL, Japan) coupled with an energy-dispersive analyzer INCA PentaFETx (Oxford Instruments, UK) to characterize its atomic composition.
The X-ray diffraction analysis (XRD) for phase identification of the synthesized ruthenium material was performed on a Bruker D2 Phaser diffractometer equipped with a LynxEye detector (Bruker-AXS, Karlsruhe, Germany) using CuKα (0.1542 nm) radiation in the 2θ angle range of 0°–100°.

SpectraMax iD3 microplate reader (Molecular Devices, San Jose, CA, USA) was used to measure the UV-Vis absorbance spectra of BG-AgNPs. By using Spectrum one FT–IR Spectrometer (Perkin Elmer Instruments, Waltham, MA, USA), the FT-IR measurements for the respective BG extracts and BG-AgNPs were recorded between 4000 and 400 cm⁻¹ using KBr as a reference. D2 phaser diffractometer (Bruker, Germany) with Cu K_α radiation with λ = 1.54 Å was utilized to analyze the powder X-ray diffraction pattern (P-XRD) of as-prepared AgNPs. K-Alpha X-ray photoelectron spectrometer (Thermo Scientific, Waltham, MA, USA) using a high-resolution monochromatic Al Kα line as excitation source was used in this study. Zeta Sizer Nano ZS (Malvern Instruments Ltd., Worcestershire, UK) was used for measuring the Zeta potential for the obtained BG-AgNPs (n = 3).

The CO₂ sequestration was performed according to the method reported by Jo et al. [12 (link)]. In a disposable cuvette, 50 µL of SspCA solution was mixed with 450 µL of 1 M Tris containing 20 mM CaCl₂, pH = 11. Five hundred microliters of CO₂-saturated water prepared at 30 °C was added to initiate the sequestration reaction, which was monitored by measuring A₆₀₀ using a thermostated spectrophotometer (JASCO V-550) at 30 °C. Instead of the 0 °C used for the hydratase activity assay (Section 2.4), CO₂-saturated water was prepared at 30 °C because such a temperature is closer to the operation temperature of most CO₂-capturing facilities [13 (link),14 (link)]. For characterizing the precipitated CaCO₃, the precipitate was collected by filtering it through a 0.45 μm membrane filter, and then dried at 70 °C overnight in an oven before SEM and XRD analysis. The SEM image was obtained with a Hitachi SU8000 scanning electron microscope. The XRD patterns were determined with a Bruker D2 PHASER diffractometer.

PXRD was used to determine the bulk phase purity of each sample. PXRD data for all forms were measured at 293 K on a Bruker D2 Phaser diffractometer which employs a sealed tube Co X-ray source (λ = 1.78896 Å), operating at 30 kV and 10 mA, and a LynxEye PSD detector in Bragg–Brentano geometry. The powder patterns for the cocrystals are pre­sented in the supporting information, where the experimentally measured pattern is com­pared to the calculated patterns obtained from the single-crystal X-ray diffraction (SC-XRD) data, as well as the calculated patterns of its com­ponents using data from the Cambridge Structural Database (CSD, Version 2022.1.0; Groom et al., 2016 ▸ ).