Contour gt k1

3-D topography characterization was performed as described previously (Mousavi et al., 2014 (link)). Briefly, a 3-D profilometer (Bruker Contour GT-K1, Germany), was used to study the roughness and the morphology of the corrugated cardboard and polymer-covered corrugated cardboard surfaces. This equipment uses light interferometry with a 50 × objective to capture surface roughness in increments ranging from 130 nm to 1 mm. The Contour GT-K1 is delivered with a dual-LED light source, a focus module controlled by computer and a measure table that can be tilted or moved to ensure a greater precision and allow more sample geometries. The tests were performed using the VSI (vertical scanning interferometry) technique along with the remove 8 tilt filter that compares every point to its neighbors and provides a 3D picture of the sample free of tilt influence.

A sample from each type of porcelain in glazed or polished surface was scanned after KH immersion and thermocycling. The surface topography of six samples was represented graphically via white light interferometry (Contour GT-K1, Bruker Nano GmbH, Berlin, Germany) under 50× magnification with back scan and length parameters of 20 µm in VSI/VXI mode to obtain a 3D rendering of the sample surfaces. Vision 64 software (Bruker Nano GmbH, Berlin, Germany), which is part of the GT-K1 system, was used to copy the surface topography parameters.

After the friction tests, the discs and cylinders were cleaned twice in an ultrasonic bath with n-heptane (Chimie Plus: >99%) for 10 min to remove residual oil. The sample was handled with metallic tweezers without touching the surface of the disc. The wear volumes of the disc and cylinder were measured using an optical white light interferometer (Contour GT-K1, Bruker). The surfaces were observed without any conductive coating by SEM using a FEI XL30-FEG equipped with an Everhardt-Thornley secondary electron detector and operating under high vacuum. The acceleration voltage was set between 2 and 5 kV. Chemical composition analyses were carried out by EDX using an Oxford Instruments X-max silicon drift detector (80 mm² ultra-thin window). Quantitative analysis of the EDX spectra was performed using the Aztec software.

To characterize the features of the etched surface, observation was carried out with a ZEISS DSM-960A SEM at 20 kV (Zeiss, Jena, Germany); magnification varied between 20× and 2000×. Surface topography was further characterized by optical non-contact profilometry with a Bruker Contour GT-K1 (Bruker, Karlsruhe, Germany) on a 250 µm × 250 µm field with a Gaussian filter of 50 µm × 50 µm. Analysis was successively performed on 3 distinct implants in 3 consecutive valleys between the threads; average roughness (Sa), root mean square roughness of the surface (Sq), average distance between the highest peaks and lowest valleys of the surface (Sz), skewness of the height distribution (Ssk), kurtosis of the height distribution (Sku) and the developed surface (Sdr) were recorded.

The topography of the studied surfaces was estimated by the optical profilometer (Contour GT-K1, Bruker, Germany) using the VXI measurement mode or the extended vertical scanning interferometry (VSI).