The PL spectra were measured by a fluorescence spectrophotometer (F-7000, Hitachi, Tokyo, Japan). The TRPL decays were obtained using a HORIBA FluoroMax Plus spectrofluorometer. EL characteristics were recorded using an LQ-100R spectrometer (Enlitech, Kaohsiung, Taiwan) with a computer-controlled integrating sphere and a Keysight B2901A source meter. The XRD patterns were analyzed using an AFM system (INNOVA AFM, Bruker, Billerica, MS, USA) and an X-ray diffractometer (D8 advance, Bruker), respectively. The TEM images were performed with the JEOL (Peabody, MA, USA) JEM-2100 microscope. TEM samples were prepared by 5–10 µL of purified QD solution was then drop-cast on the TEM copper grid and allowed to dry completely. Elemental analysis data were acquired via Energy-dispersive X-ray spectroscopy (EDS) combinated with a JEOL JEM-2100 microscope. The size distribution of the QDs was measured using a dynamic light scattering spectrophotometer (ELSZ-2000ZS, OTSUKA, Tokyo, Japan).
Jem 2100 microscope
Manufactured by JEOL
Sourced in Japan, United States
The JEM-2100 is a transmission electron microscope (TEM) manufactured by JEOL. It is capable of high-resolution imaging and analysis of materials at the nanoscale level. The JEM-2100 provides researchers with a tool for studying the structure and composition of a wide range of samples, including biological specimens, materials, and nanostructures.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (7 mentions)
Nicolet is50, by Thermo Fisher Scientific (6 mentions)
D8 advance, by Bruker (5 mentions)
Jem 2100f microscope, by JEOL (4 mentions)
Cary eclipse fluorometer, by Agilent Technologies (3 mentions)
Uv 2450 uv vis spectrophotometer, by Shimadzu (3 mentions)
Quanta 250 feg, by Thermo Fisher Scientific (3 mentions)
Axs d8, by Bruker (3 mentions)
Exoquick tc, by System Biosciences (3 mentions)
Pgstat302n, by Metrohm (2 mentions)
Zetasizer nano zs90, by Malvern Panalytical (2 mentions)
Uv 2700 spectrophotometer, by Shimadzu (2 mentions)
Su8100 microscope, by Hitachi (2 mentions)
Orius 833 ccd camera, by Ametek (2 mentions)
Jem 1200ex 2, by JEOL (2 mentions)
Lacey carbon supported copper grids, by Merck Group (2 mentions)
Nano zs90, by Malvern Panalytical (2 mentions)
Ta sdt q600, by TA Instruments (2 mentions)
Du 800 uv vis spectrophotometer, by Beckman Coulter (2 mentions)
F 7000, by Hitachi (2 mentions)
137 protocols using jem 2100 microscope
1
Comprehensive Characterization of Quantum Dots
2
Characterization of 3D Graphene Morphology
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The morphology was characterized via scanning electron microscope (SEM) and transmission electron microscope (TEM). SEM measurement was performed with a SU8010 microscope (SEM, Hitachi Co., Tokyo, Japan) at an accelerated voltage of 10 kV. TEM was performed on a JEM-2100 microscope (JEOL Ltd., Tokyo, Japan) with an acceleration voltage of 200 kV. X-ray photoelectron spectroscopy (XPS) spectra were obtained on a PHI5300 (USA, Perkin Elmer, Waltham, MA, USA) with Mg Kα being the excitation source. All electrochemical experiments were carried out on an Autolab Electrochemical Station (PGSTAT302N, Metrohm, Herisau, Switzerland). In cyclic voltammetry (CV) and differential pulse voltammetry (DPV) measurements, a simple three-electrode system was adopted. Briefly, 3DG, p-3DG, or VMSF/p-3DG were used as the working electrodes. Platinum wire or platinum sheet was employed as the counter-electrode. For the nonaqueous experiment, a Ag/Ag+ (10 mM Ag+/acetonitrile solution) electrode was used as the reference electrode. For aqueous electrolyte, Ag/AgCl (saturated KCl solution) was employed as the reference electrode. DPV parameters included a step potential of 5 mV, pulse amplitude of 25 mV, pulse time of 0.05 s, and time interval of 0.2 s.
3
Characterization of Amphiphile-Templated Gold Nanoparticles
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The morphologies of self-assembled
amphiphiles before and after the interaction of HAuCl4 were
obtained from SEM (Hitachi S-3000N, Japan) and FESEM (Hitachi High
Tech SU6600), and high-resolution transmission electron microscopic
(HRTEM) images were recorded with a JEOL JEM 2100 microscope equipped
with a Gatan imaging filter. Samples for SEM and FESEM imaging were
prepared by casting 5–10 μL of amphiphile-templated AuNPs
on aluminum foils and then were dried at ambient temperature. The
HRTEM analysis was conducted by placing a drop of the NP solution
on a carbon-coated copper grid and followed by solvent evaporation
under ambient temperature. The average size of the NPs was analyzed
using ImageJ software.
For optical microscopic studies, the
glass slides were initially washed with alcohol and then with double-distilled
water and were dried in a hot air oven. The amphiphile-templated AuNPs
were dropped onto a glass slide using a micropipette and were allowed
for slow evaporation at ambient temperature. The resulting dried drops
were imaged on a Leica DM 2500 optical microscope.
amphiphiles before and after the interaction of HAuCl4 were
obtained from SEM (Hitachi S-3000N, Japan) and FESEM (Hitachi High
Tech SU6600), and high-resolution transmission electron microscopic
(HRTEM) images were recorded with a JEOL JEM 2100 microscope equipped
with a Gatan imaging filter. Samples for SEM and FESEM imaging were
prepared by casting 5–10 μL of amphiphile-templated AuNPs
on aluminum foils and then were dried at ambient temperature. The
HRTEM analysis was conducted by placing a drop of the NP solution
on a carbon-coated copper grid and followed by solvent evaporation
under ambient temperature. The average size of the NPs was analyzed
using ImageJ software.
For optical microscopic studies, the
glass slides were initially washed with alcohol and then with double-distilled
water and were dried in a hot air oven. The amphiphile-templated AuNPs
were dropped onto a glass slide using a micropipette and were allowed
for slow evaporation at ambient temperature. The resulting dried drops
were imaged on a Leica DM 2500 optical microscope.
4
Characterization of 2D Ti2C Nanostructures
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The elemental composition of the parent phase Ti2AlC and 2D Ti2C nanostructures were analyzed by X‐ray photoelectron spectrometry (XPS, AXIS UltraDLD). The nanolayer thickness of the prepared 2D Ti2C was observed and analyzed by high‐resolution transmission electron microscopy (TEM) on a JEM‐2100 microscope (JEOL) and ortho‐inverted atomic force microscopy (AFM) on an NTEGRA microscope (NT‐MDT). The hydrated particle size and zeta potential of 2D Ti2C in different solutions were analyzed by the NanoBrook Omni Particle Size and Zeta Potential Analyzer (Brookhaven Instruments Corporation). The specific surface areas of the parent phase Ti2AlC and 2D Ti2C were determined by an Autosorb iQ3 automated surface area and pore size analyzer (Quantachrome).
5
Carbon Material Characterization Protocol
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Crystal structure was identified by powder X-ray diffraction (XRD) in a Rigaku Dmax-2500 diffractometer with Cu Kα radiation in 2θ range from 10 to 90°. Raman spectra (Lab-RAM HR800 Raman spectroscope) were adopted to characterize carbon material using argon ion laser excitation with wavelength of 632.81 nm. High-resolution transmission electron microscopy (HRTEM, JEOL JEM-2100 microscope) was employed to analyze microstructure. Carbon content was determined by thermogravimetric analysis (TGA) via heating the carbon-coated samples in air to 700 °C in a TGA/DSC1/1600 apparatus.
6
Characterization of Diblock Copolymer Micelles
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The composition of copolymers was determined by means of proton nuclear magnetic resonance (1H NMR). The spectra were recorded at room temperature with Bruker spectrometer operating at 250 MHz, using CDCl3 as solvent. Chemical shifts (δ) were given in ppm using tetramethylsilane as an internal reference.
The molar mass and molar mass distribution of diblock copolymers were measured by gel permeation chromatography (GPC) performed on Agilent-1260 with an RI detector. Tetrahydrofuran (THF) was used as the mobile phase at a flow rate of 1.0 mL/min. 20 mL of solution at a concentration of 10 mg/mL were injected for analysis.
The morphology of micelles was observed by using transmission electron microscopy (TEM) performed on a JEOL JEM-2100 microscope. One drop of micelle solution at 1 mg/mL was placed on a copper grid covered with a nitrocellulose membrane, stained negatively with 2% phosphotungstic acid (PTA) and air dried before measurements.
The molar mass and molar mass distribution of diblock copolymers were measured by gel permeation chromatography (GPC) performed on Agilent-1260 with an RI detector. Tetrahydrofuran (THF) was used as the mobile phase at a flow rate of 1.0 mL/min. 20 mL of solution at a concentration of 10 mg/mL were injected for analysis.
The morphology of micelles was observed by using transmission electron microscopy (TEM) performed on a JEOL JEM-2100 microscope. One drop of micelle solution at 1 mg/mL was placed on a copper grid covered with a nitrocellulose membrane, stained negatively with 2% phosphotungstic acid (PTA) and air dried before measurements.
7
Multitechnique Characterization of Solid Precipitates
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XRD spectra were collected to analyze the crystalline phase of the solid samples in the experiments using an X-ray diffractometer (Advance D8, Bruker Corp, Karlsruhe, Germany) equipped with Cu-Kα radiation at a scanning rate of 5°/min in the scanning angle (2θ) range of 5–80°. The chemical and mineral properties of the precipitate were examined using a Nicolet IS 10 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) to collect FTIR spectra (KBr mode) in the range of 400–4000 cm−1 with a set resolution of 4 cm−1 and 30 scans. The morphological features and structural composition of solids were observed by scanning electron microscopy (SEM, TESCAN MIRA LMS, Brno, Czech Republic) coupled with energy-dispersive X-ray spectroscopy (EDS, Xplore). The XPS spectra were obtained using a monochromatic Al-K X-ray source (Thermo Fisher Scientific K-Alpha, Waltham, MA, USA) with a pass energy of 50 eV and a step size of 0.05 eV. The binding energy of C1s = 284.80 eV was used as the energy standard for charge adjustment. The microstructure of the precipitate was observed through a transmission electron microscope (TEM, Thermo Fisher Scientific, Talos F200X, Waltham, MA, USA) coupled with energy-dispersive X-ray spectroscopy (EDS), with an LaB6 filament, operating at 200 kV on a JEOL JEM-2100 microscope.
8
Advanced Microscopy and Characterization
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FESEM images were obtained by a HITACHI su-8010 microscope and TEM images were obtained by a JEOL JEM-2100 microscope. FT-IR spectrum of the SPS@CNT was characterized by a BRUKER Tensor 27 FT-IR spectrophotometer. The phase structures were examined with SHIMADZU Lab X XRD-6000 X-ray diffractometer. Brunauer-Emmett-Teller (BET) method was applied to measure the specific surface area of the products by nitrogen adsorption–desorption isotherms at 77 K in an Autosorb iQ-MP Surface Area and Pore Size Analyzer (Quantachrome Instruments).
9
Multifaceted Characterization of Molecular Structures
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Differential scanning calorimetry (DSC) was performed using an Exstar DSC7000X differential scanning calorimeter (Hitachi High-Tech Corp., Tokyo, Japan). Polarized optical microscope (POM) images were obtained by a BX 50 polarized optical microscope (Olympus Corp., Tokyo, Japan) equipped with a hot stage (HS82, Mettler Toledo, Greifensee, Switzerland) and a tint plate (U-TP137, Olympus Corp., Tokyo, Japan) or a Berek compensator (U-CBE, Olympus Corp., Tokyo, Japan). Polarized UV–vis absorption spectra were measured by a UV–vis absorption spectrophotometer (V-670, JASCO Corp., Hachioji, Japan). XRF analysis was performed using an X-ray fluorescence spectrometer (ZSX Primus II, Rigaku Corp., Akishima, Japan). 1H NMR spectra were recorded by an NMR spectrometer (Avance III, 400 MHz, Bruker Biospin, Bruker, Billerica, MA, USA). Transmission electron microscopy was performed with a JEM-2100 microscope (JEOL Ltd., Akishima, Japan).
10
Comprehensive Structural Characterization of ZFDA1 and ZF800
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The crystal structures of ZFDA1 and
ZF800 were characterized with X-ray diffraction (XRD) with the 2θ
range of 10–80°, which were performed by Bruker D8 Advance
using Cu Kα radiation (λ = 0.1541 nm). The morphologies
of all of the samples were determined using field emission scanning
electron microscopy (FESEM, JSM-6700F). The element composition was
observed using energy dispersive spectroscopy (EDS). The crystal structure
details were further determined using transition electron microscopy
(TEM); the TEM images were collected by JEOL JEM-2100 microscope with
an accelerating voltage of 200 kV. X-ray photoelectron spectroscopy
(XPS) analysis was performed by Kratos Axis Ultra spectroscopy with
a monochromatic Al Kα radiation (hν =
1486.6 eV). FTIR spectra of the materials were recorded on the Fourier
transform infrared (FTIR) spectrometer (Themo Nicole 670FT-IR).
ZF800 were characterized with X-ray diffraction (XRD) with the 2θ
range of 10–80°, which were performed by Bruker D8 Advance
using Cu Kα radiation (λ = 0.1541 nm). The morphologies
of all of the samples were determined using field emission scanning
electron microscopy (FESEM, JSM-6700F). The element composition was
observed using energy dispersive spectroscopy (EDS). The crystal structure
details were further determined using transition electron microscopy
(TEM); the TEM images were collected by JEOL JEM-2100 microscope with
an accelerating voltage of 200 kV. X-ray photoelectron spectroscopy
(XPS) analysis was performed by Kratos Axis Ultra spectroscopy with
a monochromatic Al Kα radiation (hν =
1486.6 eV). FTIR spectra of the materials were recorded on the Fourier
transform infrared (FTIR) spectrometer (Themo Nicole 670FT-IR).
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