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Axs d4 endeavor

Manufactured by Bruker
Sourced in United States

The AXS D4 Endeavor is a compact and versatile X-ray diffractometer designed for phase analysis and material characterization. It features a sealed X-ray tube, a high-efficiency detector, and a user-friendly software interface.

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6 protocols using axs d4 endeavor

1

Microstructural Characterization of Alloy

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Microstructural observation was undertaken via optical microscopy (OM), X-ray diffraction (XRD) and transmission electron microscopy (TEM).
For XRD, disks of 8 mm diameter and 2 mm thickness were ground to a 2400 grit finish via SiC paper, and then samples were mounted and analysed via a Bruker Axs D4 Endeavor using Cu Kα radiation. 2θ was varied from 10–90° with a step size of 0.02°.
For OM, samples of similar dimension were used, however further polishing was done using a mixture of a colloidal silica suspension (OP-S) and hydrogen peroxide until a mirror finish was achieved. Following this, the samples were etched using Kroll’s reagent until surface features could be resolved. Grain size was analysed in accordance with the Abrams Three-Circle Procedure, outlined in ASTM E-11238 .
TEM analysis was undertaken on 3 mm foils, using JEOL-1010 and JEOL-2010 microscopes; these were prepared from disks cut via WEDM to 1 mm of thickness, then ground via SiC papers to a thickness of 80–100 µm, dimpled to a central thickness of 20 µm, and finally thinned to electron transparency (~100 nm) using a JEOL EM-09100 Ion Slicer.
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2

Wide-Angle X-Ray Diffraction of Electrospun Mats

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Wide-angle X-ray diffraction
(WAXD) experiments were performed at room temperature in the electrospun
mats of the three copolymers using a Bruker AXS D4 ENDEAVOR diffractometer
(Billerica, MA, USA). The samples were scanned in the reflection mode
using incident Cu K-alpha radiation (k = 1.54 Å), while the generator
was set up at 40 kV and 40 mA. The data were collected over the (2θ)
range of 2–40°.
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3

Multifunctional Nanocomposite Characterization

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Transmission electron microscopy (TEM) was performed using a JEOL 1010 TEM (2001) at an accelerating voltage of 100 kV equipped with Gatan Orius SC600 CCD Camera (2014). X-ray powder diffraction (XRD) patterns were obtained on a Bruker AXS D4 Endeavor wide-angle XRD instrument with a Cu Kα radiation source at λ = 1.54056 Å. Upconversion emission spectra were analyzed using an Andor Shamrock SR-500i imaging spectrometer equipped with an iXon EMCCD Camera using a CW laser at the wavelength of 980 nm (Thorlabs, BL976-PAG900) as a near-infrared light source at a power of 1 mW. UV-visible absorption spectra were collected by using an Agilent Cary 60 UV-Vis Spectrophotometer. The morphology analysis of the samples was carried out with an FEI Verios 460L field emission gun scanning electron microscopy at an accelerating voltage of 3 kV. Atomic force microscopy imaging was conducted with a Bruker Dimension Icon. An 80-MHz Ti:sapphire femtosecond laser (Coherent, Chameleon Ultra II) tuned at the wavelength of 880 nm was used as the excitation source for TPE fluorescence imaging of the nanocomposite. A mercury light source (Olympus, U-LH100HG) was used to photochemically reduce the GO in water solution. Unless otherwise noted, characterizations of the synthesized materials were performed at room temperature.
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4

Morphological and Structural Analysis of MSPs

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The morphology and mesostructure of the MSPs were characterized using scanning electron microscopy (SEM) and transmission electron microscopy (TEM). SEM imaging was conducted using a field-emission electron microscope (Ultra Plus; Carl Zeiss, Jena, Germany) with an accelerating voltage of 1 kV. Samples for SEM imaging were deposited onto a gold membrane and sputter-coated prior to analysis. For TEM, ~4 µL of the liposome suspension was applied to the Formvar-coated 400-mesh copper TEM grid for 30 s. Before applying the sample, the grids were coated with an ~4 nm thick carbon layer and glow discharged (ACE200 vacuum coater; Leica, Munich, Germany). Samples were stained with 1% aqueous uranyl acetate and examined using a transmission electron microscope (CM100; Philips, Amsterdam, The Netherlands). Images were recorded with a CCD camera (Orius SC 200; Gatan, Pleasanton, CA, USA) using the Digital Micrograph software. X-ray diffraction (XRD) analysis (AXS D4 Endeavor; Bruker, Billerica, MA, USA) was carried out with Cu Kα radiation (λ = 0.154 nm) and a Sol-X detector. A scanning step of 0.02° and a counting time of 6 s per step were used for the measurements. The hydrodynamic size distribution, polydispersity index, and zeta-potential were measured using dynamic light scattering (ZetaSizer Nano ZSP; Malvern Instruments, Malvern, UK).
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5

Characterization of TiO2 Nanotubes

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The morphology and dimensions of the prepared TiO2-NTs were investigated with a transmission electron microscope (TEM, Jeol 2100, 200 keV). The XRD was performed on a Bruker AXS D4 Endeavor diffractometer using CuKα1 with a wavelength λ = 1.5406 Å. The STEM-HAADF (high angle annular dark field) and STEM-EELS measurements were performed using a C3/C5 spherical aberration-corrected microscope Nikon U-STEM working at 100 keV.
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6

Characterization of Doped Ceramic Materials

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XRD analysis was performed using Bruker AXS D4 Endeavor diffractometer (Massachusetts, United States) with 2-70 • 2Θ range, 0.02 • step size and 2 s per step recording. The total quantity of dopants was determined using an inductively coupled plasma atomic emission spectrometer (ICP AES) (Thermo Jarrell Ash, model Atomscan 25) . The specific surface area was measured with the Brunauer-Emmett-Teller (BET) method using the Micromeritics Gemini II 2370 nitrogenadsorption apparatus (Norcross, GA). The thermal analysis was performed on a Jupiter 449 in the temperature range from 25 to 1500 • C using the 10 • ⋅min -1 heating rate and Ar atmosphere. Fourier transformed infrared spectroscopy (FTIR) was performed using a Perkin Elmer Spectrum 400 MIR spectrophotometer with the DRIFT technique. Scanning electron microscopy analyses was done on SEM FEG 7600F equipped with INCA Oxford 350 EDS SDD (samples dried on membrane coated with C and observed at 10 and 15 kV), while transmission electron microscopy (TEM) analyses were performed by JEM2100 TEM (samples deposited on lacey carbon Cu grids observed at 180 kV).
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