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Oxford eds x maxn detector

Manufactured by Oxford Instruments
Sourced in United Kingdom

The Oxford EDS X-MaxN detector is a compact, high-performance energy-dispersive X-ray spectroscopy (EDS) detector designed for use in scanning electron microscopes (SEMs) and other electron beam instruments. The core function of the X-MaxN detector is to capture and analyze the X-rays emitted from the sample during electron beam interaction, enabling elemental identification and quantification.

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2 protocols using oxford eds x maxn detector

1

Microscopic Analysis of Adsorbed Metals

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Scanning electron microscopy (SEM) (JSM-7200F microscope, Jeol Ltd., Tokio, Japan) and energy-dispersive X-ray spectroscopy (EDS) (Oxford EDS X-MaxN detector, Oxford Instruments, Abingdon, England) tests were conducted to examine the surfaces and the distribution of the adsorbed metals of the different materials used in the experiments. N2 sorption tests (Tristar II plus 3030 Surface Area and Porosity Analyzer, Micrometrics Instruments Corporation, Norcross, GA, USA) were performed to determine the porosity and adsorption surface area.
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2

Surface and Porosity Analysis of GSP

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N2 physisorption analyses (Tristar II Plus 3030 surface area and porosity analyser, Micrometrics Instruments Corporation, Norcross, GA, USA) were performed for the three particle sizes used in this work to determine the surface and porosity of GSP, GSP-Fe and GSP-Fe after phosphorus sorption. The surface and composition of the materials were studied by scanning electron microscopy (JSM-7200F, Jeol Ltd., Tokyo, Japan) and energy-dispersive X-ray spectroscopy (Oxford EDS X-MaxN detector, Oxford Instruments, Abingdon, England) analyses.
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